Electroless Plating of Copper and Nickel on Surface-Modified Poly(tetrafluoroethylene) Films

2001 ◽  
Vol 148 (2) ◽  
pp. C71 ◽  
Author(s):  
M. C. Zhang ◽  
E. T. Kang ◽  
K. G. Neoh ◽  
K. L. Tan
2003 ◽  
Vol 220 (1-4) ◽  
pp. 238-250 ◽  
Author(s):  
S.C Domenech ◽  
E Lima ◽  
V Drago ◽  
J.C De Lima ◽  
N.G Borges ◽  
...  

2011 ◽  
Vol 257 (18) ◽  
pp. 8067-8071 ◽  
Author(s):  
Wei Su ◽  
Libei Yao ◽  
Fang Yang ◽  
Peiyuan Li ◽  
Juan Chen ◽  
...  

RSC Advances ◽  
2018 ◽  
Vol 8 (18) ◽  
pp. 9933-9940
Author(s):  
Kiho Kim ◽  
Jinseong Lee ◽  
Seokgyu Ryu ◽  
Jooheon Kim

Boron nitride (BN) and laser activate particles (LAPs) which used for electroless plating were surface-modifiedviabase treatment and by using a silane coupling agent in order to confer functionality and enhance the interfacial affinity of these particles for a polymer matrix.


2008 ◽  
Vol 492 (1) ◽  
pp. 275/[639]-282/[646] ◽  
Author(s):  
Eun Sun Ji ◽  
Hyun Gil Cha ◽  
Chang Woo Kim ◽  
Young Soo Kang

Author(s):  
P. S. Sklad

Over the past several years, it has become increasingly evident that materials for proposed advanced energy systems will be required to operate at high temperatures and in aggressive environments. These constraints make structural ceramics attractive materials for these systems. However it is well known that the condition of the specimen surface of ceramic materials is often critical in controlling properties such as fracture toughness, oxidation resistance, and wear resistance. Ion implantation techniques offer the potential of overcoming some of the surface related limitations.While the effects of implantation on surface sensitive properties may be measured indpendently, it is important to understand the microstructural evolution leading to these changes. Analytical electron microscopy provides a useful tool for characterizing the microstructures produced in terms of solute concentration profiles, second phase formation, lattice damage, crystallinity of the implanted layer, and annealing behavior. Such analyses allow correlations to be made with theoretical models, property measurements, and results of complimentary techniques.


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