scholarly journals XPS Depth Study on the Liquid Oxidation of Sn-Bi-Zn-X(Al/P) Alloy and the Effect of Al/P on the Film

2015 ◽  
Vol 2015 ◽  
pp. 1-10
Author(s):  
X. J. Wang ◽  
N. Liu ◽  
S. Shi ◽  
Y. X. Chen
Keyword(s):  
Free Surface ◽  
Quantitative Analysis ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Surface Enrichment ◽  
Liquid Solder ◽  
High Concentration ◽  
X Ray ◽  
Depth Study ◽  
P Addition

X-ray photoelectron spectroscopy (XPS) was used to study the properties of liquid oxidation of Sn-Bi-Zn (SBZ) solder alloys and the effect of Al/P on the oxide film. The results showed that the oxidation film on SBZ surface was in high concentration of both oxygen and zinc. Adding trace amount of Al/P to SBZ alloys (SBZA/ABZP) decreased the ratio of O/M (M could be Sn, Bi, and Al/P) and changed the film compositions. Layers near the free surface of oxidation film mostly contained Zn2+and Al3+oxides for SBZA. From the half quantitative analysis result, the aluminum had a surface enrichment behavior in liquid solder, so did phosphorus and zinc. Therefore, the Al/P addition changed their stoichiometry such as the ratio of O/M near film surface.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

Quantitative analysis of saccharides by X-ray photoelectron spectroscopy

2009 ◽  
Vol 41 (6) ◽  
pp. 453-462 ◽  
Author(s):  
Joanna S. Stevens ◽  
Sven L. M. Schroeder
Keyword(s):  
Quantitative Analysis ◽  
Photoelectron Spectroscopy ◽  
X Ray

The piezoresistive properties research of SiC thin films prepared by RF magnetron sputtering

2019 ◽  
Vol 33 (15) ◽  
pp. 1950152 ◽  
Author(s):  
Jing Wu ◽  
Xiaofeng Zhao ◽  
Chunpeng Ai ◽  
Zhipeng Yu ◽  
Dianzhong Wen
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Cantilever Beam ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Rf Magnetron Sputtering ◽  
Micro Electro Mechanical System ◽  
Gauge Factor ◽  
X Ray ◽  
Sputtering Power

To research the piezoresistive properties of SiC thin films, a testing structure consisting of a cantilever beam, SiC thin films piezoresistors and a Cr/Pt electrode is proposed in this paper. The chips of testing structure were fabricated by micro-electro-mechanical system (MEMS) technology on a silicon wafer with [Formula: see text]100[Formula: see text] orientation, in which SiC thin films were deposited by using radio-frequency (13.56 MHz) magnetron sputtering method. The effect of sputtering power, annealing temperature and time on the microstructure and morphology of the SiC thin films were investigated by the X-ray diffraction (XRD) and scanning electron microscopy (SEM). It indicates that a good continuity and uniform particles on the SiC thin film surface can be achieved at sputtering power of 160 W after annealing. To verify the existence of Si–C bonds in the thin films, X-ray photoelectron spectroscopy (XPS) was used. Meanwhile, the piezoresistive properties of SiC thin films piezoresistors were measured using the proposed cantilever beam. The test result shows that it is possible to achieve a gauge factor of 35.1.

Vacuum tribological properties of a composite Mo–MoS2film after atomic oxygen exposure irradiation

2019 ◽  
Vol 233 (8) ◽  
pp. 1236-1244
Author(s):  
Guo-zheng Ma ◽  
Peng-fei He ◽  
Yi-wen Wang ◽  
Shu-ying Chen ◽  
Ming Liu ◽  
...  
Keyword(s):  
Tribological Properties ◽  
Photoelectron Spectroscopy ◽  
Atomic Oxygen ◽  
Sliding Friction ◽  
Film Surface ◽  
Superficial Layer ◽  
Solid Lubrication ◽  
X Ray ◽  
Nanomechanical Properties ◽  
Lubrication Film

A composite Mo–MoS2solid-lubrication film measuring approximately 2-µm thick was prepared using a two-step composite process involving magnetron sputtering of Mo film followed by low-temperature ion sulfurization. Microstructure of the said film was characterized using scanning electron microscopy, energy dispersive spectroscopy, X-ray diffraction, Auger electron spectroscopy, and X-ray photoelectron spectroscopy, and nanomechanical properties of the Mo and Mo–MoS2film were tested using a nanoindenter. The Mo–MoS2film and GCr15 substrate were irradiated by atomic oxygen with the self-developed MSTS-1 space tribometer system equipped with an atomic oxygen beam at a flux of 9 × 1019atoms/cm2. Subsequently, vacuum tribological properties of the said substrate and film were examined and compared. Results demonstrated that the Mo film possessed a smooth and dense structure with stable nanomechanical properties. Part of the elemental Mo translated into MoS2post sulfurizing, thereby forming the Mo–MoS2composite film with an alternating soft and hard structure. The Mo–MoS2film demonstrated a low and stable friction coefficient of approximately 0.15 along with only a slight wear in vacuum. The film surface could be oxidized and eroded when exposed to the highly active and energetic atomic oxygen. Post atomic oxygen erosion, the film thickness demonstrated a decrease, and small amounts of MoO3were observed on the surface. However, all structural and property changes were limited to the superficial layer. The excellent tribological performance of the film could be restored when the surface layer was removed after a certain period of sliding friction.

scholarly journals Application of X-Ray Photoelectron Spectroscopy to Quantitative Analysis of PZT Composition

1993 ◽  
Vol 101 (1171) ◽  
pp. 359-364
Author(s):  
Osamu SUGIYAMA ◽  
Kazuaki KATO ◽  
Teruyuki MIURA
Keyword(s):  
Quantitative Analysis ◽  
Photoelectron Spectroscopy ◽  
X Ray

A Novel Synthesis of CaWO4:Eu3+ Flower Like Microcrystals in Ethanol/Water Mixed System and Characterization

2012 ◽  
Vol 531-532 ◽  
pp. 512-518 ◽  
Author(s):  
Ye Qing Chen ◽  
Joo Hyun Lee ◽  
Sung Wook Park ◽  
Byung Kee Moon ◽  
Byung Chun Choi ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Hydrothermal Process ◽  
Volume Ratio ◽  
Mixed System ◽  
Mixed Solution ◽  
Photoluminescence Properties ◽  
X Ray Diffraction ◽  
High Concentration ◽  
X Ray ◽  
Xrd Patterns

In this paper, we report a successful synthesis of CaWO4:Eu3+ phosphor via an ethanol assisted hydrothermal process. X-ray diffraction (XRD) patterns, X-ray photoelectron spectroscopy (XPS) and field emission scanning electron microscope (FE-SEM) were used to investigate the growth of the products. The water and ethanol volume ratio is found to have extraordinary effect on the particle size and morphological appearance. Flower like ~ 1µm superstructures can be obtained with mixed solution of w/e of 50/50 at 120 °C hydrothermal sysnthesis for 12 h. High concentration of ethanol in aqueous solution was discovered to have a tendency in limiting the interaction between the small particles for crystallization. Temperature and time experiments were also performed to further investigate the growth mechanism of the ethanol assisted hydrothermal process. The photoluminescence properties of flower like CaWO4:Eu3+ has also been investigated.

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