scholarly journals Research on optimizing the fault diagnosis strategy of complex electronic equipment

2010 ◽  
Vol 7 (1) ◽  
pp. 223-230
Author(s):  
Hong-Xia Wang ◽  
Xiao-Hui Ye ◽  
Liang Wang
Keyword(s):  
Test Point ◽  
Electronic Equipment ◽  
Fault Detection And Isolation ◽  
Point Selection ◽  
Optimal Test ◽  
Test Information ◽  
Testing Sequence ◽  
Test Point Selection ◽  
Global Optimal ◽  
Test Points

Diagnosis strategy is a testing sequence of the fault detection and isolation. For the distribution of the electronic equipment, a feasible engineering maintenance method is put forward based on the questions of test point selection and diagnosis strategy. The concepts of local diagnosis strategy and global diagnosis strategy are introduced. From which the local optimal diagnosis strategy is determined when the local optimal test points have been introduced by using the test information entropy, furthermore, the global optimal diagnosis strategy is determined by coalescing the local optimal diagnosis strategies. At last, the validity of the method is illustrated by an example from which the conclusion can be drawn that it is an optimal diagnosis strategy and the complexity of computation can be reduced.

scholarly journals Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

2014 ◽  
Vol 2014 ◽  
pp. 1-16 ◽  
Author(s):  
Yuan Gao ◽  
Chenglin Yang ◽  
Shulin Tian ◽  
Fang Chen
Keyword(s):  
Analog Circuit ◽  
Selection Process ◽  
Test Point ◽  
Point Selection ◽  
Optimal Test ◽  
Graph Node ◽  
Test Point Selection ◽  
Test Points ◽  
Circuit Fault Diagnosis ◽  
Dependence Relationship

By simplifying tolerance problem and treating faulty voltages on different test points as independent variables, integer-coded table technique is proposed to simplify the test point selection process. Usually, simplifying tolerance problem may induce a wrong solution while the independence assumption will result in over conservative result. To address these problems, the tolerance problem is thoroughly considered in this paper, and dependency relationship between different test points is considered at the same time. A heuristic graph search method is proposed to facilitate the test point selection process. First, the information theoretic concept of entropy is used to evaluate the optimality of test point. The entropy is calculated by using the ambiguous sets and faulty voltage distribution, determined by component tolerance. Second, the selected optimal test point is used to expand current graph node by using dependence relationship between the test point and graph node. Simulated results indicate that the proposed method more accurately finds the optimal set of test points than other methods; therefore, it is a good solution to minimize the size of the test point set. To simplify and clarify the proposed method, only catastrophic and some specific parametric faults are discussed in this paper.

Optimal Selection Method of Test Points on Circuit Board Level

2014 ◽  
Vol 1006-1007 ◽  
pp. 1125-1128
Author(s):  
Xiu Sheng Duan ◽  
Sheng Jun Li ◽  
Jing Xiao ◽  
Jie Wang
Keyword(s):  
Fault Diagnosis ◽  
Feature Selection Method ◽  
Selection Method ◽  
Test Point ◽  
Circuit Board ◽  
Optimal Selection ◽  
Point Selection ◽  
Test Point Selection ◽  
Test Points ◽  
Board Level

Test point selection is the basic problem of fault diagnosis systems. It is also one of the key links in designing the condition monitoring system. Aiming at the optimizing the test points on circuit board level, an optimal selection method is proposed. It is the method which combines the SVM algorithm and the feature selection method. The principle and process of the method are discussed in detail and in the fault diagnosis experiment of a circuit board, the effectiveness is verified finally.

The Analysis of the Transmission Signal Measured MIPI D-PHY

2014 ◽  
Vol 986-987 ◽  
pp. 2078-2081
Author(s):  
Wei Wei ◽  
Fei Teng Zhang
Keyword(s):  
High Speed ◽  
Physical Layer ◽  
Test Point ◽  
Point Selection ◽  
Test Analysis ◽  
Serial Interface ◽  
Test Items ◽  
Test Point Selection ◽  
Mobile Industry ◽  
Speed Mode

Analysis the characteristics of the measured transmission signal of Mobile Industry Processor Interface (MIPI) Display Serial Interface Physical Layer (D-PHY) interface based on a project platform. Firstly, introduces the transmission characteristics and mutual conversion process of physical layer about high-speed and low power mode, and by the transmission signal measured a platform of high-speed mode, present the D-PHY transmission signal each test items and test point selection, make the phone run smoothly and screen display normally, this test analysis certain practicability and expansibility.

Test Point Optimization in a Branching-Process-Based Reliability Model

1994 ◽  
Vol 8 (4) ◽  
pp. 591-609
Author(s):  
Gabriele Danninger ◽  
Walter J. Gutjahr
Keyword(s):  
Software Reliability ◽  
Branching Process ◽  
Test Point ◽  
Objective Functions ◽  
Optimal Test ◽  
Practical Applications ◽  
Binary Splitting ◽  
Input Domain ◽  
Test Points ◽  
Splitting Process

We describe a model for a random failure set in a fixed interval of the real line. (Failure sets are considered in input-domain-based theories of software reliability.) The model is based on an extended binary splitting process. Within the described model, we investigate the problem of how to select k test points such that the probability of finding at least one point of the failure set is maximized. It turns out that for values k > 2, the objective functions to be maximized are closely related to solutions of the Poisson-Euler-Darboux partial differential equation. Optimal test points are determined for arbitrary k in an asymptotic case where the failure set is, in a certain sense, “small” and “intricate,” which is the relevant case for practical applications.

Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses

2011 ◽  
Vol 18 (1) ◽  
pp. 115-128 ◽  
Author(s):  
Andrzej Pułka
Keyword(s):  
Expert System ◽  
Analog Circuit ◽  
Heuristic Algorithms ◽  
Test Point ◽  
Optimization Techniques ◽  
Point Selection ◽  
Test Point Selection ◽  
Knowledge Base Construction ◽  
New Algorithms ◽  
Analog Circuit Diagnosis

Two Heuristic Algorithms for Test Point Selection in Analog Circuit Diagnoses The paper presents a heuristic approach to the problem of analog circuit diagnosis. Different optimization techniques in the field of test point selection are discussed. Two new algorithms: SALTO and COSMO have been introduced. Both searching procedures have been implemented in a form of the expert system in PROLOG language. The proposed methodologies have been exemplified on benchmark circuits. The obtained results have been compared to the others achieved by different approaches in the field and the benefits of the proposed methodology have been emphasized. The inference engine of the heuristic algorithms has been presented and the expert system knowledge-base construction discussed.

Sign in / Sign up

Export Citation Format

Share Document