Fracture Properties of Glass Filled Polyphenylene Oxide Composites

1968 ◽  
Vol 2 (3) ◽  
pp. 266-283 ◽  
Author(s):  
A. Wambach ◽  
K. Trachte ◽  
A. Dibenedetto
1997 ◽  
Vol 473 ◽  
Author(s):  
David R. Clarke

ABSTRACTAs in other engineered structures, fracture occasionally occurs in integrated microelectronic circuits. Fracture can take a number of forms including voiding of metallic interconnect lines, decohesion of interfaces, and stress-induced microcracking of thin films. The characteristic feature that distinguishes such fracture phenomena from similar behaviors in other engineered structures is the length scales involved, typically micron and sub-micron. This length scale necessitates new techniques for measuring mechanical and fracture properties. In this work, we describe non-contact optical techniques for probing strains and a microscopic “decohesion” test for measuring interface fracture resistance in integrated circuits.


2014 ◽  
Vol 1 (4) ◽  
pp. 16-19
Author(s):  
Vivek Talwar ◽  
◽  
Ravi Chand Singh ◽  

2002 ◽  
Vol 17 (1) ◽  
pp. 45-49 ◽  
Author(s):  
Gongde Zhang ◽  
Eero Hiltunen ◽  
Jaakko E. Laine ◽  
Hannu Paulapuro ◽  
Heikki Kettunen ◽  
...  
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