In-situ investigation of patterned magnetic domain structures using magnetic force microscope

1999 ◽  
Vol 35 (5) ◽  
pp. 3481-3483 ◽  
Author(s):  
J.C. Wu ◽  
H.W. Huang ◽  
Y.W. Huang ◽  
Te-Ho Wu
Keyword(s):  
Magnetic Force ◽  
Magnetic Domain ◽  
Magnetic Force Microscope ◽  
Domain Structures ◽  
In Situ Investigation

In situ investigation of the magnetic domain wall in Permalloy thin film by Lorentz electron microscopy

2008 ◽  
Vol 62 (17-18) ◽  
pp. 2654-2656 ◽  
Author(s):  
H.H. Liu ◽  
X.K. Duan ◽  
R.C. Che ◽  
Z.F. Wang ◽  
X.F. Duan
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Domain Wall ◽  
Magnetic Domain ◽  
Magnetic Domain Wall ◽  
In Situ Investigation

Differential Domain Wall Propagation in Y-Shaped Permalloy Nanowire Devices

SPIN ◽  
2016 ◽  
Vol 06 (01) ◽  
pp. 1650006 ◽  
Author(s):  
Bipul Das ◽  
Ting-Chieh Chen ◽  
Deng-Shiang Shiu ◽  
Lance Horng ◽  
Jong-Ching Wu
Keyword(s):  
Domain Wall ◽  
Magnetic Force ◽  
Magnetic Domain ◽  
Topological Defects ◽  
Circular Disk ◽  
Geometrical Shape ◽  
Magnetic Domain Wall ◽  
Force Microscopy ◽  
Junction Structure

Here, we report an investigation of magnetic domain wall (DW) evolution and propagation in Y-shaped permalloy (Py) nanowire (NW) devices. The devices are fabricated using standard electron-beam lithography technique. Each device consists of three connected NWs that form a Y-junction structure with one branch connecting either symmetrically or asymmetrically to a circular disk for DW nucleation. The DW dynamics in the devices are studied by in situ magnetic force microscopy (MFM) by pinning the DWs to triangular notches at each branch of the two devices. We observe that the DW injection field values differ depending on whether they are connected to the circular disks symmetrically or asymmetrically. However, after they pass the Y-junctions, a selection is made by the DWs to propagate easily either through both or through only one particular outgoing branch of the devices. The experimental observations are analyzed by micromagnetic simulation. It can be inferred from the results that the influence of detailed geometrical shape of the devices leads to significantly different interactions among the innate topological defects and the notches with the injected DWs.

Microstructure and Distribution of Low Content Elements in AlNiCo 9

2017 ◽  
Vol 898 ◽  
pp. 1669-1674 ◽  
Author(s):  
Bin Shao ◽  
Bing Bing Li ◽  
Chun Hong Li ◽  
Yi Long Ma ◽  
Qiang Zheng ◽  
...  
Keyword(s):  
Magnetic Force ◽  
Magnetic Domain ◽  
Magnetic Force Microscope ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray ◽  
Al Content ◽  
Transmission Electron ◽  
Titanium Sulfide ◽  
High Al Content

The microstructure and the chemistry distribution of AlNiCo 9 samples were characterized by the X-ray diffraction, magnetic force microscope, field emission scanning electron microscopy and transmission electron microscope. An interface of a high Al content was formed near the FeCo-rich phases with a size of about 30 nm. S elements mainly combined with Ti to form titanium sulfide bars with the length between 70-150 μm, while S elements was not confirmed in the nanostructured FeCo-rich phase and AlNi-rich phase. Si and Nb preferably existed in the NiAl-rich phase, and a higher content Nb near the Cu precipitate boundary was observed. Moreover, the magnetic domain structure of AlNiCo 9 was also studied.

Effects of Magnetic Domain Walls on the Anisotropic Magnetoresistance in NiFe Nanowires

2015 ◽  
Vol 15 (10) ◽  
pp. 7620-7623 ◽  
Author(s):  
Chunghee Nam
Keyword(s):  
Magnetic Field ◽  
Magnetic Force ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Anisotropic Magnetoresistance ◽  
Magnetic Force Microscope ◽  
Micromagnetic Simulations ◽  
Magnetic Domain Walls ◽  
Magnetic Wires ◽  
Low Magnetic Field

We show that a type of magnetic domain walls (DWs) can be monitored by anisotropic magnetoresistance (AMR) measurements due to a specific DW volume depending on the DW type in NiFe magnetic wires. A circular DW injection pad is used to generate DWs at a low magnetic field, resulting in reliable DW introduction into magnetic wires. DW pinning is induced by a change of DW energy at an asymmetric single notch. The injection of DW from the circular pad and its pinning at the notch is observed by using AMR and magnetic force microscope (MFM) measurements. A four-point probe AMR measurement allows us to distinguish the DW type in the switching process because DWs are pinned at the single notch, where voltage probes are closely placed around the notch. Two types of AMR behavior are observed in the AMR measurements, which is owing to a change of DW structures. MFM images and micromagnetic simulations are consistent with the AMR results.

Magnetic domain structures of Co22Ag78 granular films observed by magnetic force microscopy

1998 ◽  
Vol 72 (19) ◽  
pp. 2472-2474 ◽  
Author(s):  
Y. J. Chen ◽  
W. Y. Cheung ◽  
I. H. Wilson ◽  
N. Ke ◽  
S. P. Wong ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Domain ◽  
Granular Films ◽  
Force Microscopy ◽  
Domain Structures

In situ magnetic force microscope studies of magnetization reversal of interaction domains in hot deformed Nd-Fe-B magnets

2012 ◽  
Vol 111 (10) ◽  
pp. 103901 ◽  
Author(s):  
J. Thielsch ◽  
H. Stopfel ◽  
U. Wolff ◽  
V. Neu ◽  
T. G. Woodcock ◽  
...  
Keyword(s):  
Magnetization Reversal ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Interaction Domains
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