Cathodoluminescence Assessment of Low Temperature Gettering in Silicon and a Novel Technique for Estimating Bulk Minority Carrier Lifetime in Silicon

Kieth Fraser; Robert Falster; Peter R. Wilshaw

doi:10.1149/1.2980311

Cathodoluminescence Assessment of Low Temperature Gettering in Silicon and a Novel Technique for Estimating Bulk Minority Carrier Lifetime in Silicon

ECS Transactions ◽

10.1149/1.2980311 ◽

2019 ◽

Vol 16 (6) ◽

pp. 273-281

Author(s):

Kieth Fraser ◽

Robert Falster ◽

Peter R. Wilshaw

Keyword(s):

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Novel Technique

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MINORITY CARRIER LIFETIME AND POTENTIAL BARRIER HEIGHT IN POLYCRYSTALLINE SILICON : EFFECTS OF LOW TEMPERATURE ANNEALINGS AND NEUTRON IRRADIATION

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1982114 ◽

1982 ◽

Vol 43 (C1) ◽

pp. C1-95-C1-101

Author(s):

D. Bielle-Daspet ◽

M. Roux ◽

J. Farah

Keyword(s):

Low Temperature ◽

Barrier Height ◽

Potential Barrier ◽

Neutron Irradiation ◽

Polycrystalline Silicon ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Potential Barrier Height

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Stoichiometry dependence of the optical and minority-carrier lifetime behaviors of CdTe epitaxial films: A low-temperature and time-resolved photoluminescence study

Applied Surface Science ◽

10.1016/j.apsusc.2016.06.142 ◽

2016 ◽

Vol 387 ◽

pp. 477-482 ◽

Cited By ~ 3

Author(s):

Kai Tang ◽

Xuanting Zhu ◽

Liangqing Zhu ◽

Wei Bai ◽

Jiawei Bai ◽

...

Keyword(s):

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Epitaxial Films ◽

Time Resolved ◽

Photoluminescence Study ◽

Time Resolved Photoluminescence

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Cathodoluminescence assessment of annealed silicon and a novel technique for estimating minority carrier lifetime in silicon

Materials Science and Engineering B ◽

10.1016/j.mseb.2008.05.006 ◽

2009 ◽

Vol 159-160 ◽

pp. 194-197 ◽

Cited By ~ 6

Author(s):

K.J. Fraser ◽

R.J. Falster ◽

P.R. Wilshaw

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Novel Technique

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Increasing minority carrier lifetime in as-grown multicrystalline silicon by low temperature internal gettering

Journal of Applied Physics ◽

10.1063/1.4954010 ◽

2016 ◽

Vol 119 (23) ◽

pp. 235704 ◽

Cited By ~ 18

Author(s):

M. Al-Amin ◽

J. D. Murphy

Keyword(s):

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Multicrystalline Silicon

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Effects of low-temperature annealing phosphorous gettering process on the electrical properties of multi-crystalline silicon with a low minority carrier lifetime

Acta Physica Sinica ◽

10.7498/aps.62.110101 ◽

2013 ◽

Vol 62 (11) ◽

pp. 110101

Author(s):

Jiang Li-Li ◽

Lu Zhong-Lin ◽

Zhang Feng-Ming ◽

Lu Xiong

Keyword(s):

Electrical Properties ◽

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Crystalline Silicon ◽

Minority Carrier Lifetime ◽

Low Temperature Annealing

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Achieving High Minority Carrier Lifetime through Low-Temperature a-Si:H Deposition and High-Temperature Anneal for Silicon Heterojunction Solar Cell Applications

ECS Transactions ◽

10.1149/06001.1267ecst ◽

2014 ◽

Vol 60 (1) ◽

pp. 1267-1272

Author(s):

X. Tian ◽

S. Gu ◽

W. Mao ◽

L. Zhang ◽

J. Zhang ◽

...

Keyword(s):

Solar Cell ◽

High Temperature ◽

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Heterojunction Solar Cell ◽

High Temperature Anneal ◽

Silicon Heterojunction Solar Cell

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Low-Temperature Saw Damage Gettering to Improve Minority Carrier Lifetime in Multicrystalline Silicon

physica status solidi (RRL) - Rapid Research Letters ◽

10.1002/pssr.201700268 ◽

2017 ◽

Vol 11 (10) ◽

pp. 1700268 ◽

Cited By ~ 2

Author(s):

M. Al-Amin ◽

N. E. Grant ◽

J. D. Murphy

Keyword(s):

Low Temperature ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Multicrystalline Silicon

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Cathodoluminescence Assessment of Annealed Silicon and a Novel Technique for Estimating Minority Carrier Lifetime in Silicon

ECS Meeting Abstracts ◽

10.1149/ma2008-02/26/1994 ◽

2008 ◽

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Novel Technique

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Microwave transmission method for measuring minority-carrier lifetime in silicon slices

Electronics Letters ◽

10.1049/el:19710516 ◽

1971 ◽

Vol 7 (25) ◽

pp. 754

Author(s):

R.E. Thomas ◽

V. Makios ◽

S. Ogletree ◽

R. Mckillican

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Transmission Method ◽

Microwave Transmission

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Marked enhancement of the photoresponsivity and minority-carrier lifetime of BaSi2 passivated with atomic hydrogen

Physical Review Materials ◽

10.1103/physrevmaterials.3.065403 ◽

2019 ◽

Vol 3 (6) ◽

Cited By ~ 9

Author(s):

Zhihao Xu ◽

Denis A. Shohonov ◽

Andrew B. Filonov ◽

Kazuhiro Gotoh ◽

Tianguo Deng ◽

...

Keyword(s):

Atomic Hydrogen ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Marked Enhancement

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