Determination of solid surface tension at the nano-scale using atomic force microscopy

Contact Angle, Wettability and Adhesion, Volume 4 ◽

10.1201/b12166-17 ◽

2006 ◽

pp. 249-276

Keyword(s):

Surface Tension ◽

Atomic Force Microscopy ◽

Solid Surface ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force ◽

Solid Surface Tension

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Determination of solid surface tension from particle–substrate pull-off forces measured with the atomic force microscope

Journal of Colloid and Interface Science ◽

10.1016/j.jcis.2004.08.002 ◽

2004 ◽

Vol 280 (2) ◽

pp. 484-497 ◽

Cited By ~ 78

Author(s):

Jaroslaw Drelich ◽

Garth W. Tormoen ◽

Elvin R. Beach

Keyword(s):

Surface Tension ◽

Atomic Force Microscope ◽

Solid Surface ◽

Atomic Force ◽

Solid Surface Tension

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Determination of near-surface forces in optical polishing using atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/5/2/002 ◽

1994 ◽

Vol 5 (2) ◽

pp. 70-79 ◽

Cited By ~ 7

Author(s):

M J Cumbo ◽

S D Jacobs

Keyword(s):

Atomic Force Microscopy ◽

Surface Forces ◽

Near Surface ◽

Force Microscopy ◽

Atomic Force ◽

Optical Polishing

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Experimental determination of the mechanical impedance of atomic force microscopy cantilevers in fluids up to 70 kHz

Journal of Applied Physics ◽

10.1063/1.1287522 ◽

2000 ◽

Vol 88 (5) ◽

pp. 2912-2920 ◽

Cited By ~ 22

Author(s):

Marc P. Scherer ◽

Gerhard Frank ◽

Anthony W. Gummer

Keyword(s):

Atomic Force Microscopy ◽

Experimental Determination ◽

Mechanical Impedance ◽

Force Microscopy ◽

Atomic Force

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Determination of spatial resolution in atomic-force-microscopy-based electrical characterization techniques using quantum well structures

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1835317 ◽

2005 ◽

Vol 23 (1) ◽

pp. 61 ◽

Cited By ~ 10

Author(s):

O. Douhéret ◽

S. Bonsels ◽

S. Anand

Keyword(s):

Atomic Force Microscopy ◽

Quantum Well ◽

Spatial Resolution ◽

Electrical Characterization ◽

Quantum Well Structures ◽

Force Microscopy ◽

Characterization Techniques ◽

Atomic Force

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Nanoscale Research Letters ◽

10.1186/s11671-016-1765-2 ◽

2016 ◽

Vol 11 (1) ◽

Cited By ~ 2

Author(s):

Kesheng Wang ◽

Jia Cheng ◽

Shiji Yao ◽

Yijia Lu ◽

Linhong Ji ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Phase Difference ◽

Amplitude Modulation ◽

Electrostatic Force ◽

Force Microscopy ◽

Atomic Force

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Determination of the surface area of annealed continuous gold film and pyrex glass in situ by the BET adsorption isotherm and ex situ by Atomic Force Microscopy in air

Applied Surface Science ◽

10.1016/s0169-4332(98)00297-9 ◽

1998 ◽

Vol 135 (1-4) ◽

pp. 8-14 ◽

Cited By ~ 5

Author(s):

L Stobiński ◽

L Zommer

Keyword(s):

Atomic Force Microscopy ◽

Adsorption Isotherm ◽

Surface Area ◽

Gold Film ◽

Ex Situ ◽

Pyrex Glass ◽

Force Microscopy ◽

Atomic Force

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Nano-Scale Observations of Tattoo Pigments in Skin by Atomic Force Microscopy

Tattooed Skin and Health - Current Problems in Dermatology ◽

10.1159/000369187 ◽

2015 ◽

pp. 97-102

Author(s):

Colin A. Grant ◽

Peter C. Twigg ◽

Desmond J. Tobin

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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Determination of Microdomain Size in Langmuir-Blodgett Films of Binary Mixtures by IR Spectroscopy and Atomic Force Microscopy

Progress in Fourier Transform Spectroscopy ◽

10.1007/978-3-7091-6840-0_177 ◽

1997 ◽

pp. 683-685

Author(s):

Suci Widayati ◽

Richard A. Dluhy

Keyword(s):

Atomic Force Microscopy ◽

Ir Spectroscopy ◽

Binary Mixtures ◽

Force Microscopy ◽

Langmuir Blodgett ◽

Atomic Force ◽

Langmuir Blodgett Films

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Determination of Punica granatum L. Carpellary membrane elastic properties using atomic force microscopy

Recent Advances in Multidisciplinary Applied Physics ◽

10.1016/b978-008044648-6/50020-3 ◽

2005 ◽

pp. 119-125

Author(s):

M MILLAN ◽

M GASQUE ◽

F GARCIADIEGO ◽

J CURIEL ◽

G RUIZ

Keyword(s):

Atomic Force Microscopy ◽

Elastic Properties ◽

Punica Granatum ◽

Force Microscopy ◽

Atomic Force ◽

Punica Granatum L

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Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

Ultramicroscopy ◽

10.1016/s0304-3991(03)00032-9 ◽

2003 ◽

Vol 97 (1-4) ◽

pp. 81-87 ◽

Cited By ~ 22

Author(s):

Tomoyuki Yoshino ◽

Shigeru Sugiyama ◽

Shoji Hagiwara ◽

Daisuke Fukushi ◽

Motoharu Shichiri ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Near Field ◽

Force Microscopy ◽

Nano Scale ◽

Atomic Force

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