On the Relation Between Growth Instabilities and Internal Stress Evolution during Galvanostatic Ti Thin Film Anodization

2008 ◽  
Vol 155 (10) ◽  
pp. C506 ◽  
Author(s):  
J.-F. Vanhumbeeck ◽  
J. Proost
Keyword(s):  
Thin Film ◽  
Internal Stress ◽  
Stress Evolution

In-Situ Monitoring of the Internal Stress Evolution during Thin Film Anodising

2019 ◽  
Vol 11 (24) ◽  
pp. 35-42
Author(s):  
Joris Proost ◽  
Jean-François Vanhumbeeck ◽  
Quentin Van Overmeere
Keyword(s):  
Thin Film ◽  
Internal Stress ◽  
In Situ Monitoring ◽  
Stress Evolution

Spalling Technology of PZT Thin Film Capacitor using Internal Stress

2014 ◽  
Vol 134 (4) ◽  
pp. 85-89
Author(s):  
Kazutaka Sueshige ◽  
Fumiaki Honda ◽  
Tadatomo Suga ◽  
Masaaki Ichiki ◽  
Toshihiro Itoh
Keyword(s):  
Thin Film ◽  
Internal Stress ◽  
Film Capacitor ◽  
Thin Film Capacitor ◽  
Pzt Thin Film

Understanding internal stress evolution mechanisms associated with field crystallization of anodic tantalum oxide

2013 ◽  
Vol 32 (1) ◽  
pp. 108-116 ◽  
Author(s):  
Lei Yang ◽  
Mark Viste ◽  
Joachim Hossick-Schott ◽  
Brian W. Sheldon
Keyword(s):  
Internal Stress ◽  
Tantalum Oxide ◽  
Stress Evolution
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