scholarly journals DEMONSTRATION OF THE ELEMENTAL DISTRIBUTION IN BIOLOGICAL TISSUES BY MEANS OF THE ELECTRON MICROSCOPE AND ELECTRON PROBE X-RAY MICROANALYZER

1973 ◽  
Vol 6 (1) ◽  
pp. 44-52 ◽  
Author(s):  
VINCI MIZUHIRA
Keyword(s):  
Electron Microscope ◽  
Electron Probe ◽  
Biological Tissues ◽  
Elemental Distribution ◽  
X Ray

scholarly journals Oxygen incineration and electron microscope x-ray microanalysis of mineral particles in biological tissues.

1978 ◽  
Vol 26 (12) ◽  
pp. 1087-1093 ◽  
Author(s):  
W J Henderson ◽  
C Melville-Jones ◽  
D W Wilson ◽  
K Griffiths
Keyword(s):  
Electron Microscope ◽  
Quantitative Analysis ◽  
Lung Tissue ◽  
Fine Particles ◽  
Biological Tissues ◽  
Particle Content ◽  
X Ray ◽  
Mineral Particles ◽  
Incineration Process

Techniques employed for the recovery from biological tissues of noncombustible fine particles such as asbestos, talc, kaolin and diatomaceous material were assessed by electron microscope x-ray microanalysis. Recovery procedures which have been proven successful for lung tissue were found to be impracticable for more solid types of tissues. Digestion techniques employing acids, alkalis or enzymes and standard incineration procedures were found to be unsatisfactory for human adrenal, cervix, liver and ovarian tissues when the resultant residues were examined by electron microscope microanalysis. The recovered particles were often completely masked with residues which were shown to be composed of organic elements. The use of oxygen during the incineration process completely removed this contaminating material in nearly all cases studied. When such procedures were used, clearly defined particles were recovered from the tissue, thereby permitting x-ray analysis. A quantitative analysis could then be made to estimate the particle content in a variety of tissues.

scholarly journals Microanalysis of individual silver halide microcrystals

1992 ◽  
Vol 50 (2) ◽  
pp. 1612-1613
Author(s):  
S. Wu ◽  
A. Van Daele ◽  
W. Jacob ◽  
R. Gijbels ◽  
A. Verbeeck ◽  
...  
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
Silver Halide ◽  
Processing System ◽  
Energy Dispersive ◽  
Elemental Distribution ◽  
X Ray ◽  
Scanning Transmission ◽  
Carbon Coated ◽  
Electron Imaging

There is a considerable interest for the study of the elemental distribution and composition in silver halide photographic emulsions, particularly for the microanalysis of individual microcrystals. In this work, elemental distributions and contents of tabular and cubic silver halide microcrystals were obtained by backscattered electron imaging (BSEI), scanning transmission electron imaging (STEI), x-ray mapping and x-ray microanalysis in a scanning electron microscope (STEM) combined with energy-dispersive x-ray analysis (EDX).Several kinds of silver halide microcrystals were prepared, After removing the gelatin, repeated centrifugation and washing in distilled water, the grains were resuspended and dispersed onto carbon coated 50 mesh copper grids. All analyses were carried out on a JEOL 1200 EX electron microscope equipped with detectors for backscattered, secondary and transmitted electrons and an energy dispersive x-ray analysis system. An image processing system was used for acquiring and processing BSE images, STE images and x-ray maps. The role of the image processing computer system (IBAS Kontron) is twofold: it allows to optimize the acquisition conditions and to process the images afterwards.

Compositional imaging in the Electron Microscope

1991 ◽  
Vol 49 ◽  
pp. 2-3
Author(s):  
C. E. Lyman
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
Data Collection ◽  
Electron Probe ◽  
Compositional Data ◽  
Fine Scale ◽  
Bulk Specimen ◽  
Beam Position ◽  
X Ray

Imaging of elemental distributions on a fine scale is one of the triumphs of electron microscopy. Compositional imaging frees the operator from the necessity of making decisions about which features contain the elements of interest. Elements in unexpected locations, or in unexpected association with other elements, may be found easily without operator bias as to where to locate the electron probe for compositional data collection. This technique may be applied to bulk or thin specimens using a variety of composition-sensitive signals as shown in Figure 1.Cosslett and Duncumb obtained the first such compositional image in an electron microprobe modified to scan the electron beam and collect a characteristic x-ray signal as a function of beam position. Early images of this type were called x-ray “dot maps” and provided a qualitative indication of the location of elements on a flat polished bulk specimen to a spatial resolution of about 1 μm.

Combined Plasma-Microincineration, Electron Microscopy And Electron Probe Microanalysis For Fine Localization of Biological Mineral Substances

1973 ◽  
Vol 31 ◽  
pp. 334-335 ◽  
Author(s):  
Richard S. Thomas ◽  
Mabel I. Corlett
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Probe ◽  
Oxygen Plasma ◽  
Chemical Nature ◽  
The Other ◽  
X Ray ◽  
Transmission Electron ◽  
Mineral Substances ◽  
Fine Localization

Ash patterns produced by oxygen plasma microincineration(OPM) of thin-sectioned biological materials and examined with the transmission electron microscope (TEM) can show unambiguously the distribution of mineral substances in the specimen with resolutions down to 100 Å. The chemical nature of the mineral is not demonstrated, however. Electron-probe X-ray microanalysis (EXM), on the other hand, can determine precisely the nature of the mineral in ashgd or unashed sections but its spatial resolution is limited to 1000-10,000 A at best. Also its sensitivity of analysis on unashed specimens is limited by intolerance of the specimen to high beam intensities. Using both TEM and EXM together on ash patterns of suitable specimens can overcome their independent spatial and chemical limitations. Furthermore, use of OPM produces a highly stable mineral specimen for EXM, thereby improving sensitivity.

Strategies For Combining Elemental Distribution Data Derived From Multiple Images and Samples

1998 ◽  
Vol 4 (S2) ◽  
pp. 134-135
Author(s):  
Marie E. Cantino ◽  
Joseph G. Eichen
Keyword(s):  
Electron Probe ◽  
Striated Muscle ◽  
Distribution Data ◽  
Elemental Distribution ◽  
Normalization Procedure ◽  
Multiple Images ◽  
X Ray ◽  
Freeze Dried ◽  
Hall Method ◽  
Elemental Peak

Data from digital electron probe x-ray microanalysis (EPXMA) images can be used to generate high resolution profiles of Ca binding within sarcomeres of vertebrate striated muscle. While ratios of elemental peak to bremstrahlung at each point (Hall method) have been used in many studies to allow comparison of data taken from different samples, this procedure has limitations for our application. A different normalization procedure is described here which provides a means of assessing variation among elemental and bremstrahlung profiles obtained from different images and samples.Freeze dried cryosections of chemically skinned frog or rabbit skeletal muscle were prepared as previously described. Digital EPXMA images were collected for 24 to 36 hours using a Zeiss EM910 STEM and an Oxford ExL2 microanalysis system. Calcium and bremstrahlung counts were summed within one pixel wide masks placed at successive positions along each half sarcomere, as previously described, using an automated routine in IPLAB on a Power Mac 7100.

The Analysis of Particles With Energy Dispersive X-Ray Spectroscopy (EDS)

1998 ◽  
Vol 4 (S2) ◽  
pp. 184-185
Author(s):  
J. A. Small ◽  
J. A. Armstrong ◽  
D. S. Bright ◽  
B. B. Thorne
Keyword(s):  
Electron Microscope ◽  
Elemental Analysis ◽  
Electron Probe ◽  
Initial Particle ◽  
X Ray ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
The Individual ◽  
Individual Particles

The addition of the Si-Li detector to the electron probe, the scanning electron microscope, and more recently the transmission electron microscope (resulting in the analytical electron microscope) has made it possible to obtain elemental analysis on individual “particles” with dimensions less than 1 nm using EDS. Although some initial particle studies on micrometer-sized particles were done on the electron probe using wavelength dispersive spectrometers, WDS, the variability and complexity of many particle compositions coupled with the high currents necessary for WDS made elemental analysis of particles by WDS difficult at best. In addition, the use of multiple spectrometers, each with a different view of the particle and therefore different particle geometry as shown in Fig. 1, limited the quantitative capabilities of the technique. With the introduction of the Si-Li detector, there was only one spectrometer with a single geometry resulting in the development of various procedures for obtaining quantitative elemental analysis of the individual particles.

scholarly journals Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films

2011 ◽  
Vol 17 (5) ◽  
pp. 728-751 ◽  
Author(s):  
D. Abou-Ras ◽  
R. Caballero ◽  
C.-H. Fischer ◽  
C.A. Kaufmann ◽  
I. Lauermann ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Glow Discharge ◽  
Auger Electron ◽  
Rutherford Backscattering Spectrometry ◽  
Electron Backscatter Diffraction ◽  
Grazing Incidence ◽  
Elemental Distribution ◽  
Elastic Recoil ◽  
X Ray

AbstractThe present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 μm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits.

X-Ray Microanalysis of Al/Zr Multilayers in the Transmission Electron Microscope

1997 ◽  
Vol 472 ◽  
Author(s):  
M. A. Wall ◽  
T. W. Barbee ◽  
J. Bentley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Electron Probe ◽  
Nanometer Scale ◽  
Line Profiles ◽  
Electron Microscopic ◽  
X Ray ◽  
Transmission Electron ◽  
Interface Layers

ABSTRACTA one-nanometer scale transmission electron microscope electron probe X-ray microanalysis characterization of as-deposited and annealed aluminum - 11.5 at.% zirconium multilayer samples in cross-section synthesized by magnetron sputtering is reported on here. Composition line profiles were acquired across Zr layers in as-deposited material and samples isochronnally annealed in a differential scanning calorimeter to temperatures of 290°C and 485°C. A spatial resolution of approximaty 1.5 to 2.0 nm was achieved in these experiments and will be improved by deconvoluti on of the instrumental electron probe function from the data. The as-deposited structure consisted of crystalline Al and Zr layers with thin amorphous layers at the Al/Zr interfaces. The amorphous interface layers increased in thickness upon annealing to 290°C. Additionally, at 290”C a metastable cubic alloy forms at the Zr deposited on Al interface. Upon heating to 485°C a multilayer of Al and metastable cubic AlxZr1-x phase is formed. The electron microscopic experimental technique, observations and data analysis will be discussed as applied to these multilayered materials.

scholarly journals SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze

1999 ◽  
Vol 589 ◽  
Author(s):  
Paul G. Kotula ◽  
Michael R. Keenan ◽  
Ian M. Anderson
Keyword(s):  
Electron Microscope ◽  
Statistical Analysis ◽  
Image Data ◽  
Relevant Information ◽  
Elemental Distribution ◽  
Data Set ◽  
X Ray ◽  
Metal Ceramic ◽  
Spectrum Imaging ◽  
Scanning Electron

AbstractEnergy dispersive x-ray (EDX) spectrum imaging has been performed in a scanning electron microscope (SEM) on a metal/ceramic braze to characterize the elemental distribution near the interface. Statistical methods were utilized to extract the relevant information (i.e., chemical phases and their distributions) from the spectrum image data set in a robust and unbiased way. The raw spectrum image was over 15 Mbytes (7500 spectra) while the statistical analysis resulted in five spectra and five images which describe the phases resolved above the noise level and their distribution in the microstructure

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