Thin plastic foil X-ray optics with spiral geometry

2007 ◽  
Author(s):  
Marco Barbera ◽  
Teresa Mineo ◽  
Emanuele Perinati ◽  
Herbert W. Schnopper ◽  
Angelo Taibi
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
Plastic Foil ◽  
Spiral Geometry ◽  
Thin Plastic

Lightweight thin plastic foil x-ray telescopes

2002 ◽  
Author(s):  
Herbert W. Schnopper ◽  
Marco Barbera ◽  
Eric H. Silver ◽  
Russell H. Ingram ◽  
Finn E. Christensen ◽  
...  
Keyword(s):  
X Ray ◽  
Plastic Foil ◽  
Thin Plastic

X-ray optics made from thin plastic foils

1999 ◽  
Author(s):  
Herbert W. Schnopper ◽  
Eric H. Silver ◽  
Russell H. Ingram ◽  
Finn E. Christensen ◽  
Ahsen M. Hussain ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
Title X ◽  
Thin Plastic

Thin plastic shell x-ray optics: an update

2003 ◽  
Author(s):  
Herbert W. Schnopper ◽  
Marco Barbera ◽  
Eric H. Silver ◽  
Russell H. Ingram ◽  
Finn E. Christensen ◽  
...  
Keyword(s):  
Plastic Shell ◽  
Ray Optics ◽  
X Ray ◽  
Thin Plastic

Characterization of thin plastic foils for applications in x-ray optics technology

2007 ◽  
Author(s):  
Angelo Taibi ◽  
Marco Barbera ◽  
Giovanni Pareschi ◽  
Herbert W. Schnopper ◽  
Giorgia Sironi ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
Thin Plastic

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Aperiodic multilayer structures in soft X-ray optics

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin
Keyword(s):  
Multilayer Structures ◽  
Ray Optics ◽  
X Ray

Diffraction limited X-ray optics: technology, metrology, applications

2019 ◽  
Vol 190 (01) ◽  
pp. 74-91
Author(s):  
Nikolai I. Chkhalo ◽  
Ilya V. Malyshev ◽  
Alexey E. Pestov ◽  
Vladimir N. Polkovnikov ◽  
Nikolai N. Salashchenko ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray
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