In-plane displacement measurement configuration with twofold sensitivity

R. S. Sirohi; N. Krishna Mohan

doi:10.1364/ao.32.006387

In-plane displacement measurement configuration with twofold sensitivity

Applied Optics ◽

10.1364/ao.32.006387 ◽

1993 ◽

Vol 32 (31) ◽

pp. 6387 ◽

Cited By ~ 12

Author(s):

R. S. Sirohi ◽

N. Krishna Mohan

Keyword(s):

Displacement Measurement ◽

Plane Displacement

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An out-of-plane displacement measurement system based on hardware tracking

10.1117/12.2266760 ◽

2017 ◽

Cited By ~ 1

Author(s):

Chen Xiong ◽

Ming Zhang ◽

Wenxin Hu ◽

Hong Miao

Keyword(s):

Measurement System ◽

Displacement Measurement ◽

Out Of Plane ◽

Plane Displacement

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Phase-stepping holographic moiré: simultaneous in-plane and out-of-plane displacement measurement

Applied Optics ◽

10.1364/ao.31.002405 ◽

1992 ◽

Vol 31 (14) ◽

pp. 2405 ◽

Cited By ~ 4

Author(s):

Eli Simova Simova ◽

Krassimir Nedialkov Stoev

Keyword(s):

Displacement Measurement ◽

Phase Stepping ◽

Out Of Plane ◽

Plane Displacement

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Out of plane displacement measurement based on electronic speckle pattern interferometry

2012 International Conference on Computer Science and Information Processing (CSIP) ◽

10.1109/csip.2012.6309106 ◽

2012 ◽

Author(s):

Fei Guo ◽

Maiyu Zhou ◽

Mei Zhao ◽

Yufang Sha ◽

Peng Li

Keyword(s):

Speckle Pattern ◽

Displacement Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Out Of Plane ◽

Plane Displacement

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In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe

10.1117/12.727070 ◽

2007 ◽

Cited By ~ 1

Author(s):

Patrick Sandoz ◽

Jean-Michel Friedt ◽

Émile Carry

Keyword(s):

Shear Force ◽

Displacement Measurement ◽

Scanning Probe ◽

Pixel Resolution ◽

Plane Displacement

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In-plane displacement measurement using electronic-speckle-pattern-interferometry-based on spatial fringe analysis method

Optical Engineering ◽

10.1117/1.1778731 ◽

2004 ◽

Vol 43 (9) ◽

pp. 2168 ◽

Cited By ~ 32

Author(s):

Shunsuke Yokozeki

Keyword(s):

Speckle Pattern ◽

Displacement Measurement ◽

Electronic Speckle Pattern Interferometry ◽

Analysis Method ◽

Fringe Analysis ◽

Plane Displacement

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2-DOF in-Plane Displacement Measurement by Wollaston Prism-based Interferometer

2018 14th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA) ◽

10.1109/mesa.2018.8449196 ◽

2018 ◽

Author(s):

Hung-Lin Hsieh ◽

Ju-Yi Lee ◽

Bo-Yen Sun ◽

Gang-Yu Fan

Keyword(s):

Displacement Measurement ◽

Wollaston Prism ◽

Plane Displacement

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Parametric Study of the Reflective Periodic Grating for In-Plane Displacement Measurement Using Optical Fibers

Sensors ◽

10.3390/s120404265 ◽

2012 ◽

Vol 12 (4) ◽

pp. 4265-4280 ◽

Cited By ~ 1

Author(s):

Yeon-Gwan Lee ◽

Dae-Hyun Kim ◽

Chun-Gon Kim

Keyword(s):

Optical Fibers ◽

Parametric Study ◽

Displacement Measurement ◽

Periodic Grating ◽

Plane Displacement

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Moire interferometry for out-of-plane displacement measurement

10.5353/th_b3120915 ◽

1989 ◽

Author(s):

Mun-tong Cheung

Keyword(s):

Moiré Interferometry ◽

Displacement Measurement ◽

Moire Interferometry ◽

Out Of Plane ◽

Plane Displacement

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Holographic in-plane displacement measurement in cracked specimens in plane stress state

10.1117/12.44725 ◽

1991 ◽

Cited By ~ 1

Author(s):

Ventseslav C. Sainov ◽

Eli S. Simova

Keyword(s):

Stress State ◽

Plane Stress ◽

Plane Stress State ◽

Displacement Measurement ◽

Plane Displacement ◽

Cracked Specimens

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In-plane displacement measurement using objective speckles in photorefractive two-beam coupling: effect of multiple exposures

Optics Communications ◽

10.1016/0030-4018(96)00024-7 ◽

1996 ◽

Vol 126 (1-3) ◽

pp. 135-142 ◽

Cited By ~ 9

Author(s):

Arvind Kumar ◽

Kanwal Kamra ◽

K Singh

Keyword(s):

Coupling Effect ◽

Displacement Measurement ◽

Multiple Exposures ◽

Beam Coupling ◽

Plane Displacement

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