Quantitative thin‐layer thickness estimation using relative peak frequency variation

2009 ◽  
Author(s):  
Luping Sun ◽  
Xiaodong Zheng ◽  
Hao Yang
Keyword(s):  
Thin Layer ◽  
Layer Thickness ◽  
Peak Frequency ◽  
Frequency Variation ◽  
Thickness Estimation

scholarly journals The Soft Layer Thickness Estimation using Microtremor Measurement to Identify Landside Potential in Watukumpul, Central Java, Indonesia.

2021 ◽  
Vol 6 (1) ◽  
pp. 16-23
Author(s):  
Urip Nurwijayanto Prabowo ◽  
Akmal Ferdiyan ◽  
Ayu Fitri Amalia
Keyword(s):  
Layer Thickness ◽  
Spectral Ratio ◽  
Dominant Frequency ◽  
Soil Slope ◽  
Soft Layer ◽  
Thickness Estimation ◽  
Central Java ◽  
Hvsr Method ◽  
Microtremor Measurement ◽  
Potential Area

Watukumpul is an area that is prone to landslides, so determining the soft layer thickness is very important to identify the landslide potential. The soft layer thickness can be estimated using microtremor signal measurements which analyzed using the Horizontal to Vertical Spectral Ratio (HVSR). In this study,we measured microtremor signal of 33location around Watukumpul, Pemalang, Central Java area to determine soft layer thickness. Micretremor signal was analyzed based on theHVSR method using Geopsy software and follow the standard of the Sesame Europan Project. The results of the HVSR method are the HVSR curve that fulfills the reliable curve standard. HVSR curve shows that the dominant frequency of soft layer ranges from 1.36 – 7.62 Hz and the amplification values ranges from 9.00 – 41.45. The soft layer thickness value in the study area ranges from 17.58 - 103.60 meters. The high landslide potential area are located at W7, W8, W18, W30 and W32 where has thin soft layer and high soil slope.

Characterization of Inhomogeneity in Thermal Oxide SiO2 Films on 4H-SiC Epitaxial Substrates by a Combination of Fourier Transform Infrared Spectroscopy and Cathodoluminescence Spectroscopy

2018 ◽  
Vol 924 ◽  
pp. 273-276 ◽  
Author(s):  
Masanobu Yoshikawa ◽  
Keiko Inoue ◽  
Junichiro Sameshima ◽  
Hirohumi Seki
Keyword(s):  
Fourier Transform ◽  
Oxide Layer ◽  
Layer Thickness ◽  
Phonon Mode ◽  
Fourier Transform Infrared ◽  
Blue Shift ◽  
Peak Frequency ◽  
Oxide Layer Thickness ◽  
Thermal Oxide ◽  
Ft Ir

We measured Fourier transform infrared (FT-IR) and cathodoluminescence (CL) spectra of SiO2 films with a various thickness, grown on 4H-SiC substrates. The peak frequency of the transverse optical (TO) phonon mode was blue-shifted by about 5 cm−1 as the oxide-layer thickness decreased from 50-60 nm to 10 nm. The blue shift of the TO mode is considerd to be caused by interfacial compressive stresses in the oxide-layer. On the other hand, the TO phonon mode was found to dramatically decrease as the oxide-layer thickness decreased from 10 nm to 1.7 nm. The CL measurement indicates that the intensity of the CL peaks at about 460 and 490 nm attributed to oxygen vacancy centers (OVCs) for No.2 become stronger than that for No.1. From a comparison between FT-IR and CL measurements, we concluded that the red-shift of the TO phonon with decreasing the oxide-layer thickness can mainly be attributed to an increase in inhomogeneity at the SiO2/SiC interface with decreasing oxide-layer thickness.

Modeling Energy Deposition in Very Thin Layered Media by Monte Carlo Simulation

2007 ◽  
Author(s):  
Reginald Eze ◽  
Anisur Rahman ◽  
Sunil Kumar
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Thin Layer ◽  
Layer Thickness ◽  
Path Length ◽  
Energy Deposition ◽  
Radiation Transport ◽  
Monte Carlo Model ◽  
Layered Media ◽  
Thin Layers

A Monte Carlo model with special features for modeling of radiation transport through very thin layers has been presented. Over the decades traditional Monte Carlo model has been used to model highly scattering thin layers in skin and may inaccurately capture the effect of thin layers since their interfaces are not perfectly planar and thicknesses non-uniform. If the Monte Carlo model is implemented without special features then the results of the simulation would show no effect of the outer thin layer since the path length of most photons would be significantly larger than the layer thickness and the resulting predicted photon travel would simply not notice the presence of the layer. Examples of multi-layered media are considered where the effect of a very thin absorbing layers is systematically examined using both the traditional Monte Carlo and that with new features incorporated. The results have profound implications in the diagnostic and therapeutic applications of laser in biomedicine and surgery.

scholarly journals Dead layer thickness estimation at the ferroelectric film-metal interface in PZT

2019 ◽  
Vol 114 (13) ◽  
pp. 132902 ◽  
Author(s):  
Yu. V. Podgorny ◽  
K. A. Vorotilov ◽  
A. S. Sigov ◽  
J. F. Scott
Keyword(s):  
Layer Thickness ◽  
Ferroelectric Film ◽  
Dead Layer ◽  
Metal Interface ◽  
Thickness Estimation ◽  
Dead Layer Thickness

scholarly journals SIMULATION HETEROJUNCTION SOLAR CELL A-SI:H(N)/A-SI:H(I)/C-SI(P)

2020 ◽  
Vol 2 (6(75)) ◽  
pp. 56-61
Author(s):  
S.A. Livinskaya S.A.
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Thin Layer ◽  
Layer Thickness ◽  
Silicon Solar Cell ◽  
Heterojunction Solar Cell ◽  
Silicon Solar Cells ◽  
Technological Research ◽  
A Value ◽  
Photovoltaic Characteristics

In this work, a silicon solar cell HIT (heterojunction with intrinsic thin-layer) a-Si:H(n)/a-Si:H(i)/c-Si(p) was simulated using AFORS-HET software. The influence of layer thickness and temperature of the solar cell under study on its photovoltaic characteristics is discussed. When optimizing the above characteristics, its effectiveness reaches a value of 19.1%. The results obtained are the foundation for further scientific and technological research on the development of highly efficient silicon solar cells.

scholarly journals Surface roughness minimum: Ag thin layer deposited on a glass

2001 ◽  
Vol 66 (7) ◽  
pp. 483-490 ◽  
Author(s):  
R. Petrovic ◽  
S. Strbac ◽  
N. Bundaleski ◽  
Z. Rakocevic
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Thin Layer ◽  
Layer Thickness ◽  
Deposition Rate ◽  
Turning Point ◽  
Deposition Time ◽  
Substrate Surface ◽  
Deposition Process ◽  
Silver Thin Films

In this paper the results of an examination of the surface roughness and morphology dependence of silver thin films up to 100 nm thick deposited on a microscope glass on the deposition rate and on the deposition time are presented. It was found that, for a constant deposition rate, the surface roughness exhibits minimum at a certain layer thickness. This coincides with the turning point when the influence of the substrate surface on the deposition process becomes negligible, i.e., to the change in the nature of the system substrate/deposit from Ag/glass to Ag/Ag. For a constant layer thickness, sthe surface roughness minimum, achieved at a certain deposition rate, coincides to the turning point when the average free path for vertical adatom mobility becomes zero.

Dual Solutions Analysis of Melting Phenomenon with Mixed Convection in a Nanofluid Flow and Heat Transfer Past a Permeable Stretching/Shrinking Sheet

2020 ◽  
Vol 9 (4) ◽  
pp. 313-320
Author(s):  
Sadia Anjum Jumana ◽  
M. G. Murtaza ◽  
M. Ferdows ◽  
O. D. Makinde ◽  
Khairy Zaimi
Keyword(s):  
Heat Transfer ◽  
Mixed Convection ◽  
Thin Layer ◽  
Layer Thickness ◽  
Magnetic Parameter ◽  
Dual Solutions ◽  
Graphical Form ◽  
Shrinking Sheet ◽  
Near Surface ◽  
Melting Parameter

The 2-D MHD nanofluid with mixed convection above a stretching/shrinking plate has been investigated. Melting heat transfer near surface is contemplated. Consider the saline water as base fluid with containing single SWCNTs as well as MWCNTs. Suitable similarity variables are employed to transform the governing PDEs into ODEs. These transformed equations which are coupled, and of high nonlinearity, have been solved through applying the bvp4c solver. The consequences of the relevant parameters like, the MHD parameter, mixed convection parameter, melting parameter, volume fraction on the flow field along with the skin friction and heat transfer rate are displayed in graphical form. Results show that the thin layer thickness diminishes as magnetic parameter enhances and at the same time temperature increases with magnetic parameter. It is also demonstrated that the melting parameter leads to a reduction in the thin layer thickness as well as dimensionless temperature. Obtain dual solutions for flow fields which delineates to identify the stable solution.

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