Measurement of Reaction Current during Atomic Force Microscope Local Oxidation of Conductive Surfaces Capped with Insulating Layers
Keyword(s):
2010 ◽
Vol 2
(2)
◽
pp. 185-188
◽
Nanolithography on semiconductor heterostructures by local oxidation with an atomic force microscope
2007 ◽
pp. 161-170
◽
Keyword(s):
2005 ◽
Vol 23
(5)
◽
pp. 1905
◽