Ultrahigh Purification of Silane for Semiconductor Silicon

1975 ◽  
Vol 122 (12) ◽  
pp. 1700-1705 ◽  
Author(s):  
A. Yusa ◽  
Y. Yatsurugi ◽  
T. Takaishi
Keyword(s):  
Semiconductor Silicon

A microscopically accurate continuum model for void formation during semiconductor silicon processing

2005 ◽  
Vol 279 (3-4) ◽  
pp. 258-271 ◽  
Author(s):  
Thomas A. Frewen ◽  
Sumeet S. Kapur ◽  
Walter Haeckl ◽  
Wilfried von Ammon ◽  
Talid Sinno
Keyword(s):  
Continuum Model ◽  
Void Formation ◽  
Semiconductor Silicon

The effect of surface damage on photoelectrochemical and metal-insulator-semiconductor silicon solar cells

1986 ◽  
Vol 14 (1) ◽  
pp. 61-70 ◽  
Author(s):  
A. Praet ◽  
G. Vercruysse ◽  
W.P. Gomes ◽  
W.M.R. Divigalpitiya ◽  
S. Roy Morrison
Keyword(s):  
Solar Cells ◽  
Surface Damage ◽  
Silicon Solar Cells ◽  
Metal Insulator ◽  
Metal Insulator Semiconductor ◽  
Semiconductor Silicon ◽  
Effect Of Surface

Effect of Surfactant on the Dispersion Stability of Slurry for Semiconductor Silicon CMP

2018 ◽  
Vol 25 (5) ◽  
pp. 395-401
Author(s):  
Hye Won Yun ◽  
Doyeon Kim ◽  
Do Hyung Han ◽  
Dong Wan Kim ◽  
Woo-Byoung Kim
Keyword(s):  
Dispersion Stability ◽  
Semiconductor Silicon

The Origin of Photoluminescence from Oxygen Precipitates Nucleated at Low Temperature in Semiconductor Silicon

2004 ◽  
Vol 151 (12) ◽  
pp. G866 ◽  
Author(s):  
E. Leoni ◽  
L. Martinelli ◽  
S. Binetti ◽  
G. Borionetti ◽  
S. Pizzini
Keyword(s):  
Low Temperature ◽  
Semiconductor Silicon ◽  
Oxygen Precipitates

Spectrographic analysis of semiconductor silicon and germanium with a hollow cathode discharge

1982 ◽  
Vol 37 (5) ◽  
pp. 1219-1221
Author(s):  
N. K. Rudnevskii ◽  
D. E. Maksimov ◽  
A. N. Tumanova ◽  
T. M. Shabanova
Keyword(s):  
Hollow Cathode ◽  
Hollow Cathode Discharge ◽  
Spectrographic Analysis ◽  
Semiconductor Silicon ◽  
Silicon And Germanium
Sign in / Sign up

Export Citation Format

Share Document