scholarly journals Charge-Coupled-Device and Charge-Injection-Device Theory and Application

1987 ◽  
Vol 26 (10) ◽  
Author(s):  
James R. Janesick
Keyword(s):  
Charge Injection ◽  
Injection Device ◽  
Charge Coupled Device

scholarly journals Two-Dimensional Infrared Detector Arrays

1984 ◽  
Vol 79 ◽  
pp. 585-602 ◽  
Author(s):  
C.R. McCreight
Keyword(s):  
Infrared Detector ◽  
Laboratory Data ◽  
Charge Injection ◽  
Two Dimensional ◽  
Injection Device ◽  
Charge Coupled Device ◽  
Detector Arrays ◽  
Infrared Array

AbstractThe technology and terminology of integrated infrared detector arrays are discussed. Specific infrared array multiplexer designs include the charge-coupled device (CCD) and charge-injection device (CID). Laboratory data and telescope imagery obtained with three arrays (inSb CCD, Si:In CCD, and Si:Bi CID) are used to illustrate the performance and promise of integrated arrays in astronomical applications.

Gamma induced dose fluctuations in a charge injection device

1988 ◽  
Vol 35 (6) ◽  
pp. 1302-1306 ◽  
Author(s):  
E.A. Burke ◽  
G.E. Bender ◽  
J.K. Pimbley ◽  
G.P. Summers ◽  
C.J. Dale ◽  
...  
Keyword(s):  
Charge Injection ◽  
Injection Device ◽  
A Charge

scholarly journals Extreme Contrast Ratio Imaging of Sirius with a Charge Injection Device

2016 ◽  
Vol 128 (960) ◽  
pp. 025001 ◽  
Author(s):  
D. Batcheldor ◽  
R. Foadi ◽  
C. Bahr ◽  
J. Jenne ◽  
Z. Ninkov ◽  
...  
Keyword(s):  
Contrast Ratio ◽  
Charge Injection ◽  
Injection Device ◽  
Ratio Imaging ◽  
A Charge

Characterization of a CID-38 charge injection device

1996 ◽  
Author(s):  
Brian S. Backer ◽  
Zoran Ninkov ◽  
Massimiliano Corba
Keyword(s):  
Charge Injection ◽  
Injection Device

Advances in the Application of Array Detectors for Improved Chemical Analysis, Part II. Rapid Trace Metal Analysis of High Solids Wastewater and Sludge Using a Direct Current Plasma Source Equipped with an Echelle Spectrometer and a Charge-Injection Device Detector

2003 ◽  
Vol 56 (3) ◽  
pp. 133 ◽  
Author(s):  
Jeff Prevatt ◽  
M. Bonner Denton
Keyword(s):  
Trace Metals ◽  
Direct Current ◽  
Charge Injection ◽  
Plasma Source ◽  
High Solids ◽  
Injection Device ◽  
Analytical Technique ◽  
Array Detectors ◽  
Direct Current Plasma ◽  
Echelle Spectrometer

A direct current plasma (DCP) source, equipped with an echelle spectrometer and charge-injection device (CID) detector, was employed for the analysis of trace metals in municipal sludge and wastewater containing high solids. The use of DCP as a plasma source has largely vanished in the past decade due to the popularity of inductively coupled plasma. Resurrecting this robust plasma source and coupling it to a state-of-the-art echelle spectrometer provides for an extremely forgiving analytical technique capable of analysing trace metals rapidly, even in complex high-solid matrices. Instrument performance is further enhanced as the echelle/CID spectrometer provides a simultaneous multi-element fingerprint of contaminants in the waste. The improved design offers increased sensitivity in the far ultraviolet, with overall wavelength coverage from 175 to 800 nm. Furthermore, multi-element analysis is obtained quickly with minimal or no sample preparation, making this the fastest screening technique available.

Selectable one-to-four-port, very high speed 512 x 512 charge-injection device

1991 ◽  
Author(s):  
Jeffrey J. Zarnowski ◽  
Bryn Williams ◽  
Matthew A. Pace ◽  
Michael Joyner ◽  
Joseph Carbone ◽  
...  
Keyword(s):  
High Speed ◽  
Charge Injection ◽  
Injection Device ◽  
Very High
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