Advances in the Application of Array Detectors for Improved Chemical Analysis, Part II. Rapid Trace Metal Analysis of High Solids Wastewater and Sludge Using a Direct Current Plasma Source Equipped with an Echelle Spectrometer and a Charge-Injection Device Detector

2003 ◽  
Vol 56 (3) ◽  
pp. 133 ◽  
Author(s):  
Jeff Prevatt ◽  
M. Bonner Denton

A direct current plasma (DCP) source, equipped with an echelle spectrometer and charge-injection device (CID) detector, was employed for the analysis of trace metals in municipal sludge and wastewater containing high solids. The use of DCP as a plasma source has largely vanished in the past decade due to the popularity of inductively coupled plasma. Resurrecting this robust plasma source and coupling it to a state-of-the-art echelle spectrometer provides for an extremely forgiving analytical technique capable of analysing trace metals rapidly, even in complex high-solid matrices. Instrument performance is further enhanced as the echelle/CID spectrometer provides a simultaneous multi-element fingerprint of contaminants in the waste. The improved design offers increased sensitivity in the far ultraviolet, with overall wavelength coverage from 175 to 800 nm. Furthermore, multi-element analysis is obtained quickly with minimal or no sample preparation, making this the fastest screening technique available.

1995 ◽  
Vol 49 (6) ◽  
pp. 825-833 ◽  
Author(s):  
Qingbo Li ◽  
Edward S. Yeung

Despite the rapid growth in the use of imaging detectors in spectroscopy, the charge-injection device (CID) has unique features that have not been fully exploited. The advantages of the CID as a two-dimensional array detector for laser-induced fluorescence detection in highly multiplexed capillary electrophoresis are evaluated. In such a system, the CID maintains both high sensitivity and high sampling rate, which are usually difficult to achieve simultaneously with other array detectors. Applying the electronic windowing function significantly improves the scan rate and greatly reduces the volume of data generated. With 1-s exposure time and 488-nm excitation, the detection limit of the system is 10−12 M fluorescein with the device cryogenically cooled and 10−11 M fluorescein at ambient temperature. The low dark current of the CID imager allows operation at room temperature without significantly affecting sensitivity when combined with moderate laser powers. We demonstrate that the CID is well suited for high-speed, high-throughput DNA sequencing based on multiplexed capillary electrophoresis with on-column laser-induced fluorescence detection.


1989 ◽  
Vol 43 (1) ◽  
pp. 1-11 ◽  
Author(s):  
R. B. Bilhorn ◽  
M. B. Denton

An atomic emission spectrometer which allows simultaneous high-precision digital recording of the ultraviolet spectrum has been developed. The instrument employs both a custom-built echelle spectrometer and a custom-built slow-scan charge injection device (CID) based detector system. The system is capable of measuring the wide dynamic range of signal intensities associated with plasma emission sources, and sensitivity is comparable to that of photomultiplier-tube-equipped instruments. Unprecedented speed and flexibility for elemental analysis are provided by the ability to display background-subtracted emission spectra and to have the computer assist in spectral line identification. The design and performance of the optical system, methodologies for CID detector utilization in analytical spectroscopy, and techniques for wavelength calibration are presented. Examples for qualitative analysis and for the qualitative comparison of similar samples demonstrate the sensitivity, flexibility, and speed of the system.


Sign in / Sign up

Export Citation Format

Share Document