Relaxation Processes in Si / Si1 − x Ge x Strained Layer Superlattices: A Study by Raman Spectroscopy and X‐Ray Diffractometry

1989 ◽  
Vol 136 (12) ◽  
pp. 3848-3852 ◽  
Author(s):  
C. G. Tuppen ◽  
C. J. Gibbings ◽  
S. T. Davey ◽  
M. H. Lyons ◽  
M. Hockly ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Relaxation Processes ◽  
X Ray ◽  
Strained Layer ◽  
Strained Layer Superlattices

X‐ray characterization of strain relaxation in InGaAs/GaAs strained‐layer superlattices

1993 ◽  
Vol 63 (24) ◽  
pp. 3327-3329 ◽  
Author(s):  
Jianhua Li ◽  
Zhenhong Mai ◽  
Shufan Cui ◽  
Junming Zhou ◽  
Wei Feng
Keyword(s):  
Strain Relaxation ◽  
X Ray ◽  
Strained Layer ◽  
Strained Layer Superlattices

X‐ray [440] diffraction of the strained‐layer superlattices grown on (001) substrates

1990 ◽  
Vol 68 (1) ◽  
pp. 112-115 ◽  
Author(s):  
H. Yang ◽  
A. Ishida ◽  
H. Fujiyasu
Keyword(s):  
X Ray ◽  
Strained Layer ◽  
Strained Layer Superlattices

X‐ray diffraction analysis of buffer layer effects on lattice distortions of strained layer superlattices

1987 ◽  
Vol 62 (3) ◽  
pp. 1124-1127 ◽  
Author(s):  
K. Kamigaki ◽  
H. Sakashita ◽  
H. Kato ◽  
M. Nakayama ◽  
N. Sano ◽  
...  
Keyword(s):  
Diffraction Analysis ◽  
Buffer Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Strained Layer ◽  
Lattice Distortions ◽  
Strained Layer Superlattices
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