scholarly journals Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage

2015 ◽  
Vol 2015 ◽  
pp. 1-9
Author(s):  
Hongzhi Hu ◽  
Shulin Tian ◽  
Qing Guo
Keyword(s):  
Analog Circuits ◽  
Output Voltage ◽  
Complex Space ◽  
Dft Method ◽  
Fault Model ◽  
Test Point ◽  
Fault Isolation ◽  
Point Selection ◽  
Test Point Selection ◽  
Supply Current

This paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits. Furthermore, in order to reduce the difficulty of fault location, an improved fault model in three-dimensional (3D) complex space is proposed, which achieves a far better fault detection ratio (FDR) against measurement error and parametric tolerance. To address the problem of fault masking in both 2D and 3D fault models, this paper proposes an effective design for testability (DFT) method. By adding redundant bypassing-components in the circuit under test (CUT), this method achieves excellent fault isolation ratio (FIR) in ambiguity group isolation. The efficacy of the proposed model and testing method is validated through experimental results provided in this paper.

scholarly journals Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient

2018 ◽  
Vol 2018 ◽  
pp. 1-11 ◽  
Author(s):  
Qingfeng Ma ◽  
Yuzhu He ◽  
Fuqiang Zhou ◽  
Ping Song
Keyword(s):  
Analog Circuit ◽  
Selection Method ◽  
Test Point ◽  
Similarity Coefficient ◽  
Fault Isolation ◽  
Point Selection ◽  
Testability Analysis ◽  
Test Point Selection ◽  
Point Set ◽  
Circuit Fault Diagnosis

The demand for testability analysis has increased with the integration densities and complexity of circuits. As an important part of testability analysis, the test point selection method needs to be researched in depth. A new similarity coefficient criterion is proposed to determine the fault isolation degree because output responses of a circuit with component tolerance are approximately subject to the normal distribution. Then, a new test point selection method is proposed based on the fault-pair similarity coefficient criterion information table. Simulation experiments are used to validate the accuracy of the proposed method in terms of the optimum test point set and fault isolation degree. The results show that the proposed method improves the performance of test point selection by comparing with the other reported methods.

The Analysis of the Transmission Signal Measured MIPI D-PHY

2014 ◽  
Vol 986-987 ◽  
pp. 2078-2081
Author(s):  
Wei Wei ◽  
Fei Teng Zhang
Keyword(s):  
High Speed ◽  
Physical Layer ◽  
Test Point ◽  
Point Selection ◽  
Test Analysis ◽  
Serial Interface ◽  
Test Items ◽  
Test Point Selection ◽  
Mobile Industry ◽  
Speed Mode

Analysis the characteristics of the measured transmission signal of Mobile Industry Processor Interface (MIPI) Display Serial Interface Physical Layer (D-PHY) interface based on a project platform. Firstly, introduces the transmission characteristics and mutual conversion process of physical layer about high-speed and low power mode, and by the transmission signal measured a platform of high-speed mode, present the D-PHY transmission signal each test items and test point selection, make the phone run smoothly and screen display normally, this test analysis certain practicability and expansibility.

scholarly journals Research on optimizing the fault diagnosis strategy of complex electronic equipment

2010 ◽  
Vol 7 (1) ◽  
pp. 223-230
Author(s):  
Hong-Xia Wang ◽  
Xiao-Hui Ye ◽  
Liang Wang
Keyword(s):  
Test Point ◽  
Electronic Equipment ◽  
Fault Detection And Isolation ◽  
Point Selection ◽  
Optimal Test ◽  
Test Information ◽  
Testing Sequence ◽  
Test Point Selection ◽  
Global Optimal ◽  
Test Points

Diagnosis strategy is a testing sequence of the fault detection and isolation. For the distribution of the electronic equipment, a feasible engineering maintenance method is put forward based on the questions of test point selection and diagnosis strategy. The concepts of local diagnosis strategy and global diagnosis strategy are introduced. From which the local optimal diagnosis strategy is determined when the local optimal test points have been introduced by using the test information entropy, furthermore, the global optimal diagnosis strategy is determined by coalescing the local optimal diagnosis strategies. At last, the validity of the method is illustrated by an example from which the conclusion can be drawn that it is an optimal diagnosis strategy and the complexity of computation can be reduced.

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