scholarly journals Surface roughness minimum: Ag thin layer deposited on a glass

2001 ◽  
Vol 66 (7) ◽  
pp. 483-490 ◽  
Author(s):  
R. Petrovic ◽  
S. Strbac ◽  
N. Bundaleski ◽  
Z. Rakocevic

In this paper the results of an examination of the surface roughness and morphology dependence of silver thin films up to 100 nm thick deposited on a microscope glass on the deposition rate and on the deposition time are presented. It was found that, for a constant deposition rate, the surface roughness exhibits minimum at a certain layer thickness. This coincides with the turning point when the influence of the substrate surface on the deposition process becomes negligible, i.e., to the change in the nature of the system substrate/deposit from Ag/glass to Ag/Ag. For a constant layer thickness, sthe surface roughness minimum, achieved at a certain deposition rate, coincides to the turning point when the average free path for vertical adatom mobility becomes zero.

Coatings ◽  
2019 ◽  
Vol 9 (10) ◽  
pp. 607 ◽  
Author(s):  
Shenglan Yang ◽  
Jing Zhong ◽  
Miao Chen ◽  
Lijun Zhang

In this paper, a parametric three-dimensional (3D) phase-field study of the physical vapor deposition process of metal thin films was performed aiming at quantitative simulations. The effect of deposition rate and model parameters on the microstructure of deposited thin films was investigated based on more than 200 sets of 3D phase-field simulations, and a quantitative relationship between the deposition rate and model parameters was established. After that, the heat maps corresponding to the experimental atomic force microscopy images were plotted for characterization of the surface roughness. Different roughness parameters including the arithmetic average roughness (Ra), root mean square roughness (Rq), skewness (Rsk), and kurtosis (Rku), as well as the ratio of Rq to Ra were calculated and carefully analyzed. A quantitative relationship between the surface roughness and the deposition rate and model parameters was obtained. Moreover, the calculated Rq to Ra ratios for the thin films at the deposition rates of 0.22 and 1.0 nm s−1 agreed very well with the experimental data of the deposited Mo and Ti thin films. Finally, further discussion about the correlative behaviors between the surface roughness and the density was proposed for reasoning the shadowing effect as well as the formation of voids during the thin film production.


Nanomaterials ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 1631
Author(s):  
Qiang Zhang ◽  
Yohanes Pramudya ◽  
Wolfgang Wenzel ◽  
Christof Wöll

Metal organic frameworks have emerged as an important new class of materials with many applications, such as sensing, gas separation, drug delivery. In many cases, their performance is limited by structural defects, including vacancies and domain boundaries. In the case of MOF thin films, surface roughness can also have a pronounced influence on MOF-based device properties. Presently, there is little systematic knowledge about optimal growth conditions with regard to optimal morphologies for specific applications. In this work, we simulate the layer-by-layer (LbL) growth of the HKUST-1 MOF as a function of temperature and reactant concentration using a coarse-grained model that permits detailed insights into the growth mechanism. This model helps to understand the morphological features of HKUST-1 grown under different conditions and can be used to predict and optimize the temperature for the purpose of controlling the crystal quality and yield. It was found that reactant concentration affects the mass deposition rate, while its effect on the crystallinity of the generated HKUST-1 film is less pronounced. In addition, the effect of temperature on the surface roughness of the film can be divided into three regimes. Temperatures in the range from 10 to 129 °C allow better control of surface roughness and film thickness, while film growth in the range of 129 to 182 °C is characterized by a lower mass deposition rate per cycle and rougher surfaces. Finally, for T larger than 182 °C, the film grows slower, but in a smooth fashion. Furthermore, the potential effect of temperature on the crystallinity of LbL-grown HKUST-1 was quantified. To obtain high crystallinity, the operating temperature should preferably not exceed 57 °C, with an optimum around 28 °C, which agrees with experimental observations.


Author(s):  
J. Damisa ◽  
J. O. Emegha ◽  
I. L. Ikhioya

Lead tin sulphide (Pb-Sn-S) thin films (TFs) were deposited on fluorine-doped tin oxide (FTO) substrates via the electrochemical deposition process using lead (II) nitrate [Pb(NO3)2], tin (II) chloride dehydrate [SnCl2.2H2O] and thiacetamide [C2H5NS] precursors as sources of lead (Pb), tin (Sn) and sulphur (S). The solution of all the compounds was harmonized with a stirrer (magnetic) at 300k. In this study, we reported on the improvements in the properties (structural and optical) of Pb-Sn-S TFs by varying the deposition time. We observed from X-ray diffractometer (XRD) that the prepared material is polycrystalline in nature. UV-Vis measurements were done for the optical characterizations and the band gap values were seen to be increasing from 1.52 to 1.54 eV with deposition time. In addition to this, the absorption coefficient and refractive index were also estimated and discussed.


2021 ◽  
Author(s):  
Muhammad Aamir Shafi ◽  
Amal Bouich ◽  
Laiq Khan ◽  
Hanif Ullah ◽  
Julia Mari Guaita ◽  
...  

Abstract Electrochemical deposition was used to create a quaternary CZTS (Cu2ZnSnS4) kesterite thin layer. An aqueous solution of CZTS was used to deposit a thin layer over Indium Tin Oxide. The effects of deposition time (variation) on CZTS thin films under ambient conditions were investigated in this study. Several available characterization systems were used to study the samples as they were produced. The polycrystalline description of the layer is inveterate by X-ray diffraction (XRD). The SEM as well as AFM study show that deposition time improved surface morphology and topography of CZTS thin films which increase several nm in grain size. Furthermore, depending upon the deposition duration, the optical study reveals an acceptable bandgap in a range of 1.44 to 1.71 eV. Characteristics of high-quality CZTS absorber layers for solar cell applications are discovered to be affected by deposition time variation. To check the effect of this bandgap variation (1.44 to 1.71 eV) on the performance of a CZTS based thin film solar cell, a simulation software SCAPS-1D is being used.


1997 ◽  
Vol 12 (5) ◽  
pp. 1179-1182 ◽  
Author(s):  
Lirong Zheng ◽  
Xuhong Hu ◽  
Pingxiong Yang ◽  
W-ping Xu ◽  
Chenglu Lin

Ferroelectric thin films of Pb(Zr, Ti)O3 (PZT) were fabricated on platinum-coated silicon using the process of direct-current glow discharge assisted laser deposition, where the substrate was electrically grounded. The films deposited at 730 °C with +800 V discharge voltage are oriented mostly with the c-axis perpendicular to the substrate surface, and exhibit good ferroelectric hysteresis loops. A possible mechanism for the improvement of the deposition process has been proposed.


Author(s):  
U. Admon ◽  
M.P Dariel ◽  
E. Grünbaum ◽  
G. Kimmel

Thin films of Co-W, 300-500Å thick, electrodeposited unto polycrystalline copper substrates (the details of the deposition process are given in ref. 1), consist of a background of small grains of size of the order of the film thickness, in which 10-20 times larger grains are dispersed. These large grains display a predominant [0001]hcp or [001] or [lll]fcc texture. The large grains are mostly faulted, the faults appearing as parallel stripes running across their whole width (Fig. 1). These stripes have been identified by SAD and DF as being alternating hep and fee platelets. The diffraction pattern (Fig. 2), taken from grain A in Fig.1, indicates a (0001)h||(001)c||substrate surface, with [1010]h||[110]c orientation relationship between the hep and fee platelets (relationship I). The streaking and the appearance of the {200} cubic spots as cross shaped satellites is attributed to the presence of stacking faults on the {111} planes.


1970 ◽  
Vol 25 ◽  
pp. 2-8 ◽  
Author(s):  
K Anuar ◽  
W. T. Tan ◽  
N. Saravanan ◽  
L. K. Khor ◽  
S. M. Ho

The chemical bath deposition technique was used to deposit thin films of coppersulphide onto indium tin oxide glass substrates. The bath composition included copperchloride which was the source of Cu2+ and sodium thiosulfate which supplied the S2- ions. Xraydiffraction and atomic force microscopy were used to investigate structural andmorphological characterization, respectively. The influence of deposition time was studiedto determine the optimum condition for deposition process. The deposited CuS films showedhexagonal structure. The number of peaks attributable to CuS increased as the depositiontime was increased to 16 hours based on XRD data. AFM images revealed that the chemicalbath-deposited films for 16 hours showed more homogeneous and uniform compared withother deposition times, and the highest absorbance value was obtained for the filmsdeposited at this period. The band gap energy decreased from 2.9 to 2.45 eV when thedeposition time was increased from 8 to 20 hours.Keywords: Chemical bath deposition, copper sulphide, thin films, solar cells.DOI: 10.3126/jncs.v25i0.3276Journal of Nepal Chemical Society Volume 25, 2010 pp 2-8


2015 ◽  
Vol 233-234 ◽  
pp. 648-652
Author(s):  
David Richardson ◽  
Fernando M.F. Rhen

We have investigated the magnetic properties of nanostructured Co-B alloys, that were prepared via electroless deposition. The deposition process results in the formation of a nanostructure consisting of nanotubes connected to thin films at both ends. Depending on the deposition time end-open or end-closed nanotubes can be formed. The overall nanostructure of Co-B deposit has a specific magnetization of 65.6 ± 8 JT-1Kg-1 (0.75 ± 0.09 μB per Co atom). We also investigated the anisotropy of the nanostructure by carrying out magnetic measurements with and without the top and base films. We only observed magnetic anisotropy in nanostructures with thin films, which had minimum coercivities of 557 A/m (7 Oe) and 4536 A/m (57 Oe) measured parallel and perpendicular to the nanotube axis. The nanotubes do not show any significant anisotropy with coercivities of 8753 A/m (110 Oe) and 7161 A/m (90 Oe) parallel and perpendicular to the nanotube axis.


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