X‐ray [440] diffraction of the strained‐layer superlattices grown on (001) substrates

H. Yang; A. Ishida; H. Fujiyasu

doi:10.1063/1.347101

X‐ray [440] diffraction of the strained‐layer superlattices grown on (001) substrates

Journal of Applied Physics ◽

10.1063/1.347101 ◽

1990 ◽

Vol 68 (1) ◽

pp. 112-115 ◽

Cited By ~ 4

Author(s):

H. Yang ◽

A. Ishida ◽

H. Fujiyasu

Keyword(s):

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray characterization of (Zn,Cd)Te/CdTe strained layer superlattices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577555 ◽

1991 ◽

Vol 9 (3) ◽

pp. 954-956

Author(s):

Syed B. Qadri

Keyword(s):

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Kinematical simulation of high‐resolution x‐ray diffraction curves of GexSi1−x/Si strained‐layer superlattices: A structural assessment

Applied Physics Letters ◽

10.1063/1.99189 ◽

1988 ◽

Vol 52 (14) ◽

pp. 1152-1154 ◽

Cited By ~ 29

Author(s):

J. M. Vandenberg ◽

J. C. Bean ◽

R. A. Hamm ◽

R. Hull

Keyword(s):

High Resolution ◽

X Ray Diffraction ◽

Structural Assessment ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Kinematical Simulation

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Electron and x‐ray diffraction study of ZnTe‐ZnS strained‐layer superlattices grown by molecular beam epitaxy

Applied Physics Letters ◽

10.1063/1.101224 ◽

1989 ◽

Vol 54 (2) ◽

pp. 117-119 ◽

Cited By ~ 8

Author(s):

Takeshi Karasawa ◽

Kazuhiro Ohkawa ◽

Tsuneo Mitsuyu

Keyword(s):

Molecular Beam Epitaxy ◽

Diffraction Study ◽

Molecular Beam ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Approach to an extended X-ray diffraction analysis of strained-layer superlattices

Superlattices and Microstructures ◽

10.1016/0749-6036(91)90324-k ◽

1991 ◽

Vol 10 (3) ◽

pp. 273-277

Author(s):

H. Berger ◽

B. Rosner

Keyword(s):

Diffraction Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray characterization of strain relaxation in InGaAs/GaAs strained‐layer superlattices

Applied Physics Letters ◽

10.1063/1.110190 ◽

1993 ◽

Vol 63 (24) ◽

pp. 3327-3329 ◽

Cited By ~ 4

Author(s):

Jianhua Li ◽

Zhenhong Mai ◽

Shufan Cui ◽

Junming Zhou ◽

Wei Feng

Keyword(s):

Strain Relaxation ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray diffraction analysis of buffer layer effects on lattice distortions of strained layer superlattices

Journal of Applied Physics ◽

10.1063/1.339831 ◽

1987 ◽

Vol 62 (3) ◽

pp. 1124-1127 ◽

Cited By ~ 6

Author(s):

K. Kamigaki ◽

H. Sakashita ◽

H. Kato ◽

M. Nakayama ◽

N. Sano ◽

...

Keyword(s):

Diffraction Analysis ◽

Buffer Layer ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Lattice Distortions ◽

Strained Layer Superlattices

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Precise thickness measurement within a few monolayers by X-ray diffraction from InGaAs/GaAs strained-layer superlattices

Journal of Crystal Growth ◽

10.1016/0022-0248(95)80263-c ◽

1995 ◽

Vol 150 ◽

pp. 508-512 ◽

Cited By ~ 1

Author(s):

M. Sato ◽

T. Kawaguchi ◽

S. Nishi

Keyword(s):

Thickness Measurement ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices

Ultramicroscopy ◽

10.1016/0304-3991(91)90129-t ◽

1991 ◽

Vol 36 (4) ◽

pp. 375-384 ◽

Cited By ~ 13

Author(s):

X.F. Duan ◽

K.K. Fung

Keyword(s):

Electron Diffraction ◽

Convergent Beam Electron Diffraction ◽

X Ray Diffraction ◽

Beam Electron ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Convergent Beam

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Relaxation Processes in Si / Si1 − x Ge x Strained Layer Superlattices: A Study by Raman Spectroscopy and X‐Ray Diffractometry

Journal of The Electrochemical Society ◽

10.1149/1.2096560 ◽

1989 ◽

Vol 136 (12) ◽

pp. 3848-3852 ◽

Cited By ~ 5

Author(s):

C. G. Tuppen ◽

C. J. Gibbings ◽

S. T. Davey ◽

M. H. Lyons ◽

M. Hockly ◽

...

Keyword(s):

Raman Spectroscopy ◽

Relaxation Processes ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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