Enhancing the intensity of x-ray reflection from surfaces by depositing diamondlike carbon films on them

1998 ◽  
Vol 43 (7) ◽  
pp. 870-871
Author(s):  
A. M. Baranov
Keyword(s):  
Carbon Films ◽  
X Ray ◽  
Diamondlike Carbon

Surface Analysis of Carbon–Hydrogen Bonds in Diamondlike Carbon Films by X-ray Photoelectron Spectroscopy

2009 ◽  
Vol 48 (9) ◽  
pp. 092304 ◽  
Author(s):  
Susumu Takabayashi ◽  
Keishi Okamoto ◽  
Tatsuyuki Nakatani ◽  
Hiroyuki Sakaue ◽  
Takayuki Takahagi
Keyword(s):  
Hydrogen Bonds ◽  
Surface Analysis ◽  
Photoelectron Spectroscopy ◽  
Carbon Films ◽  
X Ray ◽  
Diamondlike Carbon ◽  
Carbon Hydrogen Bonds

New method to calibrate binding energy using Au nanocolloids in X-ray photoelectron analysis of diamondlike carbon films with different electrical resistivities

2008 ◽  
Vol 254 (9) ◽  
pp. 2666-2670 ◽  
Author(s):  
Susumu Takabayashi ◽  
Keishi Okamoto ◽  
Kunihiko Motomitsu ◽  
Akira Terayama ◽  
Tatsuyuki Nakatani ◽  
...  
Keyword(s):  
Binding Energy ◽  
Carbon Films ◽  
New Method ◽  
X Ray ◽  
Diamondlike Carbon ◽  
Electrical Resistivities

Electrodeposition of diamondlike carbon films on nickel substrates

2003 ◽  
Vol 18 (7) ◽  
pp. 1561-1565 ◽  
Author(s):  
Alex Minhua Chen ◽  
Charoendee Pingsuthiwong ◽  
Teresa Diane Golden
Keyword(s):  
Raman Spectra ◽  
Amorphous Alloys ◽  
Carbon Films ◽  
Photoelectron Spectra ◽  
X Ray ◽  
Electrode Cell ◽  
Diamondlike Carbon ◽  
Nickel Substrates ◽  
Stretching Vibrations ◽  
Hydrogenated Amorphous

Diamondlike carbon (DLC) films were electrodeposited on nickel substrates from a solution of acetylene in liquid ammonia at low temperature and low potential using a three-electrode cell. Raman spectra showed a shoulder D peak at 1365 cm−1 and a broad G peak at 1558 cm−1 for the films, indicating an sp3 and sp2 carbon mixture. The presence of a 1230 cm−1 peak also indicated some four-fold-coordinated bonds of microcrystalline diamond. Fitting of the peaks in the Raman spectra specified the electrodeposited films were hydrogenated amorphous alloys, a-C:H. X-ray photoelectron spectra also pointed to the films containing a mixture of sp3 and sp2 carbon. Fourier transform infrared spectra of the electrodeposited films had C-H stretching vibrations, which is consistent with hydrogenated DLC films.

scholarly journals Hydrogen concentration and mass density of diamondlike carbon films obtained by x‐ray and neutron reflectivity

1994 ◽  
Vol 76 (8) ◽  
pp. 4636-4642 ◽  
Author(s):  
E. Findeisen ◽  
R. Feidenhans’l ◽  
M. E. Vigild ◽  
K. N. Clausen ◽  
J. Bindslev Hansen ◽  
...  
Keyword(s):  
Hydrogen Concentration ◽  
Mass Density ◽  
Carbon Films ◽  
Neutron Reflectivity ◽  
X Ray ◽  
Diamondlike Carbon

scholarly journals Chemical Structural Analysis of Diamondlike Carbon Films with Different Electrical Resistivities by X-ray Photoelectron Spectroscopy

2008 ◽  
Vol 47 (5) ◽  
pp. 3376-3379 ◽  
Author(s):  
Susumu Takabayashi ◽  
Keishi Okamoto ◽  
Kenya Shimada ◽  
Kunihiko Motomitsu ◽  
Hiroaki Motoyama ◽  
...  
Keyword(s):  
Structural Analysis ◽  
Photoelectron Spectroscopy ◽  
Carbon Films ◽  
X Ray ◽  
Diamondlike Carbon ◽  
Electrical Resistivities

Using Molecular-Beam Mass Spectrometry to Study the Pecvd of Diamondlike Carbon Films

1993 ◽  
Vol 334 ◽  
Author(s):  
I.B. Graff ◽  
R.A. Pugliese ◽  
P.R. Westmoreland
Keyword(s):  
Mass Spectrometry ◽  
Vapor Deposition ◽  
Molecular Beam ◽  
Film Growth ◽  
Chemical Vapor ◽  
Carbon Films ◽  
Total Flow ◽  
Measured Concentration ◽  
Molecular Beam Mass Spectrometry ◽  
Diamondlike Carbon

AbstractMolecular-beam mass spectrometry has been used to study plasma-enhanced chemical vapor deposition (PECVD) of diamondlike carbon films. A threshold-ionization technique was used to identify and quantify species in the plasma. Mole fractions of H, H2, CH4, C2H2, C2H6 and Ar were measured in an 83.3% CH4/Ar mixture at a pressure of 0.1 torr and a total flow of 30 sccm. Comparisons were made between mole fractions measured at plasma powers of 25W and 50W. These results were compared to measured concentration profiles and to film growth rates.

X-ray diffraction in oriented carbon films with turbostratic structure

Carbon ◽  
1995 ◽  
Vol 33 (10) ◽  
pp. 1399-1403 ◽  
Author(s):  
Y. Hishiyama ◽  
M. Nakamura
Keyword(s):  
Carbon Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Turbostratic Structure
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