High precision deposition of single and multilayer x-ray optics and their application in x-ray analysis

2010 ◽  
Author(s):  
R. Dietsch ◽  
T. Holz ◽  
M. Krämer ◽  
D. Weißbach
Keyword(s):  
High Precision ◽  
Ray Optics ◽  
X Ray

Evaluation of an ultra-high-precision x-ray optics

2004 ◽  
Author(s):  
Shunji Kitamoto ◽  
Norimasa Yamamoto ◽  
Takayoshi Kohmura ◽  
Kazuharu Suga ◽  
Hiroyuki Sekiguchi ◽  
...  
Keyword(s):  
High Precision ◽  
Ray Optics ◽  
X Ray

scholarly journals High precision surface metrology of x-ray optics with an interferometric microscope

2013 ◽  
Author(s):  
Ian Lacey ◽  
Nikolay A. Artemiev ◽  
Wayne R. McKinney ◽  
Daniel J. Merthe ◽  
Valeriy V. Yashchuk
Keyword(s):  
High Precision ◽  
Surface Metrology ◽  
Ray Optics ◽  
X Ray

D-108 High Precision Deposition and Multilayer X-ray Optics

2007 ◽  
Vol 22 (2) ◽  
pp. 176-176
Author(s):  
R. Dietsch ◽  
Th. Holz
Keyword(s):  
High Precision ◽  
Ray Optics ◽  
X Ray

Dispersive spread of virtual sources by asymmetric X-ray monochromators

2012 ◽  
Vol 45 (2) ◽  
pp. 255-262 ◽  
Author(s):  
X. R. Huang ◽  
A. T. Macrander ◽  
M. G. Honnicke ◽  
Y. Q. Cai ◽  
Patricia Fernandez
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Virtual Source ◽  
Angular Dispersion ◽  
Ray Optics ◽  
X Ray ◽  
Back Reflection ◽  
X Ray Scattering ◽  
Ray Scattering

The principles of the virtual source spread (spatial broadening) phenomenon induced by angular dispersion in asymmetric X-ray Bragg reflections are illustrated, from which the virtual source properties are analyzed for typical high-resolution multiple-crystal monochromators, including inline four-bounce dispersive monochromators, back-reflection-dispersion monochromators and nondispersive nested channel-cut monochromators. It is found that dispersive monochromators can produce spread virtual sources of a few millimetres in size, which may prevent efficient microfocusing of the beam as required by inelastic X-ray scattering spectroscopy and other applications. Possible schemes to mitigate this problem are discussed. The analyses may provide important guidelines for designing and optimizing modern high-precision synchrotron X-ray optics and beamline instrumentation for spectroscopy, imaging and nanofocusing applications.

Instrumentation for high‐precision x‐ray optics at the synchrotron radiation source ‘‘Zelenograd’’

1992 ◽  
Vol 63 (1) ◽  
pp. 1027-1030 ◽  
Author(s):  
A. Yu. Kazimirov ◽  
M. V. Kovalchuk ◽  
A. Ya. Kreines ◽  
S. N. Mazurenko ◽  
Yu. N. Shilin
Keyword(s):  
Synchrotron Radiation ◽  
High Precision ◽  
Radiation Source ◽  
Synchrotron Radiation Source ◽  
Ray Optics ◽  
X Ray

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Aperiodic multilayer structures in soft X-ray optics

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin
Keyword(s):  
Multilayer Structures ◽  
Ray Optics ◽  
X Ray
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