Crystal Orientation and Surface Roughness of Bi Films Prepared in Ionized Cluster Beam Apparatus

1996 ◽  
Vol 35 (Part 1, No. 2A) ◽  
pp. 714-719 ◽  
Author(s):  
Masafumi Nakada ◽  
Norikazu Ohshima ◽  
Mitsuya Okada
Keyword(s):  
Surface Roughness ◽  
Crystal Orientation ◽  
Cluster Beam

402 Investigation on influence of surface roughness of cooling surface on ice structure formed by control of initial ice crystal orientation

2014 ◽  
Vol 2014.24 (0) ◽  
pp. 121-122
Author(s):  
Takahiro IKEYA ◽  
Koji MATSUMOTO ◽  
Yoshikazu TERAOKA ◽  
Kazuyoshi MATSUNAGA ◽  
Masato HONDA
Keyword(s):  
Surface Roughness ◽  
Crystal Orientation ◽  
Ice Crystal ◽  
Cooling Surface

Crystal Orientation, Order Degree, and Surface Roughness of FePd-Alloy Film Formed on MgO(001) Substrate

2015 ◽  
Vol 51 (11) ◽  
pp. 1-4 ◽  
Author(s):  
Mitsuru Ohtake ◽  
Akira Itabashi ◽  
Masaaki Futamoto ◽  
Fumiyoshi Kirino ◽  
Nobuyuki Inaba
Keyword(s):  
Surface Roughness ◽  
Crystal Orientation ◽  
Alloy Film ◽  
Orientation Order ◽  
Order Degree

Microstructures of Ultrathin Films of Sputtered PbTiO3

1994 ◽  
Vol 361 ◽  
Author(s):  
Kiyotaka Wasa ◽  
T. Satoh ◽  
K. Tab Ata ◽  
H. Adachi ◽  
Y. Ichikawa ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Ultrathin Films ◽  
Crystal Orientation ◽  
Smooth Surface ◽  
Three Dimensional ◽  
Rf Magnetron Sputtering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dimensional Crystal

ABSTRACTUltrathin films of perovskite PbTiO3, 10–100nm thick, were epitaxially grown on miscut (001)SrTiO3 substrate by rf-magnetron sputtering at 600°C. The electron microscope and high resolution x-ray diffraction analysis suggested the evidence of epitaxial growth of (001)PbTiO3/(001)SrTiO3 with three dimensional crystal orientation. The stoichiometric film shows extremely smooth surface with the surface roughness less than 3nm. Deposition on a miscut substrate under stoichiometric conditions is essential to make continuous thin films of single crystal perovskite PbTiO3.

Study on the Surface Roughness and Crystal Orientation Effects on the Cross Slip under Pure Shear State

2002 ◽  
Vol 2002.42 (0) ◽  
pp. 200-201
Author(s):  
Shi hua TANG ◽  
Michiaki KOBAYASHI ◽  
Setsuo MIURA ◽  
Hiroyuki FUJIKI ◽  
Seiichi OMORI
Keyword(s):  
Surface Roughness ◽  
Crystal Orientation ◽  
Pure Shear ◽  
Cross Slip ◽  
Orientation Effects ◽  
The Cross ◽  
Shear State

Surface Morphology, Crystal Orientation and Scratch Properties of Au/NiCr/Ta Multi-Layered Metallic Films

2007 ◽  
Vol 353-358 ◽  
pp. 1863-1866
Author(s):  
Wu Tang ◽  
Long Jiang Deng ◽  
Ke Wei Xu ◽  
Jian Lu
Keyword(s):  
Surface Roughness ◽  
Surface Morphology ◽  
Substrate Temperature ◽  
Crystal Orientation ◽  
Scratch Test ◽  
Test Method ◽  
Metallic Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Mode

The crystal orientation, surface morphology, surface roughness and scratch properties of Au/NiCr/Ta multi-layered metallic films was examined by X-ray diffraction (XRD), atomic force microscopy (AFM) and a scratch test method, respectively. It was clarified that the surface morphology and surface roughness depend on the substrate temperature. The surface roughness decreases from 4.259nm to 2.935nm when substrate temperature changed from 100°C to 180°C, and then increases when substrate temperature above 180°C. The XRD revealed that there are only Au diffraction peaks with highly textured having a Au-(111) or a mixture of Au-(111) and Au-(200) orientation. The micro-scratch test reveals that both modes can be used for conventionally critical load determination, but the friction mode can additionally reflect the changes at different metallic film layers, the critical characteristic load was not sensitive to substrate temperature.

Crystalline Polyimide Thin Film Deposition by Ionized Cluster Bean

1989 ◽  
Vol 157 ◽  
Author(s):  
S.J. Cho ◽  
H.S. Choe ◽  
H.G. Jang ◽  
S.S. Iim ◽  
C.N. Whang
Keyword(s):  
Crystal Orientation ◽  
Thin Film Deposition ◽  
Polyimide Film ◽  
Film Deposition ◽  
Ion Acceleration ◽  
Cluster Beam ◽  
Cluster Beam Deposition ◽  
Acceleration Voltage ◽  
Preferential Crystal Orientation ◽  
Beam Deposition

ABSTRACTPolyimide thin films are deposited by the ionized cluster beam deposition( ICBD ) technique. Polymerization and crystallization of polyimide were investigated using TEN, IR, and the electronic structure of the polyimide film was investigated using XPS. Films deposited at optimum ion acceleration voltage showed strong preferential crystal orientation. Crystalline polyimide film was obtained at ion acceleration voltage of 700 V.

Effect of crystal orientation on inner surface roughness of micro metal tubes in hollow sinking

2021 ◽  
Vol 805 ◽  
pp. 140792
Author(s):  
Takuma Kishimoto ◽  
Saki Suematsu ◽  
Hayate Sakaguchi ◽  
Kenichi Tashima ◽  
Satoshi Kajino ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Crystal Orientation ◽  
Inner Surface

scholarly journals Identifying Key Factors towards Highly Reflective Silver Coatings

2017 ◽  
Vol 2017 ◽  
pp. 1-12 ◽  
Author(s):  
Bo Zheng ◽  
Lai Peng Wong ◽  
Linda Y. L. Wu ◽  
Zhong Chen
Keyword(s):  
Surface Roughness ◽  
Single Crystal ◽  
Crystal Orientation ◽  
Critical Role ◽  
Key Factors ◽  
Average Roughness ◽  
Surface Area Ratio ◽  
Significance Level ◽  
Arithmetic Average ◽  
Polycrystalline Silver

This paper attempts to identify key factor(s) for highly reflective silver (Ag) coatings. Investigation was made over the crystal orientation and surface roughness, using several types of surfaces, including electroplated Ag polycrystal films, physical vapour deposited polycrystal Ag films, and single crystal Ag foils with different crystal orientations. In each type of the surfaces, surface roughness was varied so that, for different combinations of crystal orientation, roughness would elucidate the key factors towards highly reflective Ag coatings. It is found that surface roughness plays a critical role in determining the reflectance, while the crystal orientation has negligible effect. The mean reflectance and one-way ANOVA analysis indicate that the single crystal Ag foils with three orientations performed statistically the same in the same roughness group at significance levelα= 0.05. Moreover, correlation between the surface reflectance and surface roughness has been proposed for the benefit of coating design. Refection data obtained from the polycrystalline silver samples are used to verify the accuracy of the proposed correlations. It was observed that the development surface area ratio,Sdr, is a better roughness indicator in predicting the reflectance of polycrystalline silver films than the arithmetic average roughness,Ra.

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