Ultrathin nitrided gate dielectrics: Plasma processing, chemical characterization, performance, and reliability
1999 ◽
Vol 43
(3)
◽
pp. 301-326
◽
1999 ◽
Vol 17
(6)
◽
pp. 2610
◽
1989 ◽
Vol 47
◽
pp. 552-553
Keyword(s):
Keyword(s):