Line strength measurements oftrans-HONO near 1255 cm−1by tunable diode laser spectrometry

1995 ◽  
Vol 22 (18) ◽  
pp. 2485-2488 ◽  
Author(s):  
K. H. Becker ◽  
J. Kleffmann ◽  
R. Kurtenbach ◽  
P. Wiesen ◽  
A. Febo ◽  
...  
Keyword(s):  
Diode Laser ◽  
Line Strength ◽  
Tunable Diode Laser ◽  
Laser Spectrometry ◽  
Diode Laser Spectrometry

Measurement of Hydrogen Chloride in Coal-Fired Power Plant Emissions Using Tunable Diode Laser Spectrometry

2016 ◽  
Vol 83 (4) ◽  
pp. 627-633 ◽  
Author(s):  
K. L. Mackay ◽  
A. Chanda ◽  
G. Mackay ◽  
J. T. Pisano ◽  
T. D. Durbin ◽  
...  
Keyword(s):  
Power Plant ◽  
Diode Laser ◽  
Hydrogen Chloride ◽  
Tunable Diode Laser ◽  
Power Plant Emissions ◽  
Laser Spectrometry ◽  
Plant Emissions ◽  
Diode Laser Spectrometry

Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination I. Theory

1980 ◽  
Vol 34 (1) ◽  
pp. 50-56 ◽  
Author(s):  
Mark L. Olson ◽  
David L. Grieble ◽  
Peter R. Griffiths
Keyword(s):  
Diode Laser ◽  
Line Profile ◽  
Tunable Diode Laser ◽  
Second Derivative ◽  
Line Profiles ◽  
Single Beam ◽  
Diode Laser Spectrometer ◽  
Laser Spectrometry ◽  
Second Derivative Spectra ◽  
Diode Laser Spectrometry

A technique of using second derivative spectra has been developed by which accurate infrared line widths and shapes may be measured using a single-beam tunable diode laser spectrometer both for a flat background and in the presence of a sloping background. It is shown that there exist easily measured parameters of the second derivative line profile which are independent of a small linearly sloping background. A procedure was developed which uses sets of precomputed model line profiles to allow an estimate of the true linewidth of a line to be derived from the second derivative spectrum. The accuracy of this technique is limited by the accuracy with which the second derivative line profile can be measured.

Second Derivative Tunable Diode Laser Spectrometry for Line Profile Determination. II. Experimental Results

1980 ◽  
Vol 34 (1) ◽  
pp. 56-60 ◽  
Author(s):  
David L. Grieble ◽  
Mark L. Olson ◽  
Jeffrey N-P. Sun ◽  
Peter R. Griffiths
Keyword(s):  
Diode Laser ◽  
Half Width ◽  
Tunable Diode Laser ◽  
Second Derivative ◽  
Single Beam ◽  
Zero Crossings ◽  
Diode Laser Spectrometer ◽  
Laser Spectrometry ◽  
Second Derivative Spectra ◽  
Two Parameters

The effect of the amplitude of the current modulation on experimental second derivative spectra measured using a tunable diode laser spectrometer is discussed. Spectra with adequate signal/noise ratios can only be measured when the amplitude of the modulation is about equal to the half width at half height. Two parameters, the distance between the zero crossings and the ratio of the minimal and maximal excursions, may be fit to an empirical hypersurface to obtain values for the peak absorbance, the actual half width and the collision-broadened half width. Although the peak absorbance is not accurately calculated, the line widths appear to be calculated to at least the same accuracy that can be obtained from the single-beam absorption spectrum.

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