In-plane displacement measurement with sub-pixel resolution: application to vibration characterization of a shear-force scanning probe

2007 ◽  
Author(s):  
Patrick Sandoz ◽  
Jean-Michel Friedt ◽  
Émile Carry
Keyword(s):  
Shear Force ◽  
Displacement Measurement ◽  
Scanning Probe ◽  
Pixel Resolution ◽  
Plane Displacement

Measurement of Plasticity Gradients with Scanning Probe Microscopy

1993 ◽  
Vol 318 ◽  
Author(s):  
James D. Kiely ◽  
Dawn A. Bonnell
Keyword(s):  
Fracture Surface ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Ceramic System ◽  
Force Microscopy ◽  
Metal Fracture ◽  
Atomic Force ◽  
Metal Ceramic

ABSTRACTScanning Tunneling and Atomic Force Microscopy were used to characterize the topography of fractured Au /sapphire interfaces. Variance analysis which quantifies surface morphology was developed and applied to the characterization of the metal fracture surface of the metal/ceramic system. Fracture surface features related to plasticity were quantified and correlated to the fracture energy and energy release rate.

In-plane displacement measurement configuration with twofold sensitivity

1993 ◽  
Vol 32 (31) ◽  
pp. 6387 ◽  
Author(s):  
R. S. Sirohi ◽  
N. Krishna Mohan
Keyword(s):  
Displacement Measurement ◽  
Plane Displacement

scholarly journals The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

2012 ◽  
Vol 3 ◽  
pp. 722-730 ◽  
Author(s):  
César Moreno ◽  
Carmen Munuera ◽  
Xavier Obradors ◽  
Carmen Ocal
Keyword(s):  
Memory Effect ◽  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Scanning Force Microscopy ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Versatile Tool ◽  
Scanning Force ◽  
Memristor Device

We report on the use of scanning force microscopy as a versatile tool for the electrical characterization of nanoscale memristors fabricated on ultrathin La0.7Sr0.3MnO3 (LSMO) films. Combining conventional conductive imaging and nanoscale lithography, reversible switching between low-resistive (ON) and high-resistive (OFF) states was locally achieved by applying voltages within the range of a few volts. Retention times of several months were tested for both ON and OFF states. Spectroscopy modes were used to investigate the I–V characteristics of the different resistive states. This permitted the correlation of device rectification (reset) with the voltage employed to induce each particular state. Analytical simulations by using a nonlinear dopant drift within a memristor device explain the experimental I–V bipolar cycles.

scholarly journals Elasto-mammography: Theory, Algorithm, and Phantom Study

2006 ◽  
Vol 2006 ◽  
pp. 1-11 ◽  
Author(s):  
Z. G. Wang ◽  
Y. Liu ◽  
L. Z. Sun ◽  
G. Wang ◽  
L. L. Fajardo
Keyword(s):  
Elastic Moduli ◽  
Imaging Modality ◽  
Contrast Ratio ◽  
Reconstruction Algorithm ◽  
Displacement Measurement ◽  
Breast Compression ◽  
Before And After ◽  
Breast Tissues ◽  
Displacement Information

A new imaging modality framework, called elasto-mammography, is proposed to generate the elastograms of breast tissues based on conventional X-ray mammography. The displacement information is extracted from mammography projections before and after breast compression. Incorporating the displacement measurement, an elastography reconstruction algorithm is specifically developed to estimate the elastic moduli of heterogeneous breast tissues. Case studies with numerical breast phantoms are conducted to demonstrate the capability of the proposed elasto-mammography. Effects of noise with measurement, geometric mismatch, and elastic contrast ratio are evaluated in the numerical simulations. It is shown that the proposed methodology is stable and robust for characterization of the elastic moduli of breast tissues from the projective displacement measurement.

scholarly journals Comparative evaluation of three image analysis methods for angular displacement measurement in a MEMS microgripper prototype: a preliminary study

ACTA IMEKO ◽  
2021 ◽  
Vol 10 (2) ◽  
pp. 119
Author(s):  
Federica Vurchio ◽  
Giorgia Fiori ◽  
Andrea Scorza ◽  
Salvatore Andrea Sciuto
Keyword(s):  
Image Analysis ◽  
Angular Displacement ◽  
Functional Characterization ◽  
Displacement Measurement ◽  
Mems Devices ◽  
Speeded Up Robust Features ◽  
Relevant Today ◽  
Measurement Results ◽  
Preliminary Study

<p class="Abstract"><span lang="EN-US">The functional characterization of MEMS devices is relevant today since it aims at verifying the behavior of these devices, as well as improving their design. In this regard, this study focused on the functional characterization of a MEMS microgripper prototype suitable in biomedical applications: the measurement of the angular displacement of the microgripper comb-drive is carried out by means of two novel automatic procedures, based on an image analysis method, SURF-based (Angular Displacement Measurement based on Speeded Up Robust Features, ADM<sub>SURF</sub>) and FFT-based (Angular Displacement Measurement based on Fast Fourier Transform, ADM<sub>FFT</sub>) method, respectively. Moreover, the measurement results are compared with a Semi-Automatic Method (SAM), to evaluate which of them is the most suitable for the functional characterization of the device. The curve fitting of the outcomes from SAM and ADM<sub>SURF</sub>, showed a quadratic trend in agreement with the analytical model. Moreover, the ADM<sub>SURF</sub> measurements below 1° are affected by an uncertainty of about 0.08° for voltages less than 14 V, confirming its suitability for microgripper characterization. It was also evaluated that the ADM<sub>FFT</sub> is more suitable for measurement of rotations greater than 1° (up to 30°), with a measurement uncertainty of 0.02°, at 95% of confidence level.</span></p>

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