Readout Circuit Design Using Experimental Data of Line-TFET Devices

2020 ◽  
Vol 97 (5) ◽  
pp. 165-170
Author(s):  
Walter Gonçalez ◽  
Roberto Rangel ◽  
Joao Antonio Martino ◽  
Paula Ghedini Der Agopian
2020 ◽  
Vol MA2020-01 (24) ◽  
pp. 1390-1390
Author(s):  
Walter Gonçalez ◽  
Roberto Rangel ◽  
Joao Antonio Martino ◽  
Paula Ghedini Der Agopian

2017 ◽  
Vol 46 (1) ◽  
pp. 106007
Author(s):  
赵佳姮 Zhao Jiaheng ◽  
赵毅强 Zhao Yiqiang ◽  
叶茂 Ye Mao ◽  
夏显召 Xia Xianzhao ◽  
周国清 Zhou Guoqing

2013 ◽  
Vol 785-786 ◽  
pp. 1341-1347
Author(s):  
Tie Wang Liang ◽  
Yan Ren

A measurement and analysis system is designed base on the requirement of digital upgrade to the KY231 Material strain tester. This system is made up of two parts :The analyze system based on the LABWINDOWS and the measurement system based on STM8S207. The physical quantities (such as stress, pressure, deformation, etc.) of the metal specimen are acquired, displayed and analyzed digitally in this system, meanwhile the experimental data and curves can be stored in the systerm and compared to the historical data saved in the previous files. Because the USB interface is too complex to the MCU systerm form the aspart of the programming and circuit design, the PL2303 is used to simulate USB interface as virtual RS232 for the communication between the measurement system and the analyze system.


Author(s):  
Hareesh Vemulachedu ◽  
Shanthi Pavan ◽  
Enakshi Bhattacharya

2017 ◽  
Vol 46 (1) ◽  
pp. 106007 ◽  
Author(s):  
赵佳姮 Zhao Jiaheng ◽  
赵毅强 Zhao Yiqiang ◽  
叶茂 Ye Mao ◽  
夏显召 Xia Xianzhao ◽  
周国清 Zhou Guoqing

2007 ◽  
Author(s):  
Chul Bum Kim ◽  
Chi Ho Hwang ◽  
Yong Soo Lee ◽  
Hee Chul Lee

1994 ◽  
Author(s):  
Wei-Lee Lu ◽  
Chin-Hsin Kao ◽  
L. S. Lu ◽  
Far-Wen Jih ◽  
Tai Ping Sun ◽  
...  

1996 ◽  
Vol 06 (C3) ◽  
pp. C3-199-C3-206 ◽  
Author(s):  
W.-L. Lu ◽  
Z.-W. Hwang ◽  
L. S. Lu

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