Charge Trapping and Detrapping in nc-RuO Embedded ZrHfO High-k Thin Film for Nonvolatile Memory Applications

2012 ◽  
Vol 159 (3) ◽  
pp. H214-H219 ◽  
Author(s):  
Chen-Han Lin ◽  
Yue Kuo
Keyword(s):  
Thin Film ◽  
Nonvolatile Memory ◽  
Charge Trapping ◽  
High K ◽  
Memory Applications

scholarly journals LaTiON/LaON as band-engineered charge-trapping layer for nonvolatile memory applications

2012 ◽  
Vol 108 (1) ◽  
pp. 229-234 ◽  
Author(s):  
X. D. Huang ◽  
P. T. Lai ◽  
Johnny K. O. Sin
Keyword(s):  
Nonvolatile Memory ◽  
Charge Trapping ◽  
Memory Applications

Nb-Doped $\hbox{La}_{2}\hbox{O}_{3} $ as Charge-Trapping Layer for Nonvolatile Memory Applications

2015 ◽  
Vol 15 (1) ◽  
pp. 123-126 ◽  
Author(s):  
Runpu Shi ◽  
X. D. Huang ◽  
C. H. Leung ◽  
Johnny K. O. Sin ◽  
P. T. Lai
Keyword(s):  
Nonvolatile Memory ◽  
Charge Trapping ◽  
Memory Applications
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