Characterization of third-degree burned skin by nonlinear microscopy technique

2011 ◽  
Author(s):  
Moisés O. dos Santos ◽  
Vitor B. Pelegati ◽  
Carlos L. Cesar ◽  
Paulo R. Correa ◽  
Telma Maria T. Zorn ◽  
...  
Keyword(s):  
Nonlinear Microscopy ◽  
Microscopy Technique ◽  
Burned Skin

scholarly journals Synthesis, Characterization of Dichlorofluorescein Silver Nanoparticles (DCF-SNPs) and Their Effect on Seed Germination ofVigna radiata

2021 ◽  
Author(s):  
Bipin Deochand Lade ◽  
Arti Sanjay Shanware ◽  
Ruchika M. Barapatre
Keyword(s):  
Silver Nanoparticles ◽  
Seed Germination ◽  
Detection System ◽  
Average Diameter ◽  
Germination Percentage ◽  
Surface Load ◽  
Microscopy Technique ◽  
Efficient Detection ◽  
The Impact

The main objective of this study was to investigate whether dichlorofluorescein (DCF) is adequate for the formulation of stable dichlorofluorescein-induced silver nanoparticles under the boiling method to analyze their effects on the seed germination of Mung seeds (Vigna radiata). Preliminary dichlorofluoresceine nanoparticles (DCF-SNPs) synthesis evidence by noticing the solution color transformed from a light green color to a dark brown color. The 2.5 ml of dichlorofluoresceine (DCF) solution was found sufficient for the formulation of dichlorofluoresceine induced silver nanoparticles at boiling conditions. Purified dichlorofluoresceine nanoparticles (DCF-SNPs) measure an average diameter of 293 nm where the majority of nanoparticles were around 159 nm in size with the surface load of-9.35 mV zeta potential value. The impact of dichlorofluorescein silver nanoparticles (DCF-SNPs) on the germination percentage of V. radiata has shown that, the 25% concentration of DCF-SNPs is excellent for the growth of Mung seeds (V. radiata). Overall, the dichlorofluorescein silver nanoparticles may be constructive for improving the percentage of seed germination at 25% of its concentration and may also be useful for fluorescent measurement using the confocal microscopy technique. Hence, dichlorofluorescein silver nanoparticles (DCF-SNPs) are proposed as an efficient detection system for nanoparticles in agrochemicals for plants.

Fluorescent nanodiamonds for characterization of nonlinear microscopy systems

2021 ◽  
Author(s):  
Mantas Zurauskas ◽  
Aneesh Alex ◽  
Jaena Park ◽  
STEVE HOOD ◽  
Stephen Boppart
Keyword(s):  
Nonlinear Microscopy ◽  
Fluorescent Nanodiamonds

3D imaging and characterization of microlenses and microlens arrays using nonlinear microscopy

2013 ◽  
Vol 46 (19) ◽  
pp. 195101 ◽  
Author(s):  
Aleksandar J Krmpot ◽  
George J Tserevelakis ◽  
Branka D Murić ◽  
George Filippidis ◽  
Dejan V Pantelić
Keyword(s):  
3D Imaging ◽  
Nonlinear Microscopy ◽  
Microlens Arrays

scholarly journals Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images

2001 ◽  
Vol 699 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Transport Properties ◽  
Quantitative Imaging ◽  
Polycrystalline Materials ◽  
Impedance Spectra ◽  
Inhomogeneous Materials ◽  
Single Interface ◽  
Microscopy Technique ◽  
Voltage Phase ◽  
Scanning Surface Potential Microscopy

Abstract:Impedance spectroscopy has long been recognized as one of the major techniques for the characterization of ac transport in materials. The primary limitation of this technique is the lack of spatial resolution that precludes the equivalent circuit elements from being unambiguously associated with individual microstructural features. Here we present a scanning probe microscopy technique for quantitative imaging of ac and dc transport properties of electrically inhomogeneous materials. This technique, referred to as Scanning Impedance Microscopy (SIM), maps the phase and amplitude of local potential with respect to an electric field applied across the sample. Amplitude and phase behavior of individual defects can be correlated with their transport properties. The frequency dependence of the voltage phase shift across an interface yields capacitance and resistance. SIM of single interfaces is demonstrated on a model metal-semiconductor junction. The local interface capacitance and resistance obtained from SIM measurements agrees quantitatively with macroscopic impedance spectroscopy. Superposition of a dc sample bias during SIM probes the C-V characteristics of the interface. When combined with Scanning Surface Potential Microscopy (SSPM), which can be used to determine interface I-V characteristic, local transport properties are completely determined. SIM and SSPM of polycrystalline materials are demonstrated on BiFeO3 and p-doped silicon. An excellent agreement between the properties of a single interface determined by SIM and traditional impedance spectra is demonstrated. Finally, the applicability of this technique for imaging transport behavior in nanoelectronic devices is illustrated with carbon nanotube circuit.

Imaging of nonlinear microscopy of burned skin treated by ultra-high intensity laser pulses

2014 ◽  
Vol 3 (3) ◽  
pp. 293-300
Author(s):  
Moises Oliveira dos Santos ◽  
Carolina Benetti ◽  
Vitor Bianchin Pelegati ◽  
Carlos Lenz Cesar ◽  
Wagner de Rossi ◽  
...  
Keyword(s):  
High Intensity ◽  
Laser Pulses ◽  
Nonlinear Microscopy ◽  
Burned Skin ◽  
High Intensity Laser ◽  
Intensity Laser

scholarly journals Characterization of Polyurethane Medical Materials Using Electron Microscopy Technique

2003 ◽  
Vol 9 (S02) ◽  
pp. 18-19
Author(s):  
J. E. Taylor ◽  
P. R. Laity ◽  
S. S. Wong ◽  
K. Norris ◽  
P. Khunkamchoo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Microscopy Technique ◽  
Medical Materials
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