Application of X-ray photoelectron spectroscopy to quantitative analysis without standards

Kichinosuke Hirokawa; Masaoki Oku

doi:10.1007/bf00453564

Application of X-ray photoelectron spectroscopy to quantitative analysis without standards

Fresenius Zeitschrift für Analytische Chemie ◽

10.1007/bf00453564 ◽

1977 ◽

Vol 285 (3-4) ◽

pp. 192-198 ◽

Cited By ~ 25

Author(s):

Kichinosuke Hirokawa ◽

Masaoki Oku

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray

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Quantitative analysis of saccharides by X-ray photoelectron spectroscopy

Surface and Interface Analysis ◽

10.1002/sia.3047 ◽

2009 ◽

Vol 41 (6) ◽

pp. 453-462 ◽

Cited By ~ 50

Author(s):

Joanna S. Stevens ◽

Sven L. M. Schroeder

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray

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On the Quantitative Analysis of O0, O− and O2− Ions in Binary Silicate by X-Ray Photoelectron Spectroscopy

Journal of the Japan Institute of Metals and Materials ◽

10.2320/jinstmet1952.45.8_790 ◽

1981 ◽

Vol 45 (8) ◽

pp. 790-796 ◽

Cited By ~ 9

Author(s):

Toyoshige Sasaki ◽

Masanori Kawaguchi ◽

Masahiro Yamane ◽

Yukio Suginohara

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Binary Silicate

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Quantitative Analysis of Adsorbed Proteins by X-ray Photoelectron Spectroscopy

Analytical Chemistry ◽

10.1021/ac202110x ◽

2011 ◽

Vol 83 (22) ◽

pp. 8659-8666 ◽

Cited By ~ 73

Author(s):

Santanu Ray ◽

Alexander G. Shard

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Adsorbed Proteins

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Application of X-Ray Photoelectron Spectroscopy to Quantitative Analysis of PZT Composition

Journal of the Ceramic Society of Japan ◽

10.2109/jcersj.101.359 ◽

1993 ◽

Vol 101 (1171) ◽

pp. 359-364

Author(s):

Osamu SUGIYAMA ◽

Kazuaki KATO ◽

Teruyuki MIURA

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

X Ray

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Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part II: Systematic uncertainties and absolute quantification

Surface and Interface Analysis ◽

10.1002/sia.6289 ◽

2017 ◽

Vol 49 (12) ◽

pp. 1214-1224 ◽

Cited By ~ 8

Author(s):

Nadir S. Faradzhev ◽

Shannon B. Hill ◽

Cedric J. Powell

Keyword(s):

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

Absolute Quantification ◽

Surface Contamination ◽

X Ray ◽

Systematic Uncertainties

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X-ray photoelectron spectroscopy of molybdenum compounds. Use of electron spectroscopy for chemical analysis (ESCA) in quantitative analysis

Analytical Chemistry ◽

10.1021/ac60307a020 ◽

1971 ◽

Vol 43 (13) ◽

pp. 1774-1779 ◽

Cited By ~ 136

Author(s):

William. Swartz ◽

David M. Hercules

Keyword(s):

Quantitative Analysis ◽

Chemical Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

X Ray

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Quantitative Analysis of a Lithium Ion Battery Cathode Material with X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Microscopy and Microanalysis ◽

10.1017/s1431927615007564 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1355-1356

Author(s):

M. Shima ◽

K. Tsutsumi ◽

A. Tanaka ◽

H. Onodera ◽

T. Tazawa

Keyword(s):

Quantitative Analysis ◽

Cathode Material ◽

Auger Electron Spectroscopy ◽

Lithium Ion Battery ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lithium Ion ◽

X Ray

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Combined X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion MS Surface Quantitative Analysis of Polymer Blends with Varying Mixing Thermodynamics

Analytical Chemistry ◽

10.1021/ac049573a ◽

2004 ◽

Vol 76 (17) ◽

pp. 5165-5171 ◽

Cited By ~ 13

Author(s):

Shiyong Liu ◽

Chi-Ming Chan ◽

Lu-Tao Weng ◽

Ming Jiang

Keyword(s):

Quantitative Analysis ◽

Polymer Blends ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

X Ray ◽

Secondary Ion

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XPS Depth Study on the Liquid Oxidation of Sn-Bi-Zn-X(Al/P) Alloy and the Effect of Al/P on the Film

Advances in Materials Science and Engineering ◽

10.1155/2015/257231 ◽

2015 ◽

Vol 2015 ◽

pp. 1-10

Author(s):

X. J. Wang ◽

N. Liu ◽

S. Shi ◽

Y. X. Chen

Keyword(s):

Free Surface ◽

Quantitative Analysis ◽

Photoelectron Spectroscopy ◽

Film Surface ◽

Surface Enrichment ◽

Liquid Solder ◽

High Concentration ◽

X Ray ◽

Depth Study ◽

P Addition

X-ray photoelectron spectroscopy (XPS) was used to study the properties of liquid oxidation of Sn-Bi-Zn (SBZ) solder alloys and the effect of Al/P on the oxide film. The results showed that the oxidation film on SBZ surface was in high concentration of both oxygen and zinc. Adding trace amount of Al/P to SBZ alloys (SBZA/ABZP) decreased the ratio of O/M (M could be Sn, Bi, and Al/P) and changed the film compositions. Layers near the free surface of oxidation film mostly contained Zn2+and Al3+oxides for SBZA. From the half quantitative analysis result, the aluminum had a surface enrichment behavior in liquid solder, so did phosphorus and zinc. Therefore, the Al/P addition changed their stoichiometry such as the ratio of O/M near film surface.

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