scholarly journals Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates

2011 ◽  
Vol 2011 ◽  
pp. 1-4 ◽  
Author(s):  
M. G. Faraj ◽  
K. Ibrahim
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Film Thickness ◽  
Polyethylene Terephthalate ◽  
Film Surface ◽  
Root Mean Square Roughness ◽  
Oxide Thin Films ◽  
Transmission Method ◽  
Force Microscopy ◽  
Diffraction Patterns

Zinc oxide thin films of different thicknesses ranging from 100 to 300 nm were prepared on polyethylene terephthalate substrates with thermal evaporation in a vacuum of approximately3×10-5Torr. X-ray diffraction patterns confirm the proper phase formation of the material. From atomic force microscopy (AFM) images, it was found that the root mean square roughness of the film surface increased as the film thickness increased. The optical properties of ZnO on PET substrates were determined through the optical transmission method using an ultraviolet-visible spectrophotometer. The optical band gap values of ZnO thin films slightly decreased as the film thickness increased.

Effect of film thickness on properties of aluminum doped zinc oxide thin films deposition on polymer substrate

2013 ◽  
Vol 24 (12) ◽  
pp. 5091-5096 ◽  
Author(s):  
Nihan Akin ◽  
S. Sebnem Cetin ◽  
Mehmet Cakmak ◽  
Tofig Memmedli ◽  
Suleyman Ozcelik
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Film Thickness ◽  
Polymer Substrate ◽  
Oxide Thin Films ◽  
Aluminum Doped Zinc Oxide

Optical Losses in Ferroelectric Oxide Thin Films: Is There Light at the End of the Tunnel?

1994 ◽  
Vol 361 ◽  
Author(s):  
D. K. Fork ◽  
F. Armani-Leplingard ◽  
J. J. Kingston
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Optical Loss ◽  
Film Surface ◽  
Film Structure ◽  
Surface Scattering ◽  
Morphological Development ◽  
Optical Losses ◽  
Force Microscopy ◽  
Device Applications

ABSTRACTOptical losses are a barrier to use of ferroelectric waveguide thin films. Losses of about 2 dB/cm will reduce the efficiency of a frequency doubler by over 50%. Achieving losses on this order in conjunction with other essential film properties is difficult. The optical loss has several origins, including absorption, mode leakage, internal scattering and surface scattering. When the film surface morphology is accurately known, it is possible to estimate the surface scattering component of the loss. We have employed atomic force microscopy and computer modeling to compute, and correlate the optical loss as a function of film thickness and wavelength. The results suggest upper limits to the morphological roughness for various device applications. For lithium niobate films on sapphire which are intended to frequency double into the blue part of the spectrum, the optimal film thickness is about 400 nm and the RMS roughness is constrained below about 1.0 nm, with some weak dependence on grain size. Although present growth techniques do not appear to achieve this level of surface flatness intrinsically, an understanding of the morphological development of the film structure may lead to improvements.

scholarly journals Effect of Source-Substrate Distance on Transparent Electrode Properties of the Spray-Cast Aluminium Doped Zinc Oxide Thin Films

2021 ◽  
Author(s):  
Sebin Devasia ◽  
P V Athma ◽  
Rakhy Raphael ◽  
Anumol Jose ◽  
Anila E I
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Nir Spectroscopy ◽  
Wide Band ◽  
Transparent Electrode ◽  
Oxide Thin Films ◽  
Wide Band Gap ◽  
Force Microscopy ◽  
Efficient Route ◽  
Hall Effect Measurements

Abstract The wide band gap zinc oxide is a potential metal oxide that has been widely used in optoelectronic applications. The zinc oxide thin films demonstrates excellent conductivity and transparency enabling them for transparent electrode applications. The aluminium doping is an efficient route in further improving the conductivity without compromising the transparency and scalable spray pyrolysis is an effective approach in realizing high quality thin films. Our current study focuses on the effects of distance between the substrate and spray nozzle on the structural, morphological, optical, and electrical properties of aluminium doped zinc oxide. Our results suggests that this spray parameter has appreciable impact on the thin film properties and can be optimized for tuning properties. We explain this in detail backed by the characterization of thin films by X-ray diffraction, Atomic Force Microscopy, UV-Vis-NIR spectroscopy, Photoluminescence and Hall effect measurements.

scholarly journals Physical Properties of ZnO Thin Films Codoped with Titanium and Hydrogen Prepared by RF Magnetron Sputtering with Different Substrate Temperatures

2015 ◽  
Vol 2015 ◽  
pp. 1-11 ◽  
Author(s):  
Fang-Hsing Wang ◽  
Jen-Chi Chao ◽  
Han-Wen Liu ◽  
Tsung-Kuei Kang
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Film Surface ◽  
Hexagonal Wurtzite Structure ◽  
Rf Magnetron Sputtering ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Transparent Conducting ◽  
Diffraction Patterns ◽  
Substrate Temperatures

Transparent conducting titanium-doped zinc oxide (TZO) thin films were prepared on glass substrates by RF magnetron sputtering using 1.5 wt% TiO2-doped ZnO as the target. Electrical, structural, and optical properties of films were investigated as a function of H2/(Ar + H2) flow ratios (RH) and substrate temperatures (TS). The optimalRHvalue for achieving high conducting TZO:H thin film decreased from 10% to 1% whenTSincreased from RT to 300°C. The lowest resistivity of9.2×10-4 Ω-cm was obtained asTS=100°C andRH=7.5%. X-ray diffraction patterns showed that all of TZO:H films had a hexagonal wurtzite structure with a preferred orientation in the (002) direction. Atomic force microscopy analysis revealed that the film surface roughness increased with increasingRH. The average visible transmittance decreased with increasingRHfor the RT-deposited film, while it had not considerably changed with differentRHfor the 300°C-deposited films. The optical bandgap increased asRHincreased, which is consistent with the Burstein-Moss effect. The figure of merits indicated thatTS=100°C andRH=7.5% were optimal conditions for TZO thin films as transparent conducting electrode applications.

Surface Evolution of Copolymer thin Films as Revealed by Atomic Force Microscopy

1991 ◽  
Vol 248 ◽  
Author(s):  
G. Coulon ◽  
B. Collin ◽  
D. Chatenay ◽  
D. Ausserre
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Free Surface ◽  
Film Thickness ◽  
Early Stage ◽  
Film Surface ◽  
Spatial Correlations ◽  
Surface Evolution ◽  
Force Microscopy ◽  
Atomic Force

AbstractAtomic Force Microscopy has been used to study the early stage evolution of the free surface of annealed symmetric poly(styrene-b-n-butylmethacrylate) diblock copolymer thin films. As the lamellar ordering propagates through the film thickness, Islands or holes are formed on the free surface. It Is shown that, depending on the Initial film thickness, I.e. on the fraction of the film surface occupied by the islands (or holes) In the ordered state, the existence or non-existence of spatial correlations characterizes the ordering kinetics of both islands and holes. However, the limit between these two regimes is not the same in the two cases : in the case of holes, spatial correlations occur for a higher value of the surface coverage than In the case of islands.

Preparation and Hemocompatibility of Neodymium Incorporated Zinc Oxide Thin Films

2011 ◽  
Vol 26 (9) ◽  
pp. 993-997
Author(s):  
Zhan-Yun HUANG ◽  
Ping LUO ◽  
Di-Hu CHEN
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Oxide Thin Films
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