Elemental analysis of individual rat blood platelets by electron probe X-ray microanalysis using a direct quantification method

1985 ◽  
Vol 82 (3) ◽  
pp. 257-261 ◽  
Author(s):  
A. Boekestein ◽  
G. A. J. Kuijpers ◽  
A. L. H. Stols ◽  
A. M. Stadhouders
1985 ◽  
Vol 33 (3) ◽  
pp. 185-190 ◽  
Author(s):  
P W Linders ◽  
R A Van de Vorstenbosch ◽  
A M Stadhouders

An improved method for quantitative electron probe X-ray microanalysis of thin biological specimens, introduced recently, has been applied to the elemental analysis of rat blood platelets. The method uses the X-ray signal to quantify the elemental content of an object and electron scattering to determine the total dry mass of the object. Along with the dry mass distribution, data were obtained on the content and mass fraction of calcium, magnesium, and sulfur in 31 individual platelets. The mean platelet dry mass was found to be 985 fg. The mean Ca, Mg, and S contents were 1.80, 3.41, and 18.3 fg, with mean dry mass fractions of 0.195, 0.396, and 1.96%, respectively. Furthermore, these elements appear to be unevenly distributed among the platelet population.


1998 ◽  
Vol 4 (S2) ◽  
pp. 184-185
Author(s):  
J. A. Small ◽  
J. A. Armstrong ◽  
D. S. Bright ◽  
B. B. Thorne

The addition of the Si-Li detector to the electron probe, the scanning electron microscope, and more recently the transmission electron microscope (resulting in the analytical electron microscope) has made it possible to obtain elemental analysis on individual “particles” with dimensions less than 1 nm using EDS. Although some initial particle studies on micrometer-sized particles were done on the electron probe using wavelength dispersive spectrometers, WDS, the variability and complexity of many particle compositions coupled with the high currents necessary for WDS made elemental analysis of particles by WDS difficult at best. In addition, the use of multiple spectrometers, each with a different view of the particle and therefore different particle geometry as shown in Fig. 1, limited the quantitative capabilities of the technique. With the introduction of the Si-Li detector, there was only one spectrometer with a single geometry resulting in the development of various procedures for obtaining quantitative elemental analysis of the individual particles.


1978 ◽  
Vol 11 (4) ◽  
pp. 387-398 ◽  
Author(s):  
FUMITAKA KENNOKI ◽  
VINCI MIZUHIRA ◽  
TOSHIMITSU KONJIKI ◽  
HIROSHI KAWAI

1972 ◽  
Vol 20 (9) ◽  
pp. 710-715 ◽  
Author(s):  
G. M. LEHRER ◽  
C. BERKLEY

A procedure is described for the preparation and application of gelatin standards in the quantitative elemental analysis of microscopic portions of tissue sections in the electron microprobe x-ray spectrometer. Ten to fifteen per cent gelatin solutions containing varying concentrations of the elements to be measured are quick-frozen in capsules, sectioned in a cryostat at the same thickness as the tissue and freeze-dried. Standard sections are mounted with each tissue section, carbon-coated and analyzed simultaneously. Concentrations of the elements in portions of the tissue as small as 10–12 liters are then determined directly from a regression curve or equation derived from the standards.


Author(s):  
Richard L. McConville

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.


Author(s):  
R. F. Egerton

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.


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