Influence Of Parasitic Elements On Laser Diode Characterization By Electrical Noise Measurements

1987 ◽  
Author(s):  
P. A. Andrekson ◽  
P. Andersson
Keyword(s):  
Laser Diode ◽  
Electrical Noise ◽  
Noise Measurements

scholarly journals SCLC Degradation in 980 nm Pump Laser by Using Electrical Noise

ISRN Optics ◽  
2012 ◽  
Vol 2012 ◽  
pp. 1-4
Author(s):  
B. Orsal ◽  
I. Asaad
Keyword(s):  
Defect Density ◽  
Optical Power ◽  
Longitudinal Mode ◽  
Pump Laser ◽  
Electrical Noise ◽  
Noise Sources ◽  
Noise Spectral Density ◽  
Noise Current ◽  
Noise Measurements ◽  
Pump Lasers

The knowledge of the noise levels is important for pump laser diodes as it allows to study and to locate the noise sources and their origin. 980 nm fresh and aged pump lasers have been characterized by using electrical noise measurements. At 10 Hz, the spectra are dominated by () noise. Current noise spectral density (CNSD) is dominated by (). The trapping defect density near the n+n- and p+p- interfaces is related to pinching of the space-charge-limited current (SCLC) effect. An excess electrical noise due to longitudinal mode hopping is correlated with optical power fluctuations.

In situ characterization of laser diodes from wide-band electrical noise measurements

1986 ◽  
Vol 4 (7) ◽  
pp. 804-812 ◽  
Author(s):  
P. Andrekson ◽  
P. Andersson ◽  
A. Alping ◽  
S. Eng
Keyword(s):  
Laser Diodes ◽  
Wide Band ◽  
Electrical Noise ◽  
In Situ Characterization ◽  
Noise Measurements

Electrical noise measurements on magnetic films (invited)

1990 ◽  
Vol 67 (9) ◽  
pp. 4884-4888 ◽  
Author(s):  
M. B. Weissman ◽  
N. E. Israeloff
Keyword(s):  
Magnetic Films ◽  
Electrical Noise ◽  
Noise Measurements

Linewidth determination from electrical noise measurements on semiconductor lasers

1985 ◽  
Vol 21 (23) ◽  
pp. 1097 ◽  
Author(s):  
P.A. Andrekson ◽  
P. Andersson ◽  
A. Alping
Keyword(s):  
Semiconductor Lasers ◽  
Electrical Noise ◽  
Noise Measurements
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