scholarly journals ELEMENTAL ANALYSIS OF BIOLOGICAL SPECIMENS BY ELECTRON PROBE X-RAY MICROANALYSIS

1976 ◽  
Vol 9 (1) ◽  
pp. 69-87 ◽  
Author(s):  
VINCI MIZUHIRA
Keyword(s):  
Elemental Analysis ◽  
Electron Probe ◽  
X Ray

The Analysis of Particles With Energy Dispersive X-Ray Spectroscopy (EDS)

1998 ◽  
Vol 4 (S2) ◽  
pp. 184-185
Author(s):  
J. A. Small ◽  
J. A. Armstrong ◽  
D. S. Bright ◽  
B. B. Thorne
Keyword(s):  
Electron Microscope ◽  
Elemental Analysis ◽  
Electron Probe ◽  
Initial Particle ◽  
X Ray ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
The Individual ◽  
Individual Particles

The addition of the Si-Li detector to the electron probe, the scanning electron microscope, and more recently the transmission electron microscope (resulting in the analytical electron microscope) has made it possible to obtain elemental analysis on individual “particles” with dimensions less than 1 nm using EDS. Although some initial particle studies on micrometer-sized particles were done on the electron probe using wavelength dispersive spectrometers, WDS, the variability and complexity of many particle compositions coupled with the high currents necessary for WDS made elemental analysis of particles by WDS difficult at best. In addition, the use of multiple spectrometers, each with a different view of the particle and therefore different particle geometry as shown in Fig. 1, limited the quantitative capabilities of the technique. With the introduction of the Si-Li detector, there was only one spectrometer with a single geometry resulting in the development of various procedures for obtaining quantitative elemental analysis of the individual particles.

scholarly journals ELEMENTAL ANALYSIS OF URINARY TRACT CALCULI USING AN ELECTRON MICROSCOPE WITH ELECTRON PROBE X-RAY MICROANALYZER

1978 ◽  
Vol 11 (4) ◽  
pp. 387-398 ◽  
Author(s):  
FUMITAKA KENNOKI ◽  
VINCI MIZUHIRA ◽  
TOSHIMITSU KONJIKI ◽  
HIROSHI KAWAI
Keyword(s):  
Electron Microscope ◽  
Urinary Tract ◽  
Elemental Analysis ◽  
Electron Probe ◽  
X Ray ◽  
Urinary Tract Calculi

scholarly journals STANDARDS FOR ELECTRON PROBE MICROANALYSIS OF BIOLOGIC SPECIMENS

1972 ◽  
Vol 20 (9) ◽  
pp. 710-715 ◽  
Author(s):  
G. M. LEHRER ◽  
C. BERKLEY
Keyword(s):  
Tissue Section ◽  
Elemental Analysis ◽  
Electron Microprobe ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Regression Curve ◽  
X Ray ◽  
Tissue Sections ◽  
Freeze Dried ◽  
Carbon Coated

A procedure is described for the preparation and application of gelatin standards in the quantitative elemental analysis of microscopic portions of tissue sections in the electron microprobe x-ray spectrometer. Ten to fifteen per cent gelatin solutions containing varying concentrations of the elements to be measured are quick-frozen in capsules, sectioned in a cryostat at the same thickness as the tissue and freeze-dried. Standard sections are mounted with each tissue section, carbon-coated and analyzed simultaneously. Concentrations of the elements in portions of the tissue as small as 10–12 liters are then determined directly from a regression curve or equation derived from the standards.

Elemental analysis of individual rat blood platelets by electron probe X-ray microanalysis using a direct quantification method

1985 ◽  
Vol 82 (3) ◽  
pp. 257-261 ◽  
Author(s):  
A. Boekestein ◽  
G. A. J. Kuijpers ◽  
A. L. H. Stols ◽  
A. M. Stadhouders
Keyword(s):  
Elemental Analysis ◽  
Electron Probe ◽  
Blood Platelets ◽  
Rat Blood ◽  
X Ray ◽  
Quantification Method ◽  
Direct Quantification

Improvements in the electron probe forming capabilities and x-ray hole counts in the Philips TEM

1983 ◽  
Vol 41 ◽  
pp. 376-377
Author(s):  
Richard L. McConville
Keyword(s):  
Field Strength ◽  
Electron Probe ◽  
Spherical Aberration ◽  
Focal Length ◽  
Objective Lens ◽  
Parallel Beam ◽  
Tilt Axis ◽  
X Ray ◽  
Small Probe ◽  
Specimen Height

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

Spatial resolution of X-ray microanalysis in thin foils

1978 ◽  
Vol 36 (1) ◽  
pp. 544-545
Author(s):  
R. Hutchings ◽  
I.P. Jones ◽  
M.H. Loretto ◽  
R.E. Smallman
Keyword(s):  
Spatial Resolution ◽  
Electron Probe ◽  
Beam Divergence ◽  
Inelastic Interaction ◽  
Specimen Thickness ◽  
High Current ◽  
Beam Spreading ◽  
X Ray ◽  
Thin Foils ◽  
Complex Calculation

There is increasing interest in X-ray microanalysis of thin specimens and the present paper attempts to define some of the factors which govern the spatial resolution of this type of microanalysis. One of these factors is the spreading of the electron probe as it is transmitted through the specimen. There will always be some beam-spreading with small electron probes, because of the inevitable beam divergence associated with small, high current probes; a lower limit to the spatial resolution is thus 2αst where 2αs is the beam divergence and t the specimen thickness.In addition there will of course be beam spreading caused by elastic and inelastic interaction between the electron beam and the specimen. The angle through which electrons are scattered by the various scattering processes can vary from zero to 180° and it is clearly a very complex calculation to determine the effective size of the beam as it propagates through the specimen.

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