Performance and characterization of the FinEstBeAMS beamline at the MAX IV Laboratory

FinEstBeAMS (Finnish–Estonian Beamline for Atmospheric and Materials Sciences) is a multidisciplinary beamline constructed at the 1.5 GeV storage ring of the MAX IV synchrotron facility in Lund, Sweden. The beamline covers an extremely wide photon energy range, 4.5–1300 eV, by utilizing a single elliptically polarizing undulator as a radiation source and a single grazing-incidence plane grating monochromator to disperse the radiation. At photon energies below 70 eV the beamline operation relies on the use of optical and thin-film filters to remove higher-order components from the monochromated radiation. This paper discusses the performance of the beamline, examining such characteristics as the quality of the gratings, photon energy calibration, photon energy resolution, available photon flux, polarization quality and focal spot size.

TeraVision: A LabVIEW Software for THz Hyper-Raman Spectroscopy

Terahertz Time-Domain Spectroscopy (TDS) has emerged during the last two decades as a very popular technique for characterizing the low-energy excitations of several materials, gaseous, liquids and solids, as well as artificial materials as for instance epitaxial heterostructures and more. In recent years, the advances in THz technology allowed obtaining nonlinear optical effects with THz photons, showing remarkable results. In particular, THz Hyper-Raman Spectroscopy greatly expands the spectroscopic capability of the standard THz-TDS by combining intense and broadband THz pulses with a detailed analysis of the spectral content of the generated signal. It is evident that this improvement needs an adequate software support. The main parameter for coding the software which differs with respect to a standard THz-TDS software is the control of a motorized grating (monochromator), but several routines employed in the setup optimization stage rather than the actual measurement are needed as well. In this paper we present the TeraVision software, based on LabVIEW code, in order to highlight the solutions we adopted to tackle the main experimental challenges as well as to give a pleasant and user-friendly experience to expert users.

Spectral Calibration of the SLSTR Focal Plane Assemblies

<p>We describe a novel technique – Fourier transform spectroscopy – that we have developed to characterise the spectral and polarisation responses of the Sentinel-3 SLSTR optical channels. Our method has a number of advantages over conventional approaches employing a grating monochromator, including excellent spectral registration and resolution, intrinsic rejection of self-emission from the test setup and fast measurement times. Our measurements are traceable, through the spectral responsivity of a reference detector and the wavelength of a HeNe laser, to national standards.</p><p>We illustrate our method with sample results from the spectral calibrations of the four SLSTR focal plane assemblies tested to date. </p>

A high-efficiency and high-spectral-resolution EUV/soft X-ray monochromator based on off-plane diffraction

The most efficient diffraction at a periodic grating structure is expected to take place when the incident radiation can be considered to have been specularly reflected off the inclined part of grooves that are positioned parallel to the trajectory of the incident beam. Very encouraging results for this configuration, in which the diffraction takes place off-plane, have been reported recently for a grating to be used in a spectrometer for space science investigations. This grating provided high efficiency for a relatively large groove density and a large blaze angle. High efficiency was observed even in higher diffraction orders up to the fourth order. Here the performance parameters, especially for the combination of diffraction efficiency and achievable spectral resolution, will be discussed for a grating used in a grazing-incidence plane-grating monochromator for monochromatization of synchrotron radiation in the extreme ultraviolet (EUV) and soft X-ray range with photon energies between 30 eV and 2000 eV. It is found that the instrument can provide competitive spectral resolution in comparison with the use of in-plane diffraction. In the case of comparable spectral resolution, the off-plane diffraction is found to provide superior efficiency.

A High Resolution XUV Grating Monochromator for the Spectral Selection of Ultrashort Harmonic Pulses

A new monochromator with high spectral resolution in the extreme ultraviolet (XUV) has been developed for high-order laser harmonics selection. The system has three optical elements—a cylindrical (or spherical) focusing mirror, a uniform-line-spaced plane grating, and a plane mirror. The last element is required to maintain the focus on a fixed vertical slit when the grating subtended angle is changed in order to minimize the spectral defocusing aberration. The parameters of the focusing mirror are determined to introduce a coma that compensates for the coma given by the grating. The possibility of using two interchangeable gratings made the set-up optimized for a broad energy range of 12–50 eV. As a design test case, the set-up has been applied to a selection of the discrete spectral lines emitted by a gas-discharge lamp as the XUV source, obtaining a resolving power E/ Δ E > 3000.

A variable fixed-focus constant optimization method for a variable-included-angle varied-line-spacing plane-grating monochromator

Variable-included-angle varied-line-spacing plane-grating monochromators (VIA-VPGM) have been applied to many beamlines because of the self-focusing and aberration-correction function of the varied-line-spacing grating. Unfortunately, to optimize the variable-line-spacing coefficient of the grating, the fixed-focus constant (C ff) has to be fixed first in the VIA-VPGM. In this way, some of the advantages of these monochromators are lost, such as the flexibility of choosing a different energy-resolving power by varying the C ff. In this work, a variable C ff optimization method is introduced for a VIA-VPGM. By adopting this method, the C ff could be arbitrarily selected in the VIA-VPGM.

The U125 insertion device beamline at the Metrology Light Source

At the Metrology Light Source, an electron storage ring dedicated to metrological applications, the U125 insertion device beamline utilizes undulator radiation for various applications over a broad spectral range. Using a hybrid normal-incidence and grazing-incidence in-vacuum switchable plane-grating monochromator, a spectral region ranging from the near-infrared to soft X-ray is covered. The beamline is dedicated to surface-analytical methods, e.g. ellipsometry, photoelectron spectroscopy or photoemission tomography. The traceability of radiometric quantities, i.e. quantitative determination of the available radiant power (or photon flux), is required for some of these applications to support the metrological aspect of the measurements. In particular, attention is paid to the suppression of unwanted spectral contributions from higher diffraction orders, and to the monitoring of the radiation intensity during the measurements. With the results from the beamline commissioning, an uncertainty budget for all relevant radiometric quantities was established.