scholarly journals ELEMENTAL ANALYSIS OF URINARY TRACT CALCULI USING AN ELECTRON MICROSCOPE WITH ELECTRON PROBE X-RAY MICROANALYZER

1978 ◽  
Vol 11 (4) ◽  
pp. 387-398 ◽  
Author(s):  
FUMITAKA KENNOKI ◽  
VINCI MIZUHIRA ◽  
TOSHIMITSU KONJIKI ◽  
HIROSHI KAWAI
Keyword(s):  
Electron Microscope ◽  
Urinary Tract ◽  
Elemental Analysis ◽  
Electron Probe ◽  
X Ray ◽  
Urinary Tract Calculi

The Analysis of Particles With Energy Dispersive X-Ray Spectroscopy (EDS)

1998 ◽  
Vol 4 (S2) ◽  
pp. 184-185
Author(s):  
J. A. Small ◽  
J. A. Armstrong ◽  
D. S. Bright ◽  
B. B. Thorne
Keyword(s):  
Electron Microscope ◽  
Elemental Analysis ◽  
Electron Probe ◽  
Initial Particle ◽  
X Ray ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
The Individual ◽  
Individual Particles

The addition of the Si-Li detector to the electron probe, the scanning electron microscope, and more recently the transmission electron microscope (resulting in the analytical electron microscope) has made it possible to obtain elemental analysis on individual “particles” with dimensions less than 1 nm using EDS. Although some initial particle studies on micrometer-sized particles were done on the electron probe using wavelength dispersive spectrometers, WDS, the variability and complexity of many particle compositions coupled with the high currents necessary for WDS made elemental analysis of particles by WDS difficult at best. In addition, the use of multiple spectrometers, each with a different view of the particle and therefore different particle geometry as shown in Fig. 1, limited the quantitative capabilities of the technique. With the introduction of the Si-Li detector, there was only one spectrometer with a single geometry resulting in the development of various procedures for obtaining quantitative elemental analysis of the individual particles.

Research on the Insulation Materials with Sugar Filter Mud as Pore-Forming Agent and Jilin Clay as Aggregate

2013 ◽  
Vol 361-363 ◽  
pp. 682-685
Author(s):  
Chao Qian ◽  
Wen Yuan Gao ◽  
Chun Yuan Luo ◽  
Li Dong Tuo ◽  
Hai Yuan Li ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Electron Microscope ◽  
Flexural Strength ◽  
Scanning Electron Microscope ◽  
Elemental Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Insulation Materials ◽  
Filter Mud ◽  
Scanning Electron

Insulation materials with flexural strength 5.238 MPa and porosity 39.24% obtained at 1050 °C for 0.5 h show that its bulk density of the materials decreased down to 1.252 g/cm3using clay as aggregate. Due to change the amount of sugar filter mud, the porosity arises from 37.07% to 39.24% and the thermal conductivity decreases from 0.086 to 0.052 W·m-1·K-1. The clay and wastes were characterized by X-ray diffraction (XRD), scanning electron microscope (SEM) and chemical elemental analysis. The main crystalline phases of sample observed by XRD are quartz, mullite and anorthite. The insulation materials were manufactured from clay and the optimal proportion of wastes.

scholarly journals Silk Textiles from the Topkapi Palace Museum, Istanbul: An Analytical Study

2021 ◽  
pp. 67-75
Keyword(s):  
High Performance Liquid Chromatography ◽  
Liquid Chromatography ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Elemental Analysis ◽  
High Performance ◽  
Analytical Study ◽  
Color Measurement ◽  
X Ray ◽  
Scanning Electron

Eight historical textile objects belonging to the 16th-20th centuries in the collection of the Topkapi Palace Museum in Istanbul were analyzed with the purpose of reaching improved conservation and restoration methods. The historical textiles underwent dyestuff analysis by High Performance Liquid Chromatography, morphological and elemental analysis by Scanning Electron Microscope with energy Dispersive X-ray Spectroscopy, CIEL*a*b color measurement as well as technical analysis by optical microscopy.

Compositional imaging in the Electron Microscope

1991 ◽  
Vol 49 ◽  
pp. 2-3
Author(s):  
C. E. Lyman
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
Data Collection ◽  
Electron Probe ◽  
Compositional Data ◽  
Fine Scale ◽  
Bulk Specimen ◽  
Beam Position ◽  
X Ray

Imaging of elemental distributions on a fine scale is one of the triumphs of electron microscopy. Compositional imaging frees the operator from the necessity of making decisions about which features contain the elements of interest. Elements in unexpected locations, or in unexpected association with other elements, may be found easily without operator bias as to where to locate the electron probe for compositional data collection. This technique may be applied to bulk or thin specimens using a variety of composition-sensitive signals as shown in Figure 1.Cosslett and Duncumb obtained the first such compositional image in an electron microprobe modified to scan the electron beam and collect a characteristic x-ray signal as a function of beam position. Early images of this type were called x-ray “dot maps” and provided a qualitative indication of the location of elements on a flat polished bulk specimen to a spatial resolution of about 1 μm.

Combined Plasma-Microincineration, Electron Microscopy And Electron Probe Microanalysis For Fine Localization of Biological Mineral Substances

1973 ◽  
Vol 31 ◽  
pp. 334-335 ◽  
Author(s):  
Richard S. Thomas ◽  
Mabel I. Corlett
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Probe ◽  
Oxygen Plasma ◽  
Chemical Nature ◽  
The Other ◽  
X Ray ◽  
Transmission Electron ◽  
Mineral Substances ◽  
Fine Localization

Ash patterns produced by oxygen plasma microincineration(OPM) of thin-sectioned biological materials and examined with the transmission electron microscope (TEM) can show unambiguously the distribution of mineral substances in the specimen with resolutions down to 100 Å. The chemical nature of the mineral is not demonstrated, however. Electron-probe X-ray microanalysis (EXM), on the other hand, can determine precisely the nature of the mineral in ashgd or unashed sections but its spatial resolution is limited to 1000-10,000 A at best. Also its sensitivity of analysis on unashed specimens is limited by intolerance of the specimen to high beam intensities. Using both TEM and EXM together on ash patterns of suitable specimens can overcome their independent spatial and chemical limitations. Furthermore, use of OPM produces a highly stable mineral specimen for EXM, thereby improving sensitivity.

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