Observation of Magnetic Domain Behavior in Colossal Magnetoresistive Materials With a Magnetic Force Microscope

Science ◽  
1997 ◽  
Vol 276 (5321) ◽  
pp. 2006-2008 ◽  
Author(s):  
Q. Lu
Keyword(s):  
Magnetic Force ◽  
Magnetic Domain ◽  
Magnetic Force Microscope ◽  
Colossal Magnetoresistive

Microstructure and Distribution of Low Content Elements in AlNiCo 9

2017 ◽  
Vol 898 ◽  
pp. 1669-1674 ◽  
Author(s):  
Bin Shao ◽  
Bing Bing Li ◽  
Chun Hong Li ◽  
Yi Long Ma ◽  
Qiang Zheng ◽  
...  
Keyword(s):  
Magnetic Force ◽  
Magnetic Domain ◽  
Magnetic Force Microscope ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray ◽  
Al Content ◽  
Transmission Electron ◽  
Titanium Sulfide ◽  
High Al Content

The microstructure and the chemistry distribution of AlNiCo 9 samples were characterized by the X-ray diffraction, magnetic force microscope, field emission scanning electron microscopy and transmission electron microscope. An interface of a high Al content was formed near the FeCo-rich phases with a size of about 30 nm. S elements mainly combined with Ti to form titanium sulfide bars with the length between 70-150 μm, while S elements was not confirmed in the nanostructured FeCo-rich phase and AlNi-rich phase. Si and Nb preferably existed in the NiAl-rich phase, and a higher content Nb near the Cu precipitate boundary was observed. Moreover, the magnetic domain structure of AlNiCo 9 was also studied.

Effects of Magnetic Domain Walls on the Anisotropic Magnetoresistance in NiFe Nanowires

2015 ◽  
Vol 15 (10) ◽  
pp. 7620-7623 ◽  
Author(s):  
Chunghee Nam
Keyword(s):  
Magnetic Field ◽  
Magnetic Force ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Anisotropic Magnetoresistance ◽  
Magnetic Force Microscope ◽  
Micromagnetic Simulations ◽  
Magnetic Domain Walls ◽  
Magnetic Wires ◽  
Low Magnetic Field

We show that a type of magnetic domain walls (DWs) can be monitored by anisotropic magnetoresistance (AMR) measurements due to a specific DW volume depending on the DW type in NiFe magnetic wires. A circular DW injection pad is used to generate DWs at a low magnetic field, resulting in reliable DW introduction into magnetic wires. DW pinning is induced by a change of DW energy at an asymmetric single notch. The injection of DW from the circular pad and its pinning at the notch is observed by using AMR and magnetic force microscope (MFM) measurements. A four-point probe AMR measurement allows us to distinguish the DW type in the switching process because DWs are pinned at the single notch, where voltage probes are closely placed around the notch. Two types of AMR behavior are observed in the AMR measurements, which is owing to a change of DW structures. MFM images and micromagnetic simulations are consistent with the AMR results.

Three-dimensional simulation of the disturbance of magnetic domain walls by magnetic force microscope tips

1997 ◽  
Vol 81 (8) ◽  
pp. 4686-4688 ◽  
Author(s):  
S. Huo ◽  
J. E. L. Bishop ◽  
J. W. Tucker ◽  
W. M. Rainforth ◽  
H. A. Davies
Keyword(s):  
Magnetic Force ◽  
Domain Walls ◽  
Three Dimensional ◽  
Magnetic Domain ◽  
Magnetic Force Microscope ◽  
Magnetic Domain Walls ◽  
Dimensional Simulation

Magnetic Domain Observation on Melt-Spun Nd-Fe-B Ribbons Using Magnetic Force Microscopy

1999 ◽  
Vol 577 ◽  
Author(s):  
A. Gavrin ◽  
C. Sellers ◽  
S.H. Liouw
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Measurements ◽  
Magnetic Domain ◽  
Domain Size ◽  
High Coercivity ◽  
Uniform Domain ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Melt Spun

ABSTRACTWe have used Magnetic Force Microscopy (MFM) to study the magnetic domain structures of melt-spun Nd-Fe-B ribbons. The ribbons are commercial products (Magnequench International, Inc. MQP-B and MQP-B+) with a thickness of approximately 20 microns. These materials have identical composition, Nd12.18B5.36Fe76.99Co5.46, but differ in quenching conditions. In order to study the distribution of domain sizes through the ribbon thickness, we have prepared cross-sectional samples in epoxy mounts. In order to avoid artifacts due to tip-sample interactions, we have used high coercivity CoPt coated MFM tips. Our studies show domain sizes typically ranging from 50-200 nm in diameter. This is in agreement with studies of similar materials in which domains were investigated in the plane of the ribbon. We also find that these products differ substantially in mean domain size and in the uniformity of the domain sizes as measured across the ribbon. While the B+ material shows nearly uniform domain sizes throughout the cross section, the B material shows considerably larger domains on one surface, followed by a region in which the domains are smaller than average. This structure is presumably due to the differing quench conditions. The region of coarse domains varies in thickness, disappearing in some areas, and reaching a maximum thickness of 2.75 µm in others. We also describe bulk magnetic measurements, and suggest that.

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

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