Control of the Preferred Orientation of Polycrystalline Mo and Cu(InGa)Se2 Thin Films by Inserting Graphene Layers

2017 ◽  
Vol 10 (4) ◽  
pp. 570-574
Author(s):  
Heesan Ryu ◽  
Do Hyun Park ◽  
Younghun Jung ◽  
Jihyun Kim ◽  
Woo Kyoung Kim
Keyword(s):  
Thin Films ◽  
Preferred Orientation ◽  
Graphene Layers

Phase transformation and preferred orientation in carboxylate derived ZrO2 thin films on silicon substates

1992 ◽  
Vol 7 (11) ◽  
pp. 3065-3071 ◽  
Author(s):  
Peir-Yung Chu ◽  
Isabelle Campion ◽  
Relva C. Buchanan
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Phase Transformation ◽  
Heating Rate ◽  
Tetragonal Phase ◽  
Monoclinic Phase ◽  
Preferred Orientation ◽  
Si Substrate ◽  
Interfacial Diffusion ◽  
Deposited Films

Phase transformation and preferred orientation in ZrO2 thin films, deposited on Si(111) and Si(100) substrates, and prepared by heat treatment from carboxylate solution precursors were investigated. The deposited films were amorphous below 450 °C, transforming gradually to the tetragonal and monoclinic phases on heating. The monoclinic phase developed from the tetragonal phase displacively, and exhibited a strong (111) preferred orientation at temperature as low as 550 °C. The degree of preferred orientation and the tetragonal-to-monoclinic phase transformation were controlled by heating rate, soak temperature, and time. Interfacial diffusion into the film from the Si substrate was negligible at 700 °C and became significant only at 900 °C, but for films thicker than 0.5 μm, overall preferred orientation exceeded 90%.

Study on preferred orientation and high-frequency permeability of magnetic-field-induced NiZnCu ferrite thin films

2020 ◽  
Vol 31 (15) ◽  
pp. 12101-12108
Author(s):  
Hai Liu ◽  
Zhong Yu ◽  
Chuanjian Wu ◽  
Xiaona Jiang ◽  
Rongdi Guo ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Thin Films ◽  
High Frequency ◽  
Preferred Orientation ◽  
Ferrite Thin Films

Quantitative basis for the rocking-curve measurement of preferred orientation in polycrystalline thin films

2003 ◽  
Vol 36 (3) ◽  
pp. 890-897 ◽  
Author(s):  
H. Toraya ◽  
H. Hibino ◽  
T. Ida ◽  
N. Kuwano
Keyword(s):  
Thin Films ◽  
Density Distribution ◽  
Volume Fraction ◽  
Preferred Orientation ◽  
Crystal Plane ◽  
X Rays ◽  
Rocking Curve ◽  
Polycrystalline Thin Films ◽  
Least Squares Fit ◽  
Quantitative Basis

A quantitative basis for the rocking-curve measurement of the preferred orientation in polycrystalline thin films is presented. Gaussian functions are used for modeling the density distribution of the normals to the crystal plane around the normal to the specimen surface. An intensity formula for the rocking curve is derived from the kinematical theory applied to the case of asymmetric Bragg reflection. The density distribution is determined by the least-squares fit of a theoretical rocking curve to the observed curve, and a volume fraction of crystallites, whose normals to the crystal plane are present within a defined angular range, can be obtained from it. AlN and Au polycrystalline thin films were used for testing the present procedure. Parameter values of the model function, refined using both synchrotron radiation and laboratory X-rays, agree well with each other within the experimental errors although these intensity data sets were collected under different experimental conditions in instrumentation and wavelength. A distribution of depth-dependent preferred orientation in the AlN thin film was revealed by using double-layer and multiple-layer models. A very small degree of preferred orientation in Au thin films could also be measured. Parallel-beam optics and integrated intensities instead of peak height intensities are important for reliable rocking curve measurement.

Growth of graphene layers for thin films

2011 ◽  
pp. 211-227
Author(s):  
B.H. Hong ◽  
H.R. Jeon
Keyword(s):  
Thin Films ◽  
Graphene Layers
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