Fabrication of wall array by electrochemical etching of n-type silicon

2007 ◽  
Author(s):  
Zhigang Zhao ◽  
Caili Bai ◽  
Jinchuan Guo ◽  
Hanben Niu
2021 ◽  
Vol 10 (1) ◽  
pp. 016003
Author(s):  
Philip Nathaniel Immanuel ◽  
Chao-Ching Chiang ◽  
Tien-Hsi Lee ◽  
Sikkanthar Diwan Midyeen ◽  
Song-Jeng Huang

2001 ◽  
pp. 632-635 ◽  
Author(s):  
Shinichi Izuo ◽  
Hiroshi Ohji ◽  
Patrick. J. French ◽  
Kazuhiko Tsutsumi

2018 ◽  
Vol 7 (8) ◽  
pp. N110-N113 ◽  
Author(s):  
H. D. Liang ◽  
M. B. H. Breese ◽  
S. Duttagupta ◽  
A. G. Aberle ◽  
A. A. Bettiol ◽  
...  

1994 ◽  
Vol 358 ◽  
Author(s):  
S. Lazarouk ◽  
V. Bondarenko ◽  
P. Pershukevich ◽  
S. La Monica ◽  
G. Maiello ◽  
...  

ABSTRACTWe demonstrate current induced visible light emission from Schottky junctions between aluminium electrodes and porous silicon formed by electrochemical etching of degenerate n+ -type silicon. HF concentration and anodizing current were chosen to yield preparation conditions in the transition region between electropolishing and porous silicon formation regimes. The light emitting diodes were formed by magnetron sputtering of aluminum on the porous silicon surface. Visible electroluminescence (EL) was recorded when dc or ac voltages larger than 4 V were applied between the aluminium electrodes. The visible EL appears in the dark, at the edge of the electrodes at a reverse bias of 5-6 V. The intensity of emitted light increases with applied voltage; at applied bias higher than 7 V the light emitted was observable by the naked eye at normal daylight. Compared to forward bias solid state contact porous silicon devices, the structure has an increased stability (after 100 hours of continuous operation under a 7 V reverse bias, no appreciable modification was observed in emission intensity). The main features of this electroluminescence are very similar to the ones observed under avalanche breakdown of silicon p-n junctions.


2010 ◽  
Vol 8 (6) ◽  
pp. 1787-1791 ◽  
Author(s):  
Sebastien Kouassi ◽  
Gael Gautier ◽  
Sebastien Desplobain ◽  
Laurent Ventura

2016 ◽  
Vol 37 (10) ◽  
pp. 106001 ◽  
Author(s):  
Yaohu Lei ◽  
Zhigang Zhao ◽  
Jinchuan Guo ◽  
Ji Li ◽  
Hanben Niu

2000 ◽  
Vol 147 (8) ◽  
pp. 2999 ◽  
Author(s):  
Peter M. Hoffmann ◽  
Inge E. Vermeir ◽  
Peter C. Searson

2002 ◽  
Vol 97-98 ◽  
pp. 720-724 ◽  
Author(s):  
Shinichi Izuo ◽  
Hiroshi Ohji ◽  
Patrick J. French ◽  
Kazuhiko Tsutsumi

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