Time-resolved photoluminescence of the defect lines in GaAs molecular-beam epitaxy
Keyword(s):
A time-resolved photoluminescence study of the defect-induced bound excitons (DIBE) observed in the energy region 1504–1511 meV in high quality molecular-beam epitaxy grown GaAs has been performed. Our results support the model that these lines consist of two distinct recombination processes. Transient resonant excitation of these DIBE demonstrate that the lines i to s can be associated with acceptor – bound exciton transitions.
2000 ◽
Vol 5
(S1)
◽
pp. 689-695
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2004 ◽
Vol 43
(No. 7A)
◽
pp. L930-L933
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2004 ◽
Vol 241
(3)
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pp. 515-518
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Keyword(s):
Keyword(s):