Effect of Oxidation Enhanced Diffusion on Hot Carrier Injection Induced Degradation in N-Type High-Voltage DDDMOSFET
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2008 ◽
Vol 55
(5)
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pp. 1255-1258
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2008 ◽
Vol 48
(4)
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pp. 504-507
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2019 ◽
Vol 19
(10)
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pp. 6746-6749
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