White-light spectral interferometric technique used to measure thickness of thin films

2007 ◽  
Author(s):  
P. Hlubina ◽  
D. Ciprian ◽  
R. Clebus ◽  
J. Luňáček ◽  
M. Lesňák
Keyword(s):  
Thin Films ◽  
White Light ◽  
Interferometric Technique

Polarization-Controlled Two-Dimensional White-Light Spectroscopy of Semiconducting Carbon Nanotube Thin Films

2016 ◽  
Vol 120 (30) ◽  
pp. 17069-17080 ◽  
Author(s):  
Randy D. Mehlenbacher ◽  
Thomas J. McDonough ◽  
Nicholas M. Kearns ◽  
Matthew J. Shea ◽  
Yongho Joo ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
White Light ◽  
Two Dimensional

Color tuning of white light emission from thin films of ZnSe

2007 ◽  
Vol 125 (1-2) ◽  
pp. 85-91 ◽  
Author(s):  
M. Godlewski ◽  
M. Skrobot ◽  
E. Guziewicz ◽  
M.R. Phillips
Keyword(s):  
Thin Films ◽  
White Light ◽  
Light Emission ◽  
White Light Emission ◽  
Color Tuning

Absolute Measurement of Aspheric Surfaces Using White-Light Interferometry

2007 ◽  
Vol 364-366 ◽  
pp. 80-85
Author(s):  
Su Ping Chang ◽  
Tie Bang Xie ◽  
Xuang Ze Wang ◽  
Jun Guo
Keyword(s):  
High Precision ◽  
White Light ◽  
Spherical Surface ◽  
Three Dimensional ◽  
Influence Factors ◽  
Horizontal Displacement ◽  
Absolute Measurement ◽  
Aspheric Surfaces ◽  
Interferometric Technique ◽  
Main Influence

White-light interferometric technique has been widely applied in the measurement of three-dimensional profiles and roughness with high-precision. Based on the characteristic of interferometric technique, a new method combined with image location and a three-dimensional stage is proposed to achieve the non-contact absolute shape measurement for aspheric and spherical surface in a slarge range. The interference fringes vary with the horizontal displacement of the measured surface, the surface information was obtained by locating the transformation of the maximal intensity in the interferograms. Two main influence factors are discussed; they are performance of the inerferimetric microscope and the stage. Since the performance of the stage directly determines the measurement precision, a three-dimensional displacement stage with a large range and a high precision was developed. Some experiments were carried out to verify the performance of the three-dimensional displacement stage and the validity of the new measurement method with satisfactory results.

A white-light profiling algorithm adopting the multiwavelength interferometric technique

2004 ◽  
Author(s):  
Hua-Chen Hsu ◽  
Chi-Hong Tung ◽  
Ching-Fen Kao ◽  
Calvin C. Chang
Keyword(s):  
White Light ◽  
Interferometric Technique

On the origin of white light emission from nanostructured silicon carbonitride thin films

2018 ◽  
Vol 196 ◽  
pp. 504-510 ◽  
Author(s):  
Zahra Khatami ◽  
Patrick R.J. Wilson ◽  
Jacek Wojcik ◽  
Peter Mascher
Keyword(s):  
Thin Films ◽  
White Light ◽  
Light Emission ◽  
White Light Emission ◽  
Silicon Carbonitride ◽  
Nanostructured Silicon

Ultrafast Exciton Hopping Observed in Bare Semiconducting Carbon Nanotube Thin Films with Two-Dimensional White-Light Spectroscopy

2016 ◽  
Vol 7 (11) ◽  
pp. 2024-2031 ◽  
Author(s):  
Randy D. Mehlenbacher ◽  
Jialiang Wang ◽  
Nicholas M. Kearns ◽  
Matthew J. Shea ◽  
Jessica T. Flach ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
White Light ◽  
Two Dimensional

Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry

2009 ◽  
Vol 7 (5) ◽  
pp. 446-448 ◽  
Author(s):  
薛晖 Hui Xue ◽  
沈伟东 Weidong Shen ◽  
顾培夫 Peifu Gu ◽  
罗震岳 Zhenyue Luo ◽  
章岳光 Yueguang Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Shift ◽  
White Light ◽  
Spectral Interferometry ◽  
Absolute Phase

Probing carrier dynamics in implanted and annealed polycrystalline silicon thin films using white light

2006 ◽  
Vol 88 (18) ◽  
pp. 181107 ◽  
Author(s):  
Emmanouil Lioudakis ◽  
Andreas Othonos ◽  
A. G. Nassiopoulou
Keyword(s):  
Thin Films ◽  
White Light ◽  
Polycrystalline Silicon ◽  
Carrier Dynamics ◽  
Silicon Thin Films

scholarly journals White-light vs. short-wavelength ultraviolet illumination of fingerprints developed with columnar thin films of Alq3

2015 ◽  
Vol 48 (4) ◽  
pp. 190-199 ◽  
Author(s):  
Stephanie L. Plazibat ◽  
Stephen E. Swiontek ◽  
Akhlesh Lakhtakia ◽  
Reena Roy
Keyword(s):  
Thin Films ◽  
White Light ◽  
Short Wavelength ◽  
Ultraviolet Illumination
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