Optimization of the Deposition Conditions for Epitaxial Silicon Films on Czochralski Sapphire in the Silane‐Hydrogen System

1980 ◽  
Vol 127 (4) ◽  
pp. 957-961 ◽  
Author(s):  
M. Druminski
1992 ◽  
Vol 283 ◽  
Author(s):  
Hideki Matsumura ◽  
Yoichi Hosoda ◽  
Seijiro Furukawa

ABSTRACTPoly-silicon films are obtained at temperatures as low as 400 °C by the catalytic chemical vapor deposition (cat-CVD) method, in which deposition gases are decomposed by the catalytic or pyrolytic reactions with a heated catalyzer near substrates. It is found that there are roughly two modes of deposition conditions such as low gas pressure mode and high gas pressure mode for obtaining poly-silicon films, and also that the Hall mobility of the cat-CVD poly-silicon films of low gas pressure mode sometimes exceeds over 100 cm2/Vs.


1997 ◽  
Vol 71 (4) ◽  
pp. 515-517 ◽  
Author(s):  
A. G. U. Perera ◽  
W. Z. Shen ◽  
W. C. Mallard ◽  
M. O. Tanner ◽  
K. L. Wang

2006 ◽  
Vol 910 ◽  
Author(s):  
Charles W. Teplin ◽  
Matthew Page ◽  
Eugene Iwaniczko ◽  
Kim M. Jones ◽  
Robert M. Ready ◽  
...  

AbstractWe grow epitaxial silicon films onto (100) silicon wafers from pure silane by hot-wire chemical vapor deposition (HWCVD). The films grow epitaxially for a thickness hepi before a Si:H cones nucleate and expand. We study the dependence of hepi on growth rate and the differences between Ta and W filaments. The surface morphology of thin but completely epitaxial films are studied in order to correlate the surface roughness during growth with the eventual epitaxial breakdown thickness. Surface roughness, strain and H at the wafer/film interface are not likely to cause the observed breakdown.


2003 ◽  
Vol 174-175 ◽  
pp. 1178-1181 ◽  
Author(s):  
R.G. Sharafutdinov ◽  
V.M. Karsten ◽  
S.Ya. Khmel ◽  
A.G. Cherkov ◽  
A.K. Gutakovskii ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document