Comparison of Silicon Surface Preparation Methods for Measurement of Minority Carrier Lifetime using the Microwave Photo-conductive Decay (μ-PCD) coupled with Continuous Corona Charge (Charge-PCD)
2013 ◽
Vol 652-654
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pp. 901-905
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2018 ◽
Vol 183
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pp. 205-210
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Keyword(s):
2002 ◽
Vol 17
(6)
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pp. 503-509
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Keyword(s):