Surface Structure of 1-Hexyl-3-methyl-imidazolium Bis(trifluoromethanesulfonyl)- imide Observed by High-resolution Rutherford Backscattering Spectroscopy

Atsushi Ohno; Kaoru Nakajima; Motofumi Suzuki; Kenji Kimura

doi:10.1149/1.3159308

Surface Structure of 1-Hexyl-3-methyl-imidazolium Bis(trifluoromethanesulfonyl)- imide Observed by High-resolution Rutherford Backscattering Spectroscopy

ECS Transactions ◽

10.1149/1.3159308 ◽

2019 ◽

Vol 16 (49) ◽

pp. 61-68 ◽

Cited By ~ 1

Author(s):

Atsushi Ohno ◽

Kaoru Nakajima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

High Resolution ◽

Surface Structure ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Surface structure of an ionic liquid with high-resolution Rutherford backscattering spectroscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2008.11.020 ◽

2009 ◽

Vol 267 (4) ◽

pp. 605-609 ◽

Cited By ~ 22

Author(s):

K. Nakajima ◽

A. Ohno ◽

M. Suzuki ◽

K. Kimura

Keyword(s):

Ionic Liquid ◽

High Resolution ◽

Surface Structure ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Observation of surface structure of 1-alkyl-3-methylimidazolium bis(trifluoromethanesulfonyl)imide using high-resolution Rutherford backscattering spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.3465578 ◽

2010 ◽

Vol 133 (4) ◽

pp. 044702 ◽

Cited By ~ 40

Author(s):

Kaoru Nakajima ◽

Atsushi Ohno ◽

Hiroki Hashimoto ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

High Resolution ◽

Surface Structure ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Observation of surface structure of 1-butyl-3-methylimidazolium hexafluorophosphate using high-resolution Rutherford backscattering spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.3141385 ◽

2009 ◽

Vol 130 (20) ◽

pp. 204705 ◽

Cited By ~ 22

Author(s):

Atsushi Ohno ◽

Hiroki Hashimoto ◽

Kaoru Nakajima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

High Resolution ◽

Surface Structure ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy

Nuclear Materials and Energy ◽

10.1016/j.nme.2018.10.004 ◽

2018 ◽

Vol 17 ◽

pp. 147-151 ◽

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M. Mayer ◽

T.F. Silva ◽

R. Arredondo ◽

M. Balden ◽

I. Bogdanović-Radović ◽

...

Keyword(s):

High Resolution ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Model Systems ◽

Surface Enrichment ◽

Resolution Time ◽

Tungsten Surface

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Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy

Surface Science ◽

10.1016/j.susc.2012.07.013 ◽

2012 ◽

Vol 606 (21-22) ◽

pp. 1693-1699 ◽

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Author(s):

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Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures

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High Resolution X-Ray Diffraction and Rutherford Backscattering Spectroscopy Studies on Laser Molecular Beam Epitaxy Grown GaN Layers on Sapphire (0001)

Advanced Science Letters ◽

10.1166/asl.2014.5540 ◽

2014 ◽

Vol 20 (7) ◽

pp. 1406-1409 ◽

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M. Senthil Kumar ◽

S. S. Kushvaha ◽

K. K. Maurya ◽

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Sunil Ojha

Keyword(s):

High Resolution ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Laser Molecular Beam Epitaxy ◽

Spectroscopy Studies

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Lattice Distortion at SiO2/Si(001) Interface Studied with High-Resolution Rutherford Backscattering Spectroscopy/Channeling

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2467 ◽

2006 ◽

Vol 45 (4A) ◽

pp. 2467-2469 ◽

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Motofumi Suzuki ◽

Kenji Kimura ◽

Masashi Yamamoto ◽

Akinobu Teramoto ◽

...

Keyword(s):

High Resolution ◽

Lattice Distortion ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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High-resolution Rutherford backscattering spectroscopy for Nano-CMOS applications

2006 International Workshop on Nano CMOS ◽

10.1109/iwnc.2006.4570980 ◽

2006 ◽

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Zhao Ming ◽

Kaoru Nakajima ◽

Motofumi Suzuki

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Improvement of Sensitivity in High-resolution Rutherford Backscattering Spectroscopy

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.355 ◽

2013 ◽

Vol 56 (9) ◽

pp. 355-359

Author(s):

Kaoru NAKAJIMA ◽

Hiroki HASHIMOTO ◽

Kenji KIMURA

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Surface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.4838376 ◽

2013 ◽

Vol 139 (22) ◽

pp. 224701 ◽

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Author(s):

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Motoki Miyashita ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Binary Mixtures ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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