Trace Analysis Of Moisture In Integrated Circuit Packages Using Derivative Diode Laser Spectrometry

1983 ◽  
Author(s):  
J. A. Mucha
Keyword(s):  
Diode Laser ◽  
Integrated Circuit ◽  
Trace Analysis ◽  
Laser Spectrometry ◽  
Diode Laser Spectrometry

Diode laser spectrometry of environmental and industrial samples

1999 ◽  
Author(s):  
Kay Niemax ◽  
Joachim Koch ◽  
Christoph Schnuerer-Patschan ◽  
Aleksandr Zybin
Keyword(s):  
Diode Laser ◽  
Laser Spectrometry ◽  
Industrial Samples ◽  
Diode Laser Spectrometry

Sensing of displacement of a specular surface by diode laser spectrometry

2008 ◽  
Vol 17 (3) ◽  
pp. 232-238
Author(s):  
V. A. Sokolov ◽  
Yu. V. Sdobnikov ◽  
M. V. Dvernitskiy
Keyword(s):  
Diode Laser ◽  
Specular Surface ◽  
Laser Spectrometry ◽  
Diode Laser Spectrometry

Measurement of Hydrogen Chloride in Coal-Fired Power Plant Emissions Using Tunable Diode Laser Spectrometry

2016 ◽  
Vol 83 (4) ◽  
pp. 627-633 ◽  
Author(s):  
K. L. Mackay ◽  
A. Chanda ◽  
G. Mackay ◽  
J. T. Pisano ◽  
T. D. Durbin ◽  
...  
Keyword(s):  
Power Plant ◽  
Diode Laser ◽  
Hydrogen Chloride ◽  
Tunable Diode Laser ◽  
Power Plant Emissions ◽  
Laser Spectrometry ◽  
Plant Emissions ◽  
Diode Laser Spectrometry

Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination I. Theory

1980 ◽  
Vol 34 (1) ◽  
pp. 50-56 ◽  
Author(s):  
Mark L. Olson ◽  
David L. Grieble ◽  
Peter R. Griffiths
Keyword(s):  
Diode Laser ◽  
Line Profile ◽  
Tunable Diode Laser ◽  
Second Derivative ◽  
Line Profiles ◽  
Single Beam ◽  
Diode Laser Spectrometer ◽  
Laser Spectrometry ◽  
Second Derivative Spectra ◽  
Diode Laser Spectrometry

A technique of using second derivative spectra has been developed by which accurate infrared line widths and shapes may be measured using a single-beam tunable diode laser spectrometer both for a flat background and in the presence of a sloping background. It is shown that there exist easily measured parameters of the second derivative line profile which are independent of a small linearly sloping background. A procedure was developed which uses sets of precomputed model line profiles to allow an estimate of the true linewidth of a line to be derived from the second derivative spectrum. The accuracy of this technique is limited by the accuracy with which the second derivative line profile can be measured.

Line strength measurements oftrans-HONO near 1255 cm−1by tunable diode laser spectrometry

1995 ◽  
Vol 22 (18) ◽  
pp. 2485-2488 ◽  
Author(s):  
K. H. Becker ◽  
J. Kleffmann ◽  
R. Kurtenbach ◽  
P. Wiesen ◽  
A. Febo ◽  
...  
Keyword(s):  
Diode Laser ◽  
Line Strength ◽  
Tunable Diode Laser ◽  
Laser Spectrometry ◽  
Diode Laser Spectrometry
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