scholarly journals High responsivity, low dark current, heterogeneously integrated thin film Si photodetectors on rigid and flexible substrates

2014 ◽  
Vol 22 (5) ◽  
pp. 5052 ◽  
Author(s):  
Sulochana Dhar ◽  
David M. Miller ◽  
Nan M. Jokerst
Keyword(s):  
Thin Film ◽  
Dark Current ◽  
Flexible Substrates ◽  
High Responsivity

High-Responsivity Solar-Blind Photodetector Based on $ \hbox{Mg}_{0.46}\hbox{Zn}_{0.54}\hbox{O}$ Thin Film

2012 ◽  
Vol 33 (7) ◽  
pp. 1033-1035 ◽  
Author(s):  
Qinghong Zheng ◽  
Feng Huang ◽  
Jin Huang ◽  
Qichan Hu ◽  
Dagui Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
High Responsivity ◽  
Solar Blind

Low Dark Current and High Responsivity 1020nm InGaAs/GaAs Nano-Ridge Waveguide Photodetector Monolithically Integrated on a 300-mm Si Wafer

2021 ◽  
pp. 1-1
Author(s):  
Cenk Ibrahim Ozdemir ◽  
Yannick De Koninck ◽  
Didit Yudistira ◽  
Nadezda Kuznetsova ◽  
Marina Baryshnikova ◽  
...  
Keyword(s):  
Dark Current ◽  
Ridge Waveguide ◽  
High Responsivity ◽  
Monolithically Integrated ◽  
Si Wafer

Experimental Study of the High Cycle Fatigue of Thin Film Metal on Polyethylene Terephthalate for Flexible Electronics Applications

2009 ◽  
Author(s):  
Khalid Alzoubi ◽  
Susan Lu ◽  
Bahgat Sammakia ◽  
Mark Poliks
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Polyethylene Terephthalate ◽  
Flexible Electronics ◽  
Electrical Resistance ◽  
Thermal Stresses ◽  
Electronic Systems ◽  
Total Width ◽  
Flexible Substrates ◽  
Polyethylene Naphthalate

Flexible electronics represent an emerging area in the electronics packaging and systems integration industry with the potential for new product development and commercialization in the near future. Manufacturing electronics on flexible substrates will produce low cost devices that are rugged, light, and flexible. However, electronic systems are vulnerable to failures caused by mechanical and thermal stresses. For electronic systems on flexible substrates repeated stresses below the ultimate tensile strength or even below the yield strength will cause failures in the thin films. It is known that mechanical properties of thin films are different from those of bulk materials; so, it is difficult to extrapolate bulk material properties on thin film materials. The objective of this work is to study the behavior of thin-film metal coated flexible substrates under high cyclic bending fatigue loading. Polyethylene terephthalate (PET) and polyethylene naphthalate (PEN) are widely used substrates in the fabrication of microelectronic devices. Factors affecting the fatigue life of thin-film coated flexible substrates were studied, including thin film thickness, temperature, and humidity. A series of experiments for sputter-deposited copper on PET substrates were performed. Electrical resistance and crack growth rate were monitored during the experiments at specified time intervals. High magnification images were obtained to observe the crack initiation and propagation in the metal film. Statistical analysis based on design of experiments concepts was performed to identify the main factors and factor’s interaction that affect the life of a thin-film coated substrate. The results of the experiments showed that the crack starts in the middle of the sample and slowly grows toward the edges. Electrical resistance increases slightly during the test until the crack length covers about 90% of the total width of the sample where a dramatic increase in the resistance takes place.

High Responsivity, Low Dark Current Ultraviolet Photodetectors Based on Two-Dimensional Electron Gas Interdigitated Transducers

ACS Photonics ◽  
2018 ◽  
Vol 5 (11) ◽  
pp. 4277-4282 ◽  
Author(s):  
Peter F. Satterthwaite ◽  
Ananth Saran Yalamarthy ◽  
Noah A. Scandrette ◽  
A. K. M. Newaz ◽  
Debbie G. Senesky
Keyword(s):  
Dark Current ◽  
Electron Gas ◽  
Two Dimensional ◽  
Dimensional Electron ◽  
Two Dimensional Electron Gas ◽  
High Responsivity ◽  
Dimensional Electron Gas ◽  
Ultraviolet Photodetectors
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