MBE growth and characterization of semiconductor laser coolers

2009 ◽  
Author(s):  
Andreas Stintz ◽  
Chia-Yeh Li ◽  
Mansoor Sheik-Bahae ◽  
Kevin J. Malloy
1998 ◽  
Vol 184-185 (1-2) ◽  
pp. 66-69 ◽  
Author(s):  
K Takahashi
Keyword(s):  

1989 ◽  
Vol 95 (1-4) ◽  
pp. 594-598 ◽  
Author(s):  
Owen K. Wu ◽  
Fred A. Shirland ◽  
James P. Baukus ◽  
Joel N. Schulman ◽  
G. Sanjiv Kamath ◽  
...  
Keyword(s):  

2004 ◽  
Vol 269 (1) ◽  
pp. 1-9 ◽  
Author(s):  
S.V Ivanov ◽  
T.V Shubina ◽  
V.N Jmerik ◽  
V.A Vekshin ◽  
P.S Kop’ev ◽  
...  
Keyword(s):  

1997 ◽  
Vol 175-176 ◽  
pp. 983-989 ◽  
Author(s):  
H.M. Menkara ◽  
R.N. Bicknell-Tassius ◽  
R. Benz ◽  
C.J. Summers

2001 ◽  
Vol 693 ◽  
Author(s):  
P. Cristea ◽  
D.G. Ebling ◽  
K.W. Benz

AbstractThe single crystalline growth of the GaNxSb1-x system is difficult due to the miscibility gap expected for nearly the whole composition range under thermodynamic equilibrium conditions. The gap is determined by the differences of the atomic radii and of the electro negativities for N and Sb. To overcome this problem crystal growth has to be performed under non-equilibrium conditions with kinetically controlled growth, as it is observed for molecular beam epitaxy (MBE) growth. A single crystalline MBE-growth within the miscibility gap has been demonstrated already in the GaAsxN1-x system exhibiting a similar large miscibility gap. GaN:Sb-layers were grown on Si(111)-substrates by MBE using NH3 as a N-source and solid element sources for Ga and Sb. The parameter window for growth was limited due to side reactions like the decomposition of NH3, the desorption of (at high temperature volatile) compounds like Sb and GaSb or the reaction of Sb with NH3. The composition of the layers was analyzed by XRD and RBS. Antimony bulk concentrations of up to 1.6 % could be obtained in GaN. Optical characterization of the samples was performed by CL-measurements and indicate Sb-induced transitions in the 2.2 eV and 1.42 eV range.


1991 ◽  
Vol 220 ◽  
Author(s):  
J. B. Posthill ◽  
D. P. Malta ◽  
R. Venkatasubramanian ◽  
P. R. Sharps ◽  
M. L. Timmons ◽  
...  

ABSTRACTInvestigation has continued into the use of SixGe1−x multilayer structures (MLS) as a buffer layer between a Si substrate and a GaAs epitaxial layer in order to accommodate the 4.1% lattice mismatch. SixGe1−x 4-layer and 5-layer structures terminating in pure Ge have been grown using molecular beam epitaxy. Subsequent GaAs heteroepitaxy has allowed evaluation of these various GaAs/SixGe1−xMLS/Si (100) structures. Antiphase domain boundaries have been eliminated using vicinal Si (100) substrates tilted 6° off-axis toward [011], and the etch pit density in GaAs grown on a 5-layer SixGe1−x MLS on vicinal Si (lOO) was measured to be 106 cm−2.


2002 ◽  
Vol 192 (1) ◽  
pp. 195-200 ◽  
Author(s):  
S. Suzuki ◽  
T. Nemoto ◽  
Y. Kaifuchi ◽  
Y. Ishitani ◽  
A. Yoshikawa
Keyword(s):  

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