Measurement of the phase spectra of transparent thin films using white-light interferometry

2004 ◽  
Author(s):  
Petr Hlubina
Keyword(s):  
Thin Films ◽  
White Light ◽  
White Light Interferometry ◽  
Phase Spectra

Fringe order identification in optical fibre white-light interferometry using centroid algorithm method

1992 ◽  
Vol 28 (6) ◽  
pp. 553 ◽  
Author(s):  
S. Chen ◽  
A.W. Palmer ◽  
K.T.V. Grattan ◽  
B.T. Meggitt
Keyword(s):  
Optical Fibre ◽  
White Light ◽  
White Light Interferometry ◽  
Fringe Order ◽  
Centroid Algorithm

scholarly journals Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2486
Author(s):  
Gert Behrends ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
White Light ◽  
Lateral Displacement ◽  
Displacement Measurement ◽  
Accurate Information ◽  
White Light Interferometry ◽  
Fully Integrated ◽  
Speckle Correlation ◽  
Dsc Measurements ◽  
Scanning White Light Interferometry ◽  
The Impact

Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.

Polarization insensitive fibre-optic white-light interferometry

1995 ◽  
Vol 114 (5-6) ◽  
pp. 386-392 ◽  
Author(s):  
L.A Ferreira ◽  
J.L Santos ◽  
F Farahi
Keyword(s):  
White Light ◽  
Fibre Optic ◽  
White Light Interferometry ◽  
Polarization Insensitive

Polarization-Controlled Two-Dimensional White-Light Spectroscopy of Semiconducting Carbon Nanotube Thin Films

2016 ◽  
Vol 120 (30) ◽  
pp. 17069-17080 ◽  
Author(s):  
Randy D. Mehlenbacher ◽  
Thomas J. McDonough ◽  
Nicholas M. Kearns ◽  
Matthew J. Shea ◽  
Yongho Joo ◽  
...  
Keyword(s):  
Thin Films ◽  
Carbon Nanotube ◽  
White Light ◽  
Two Dimensional

Fiber-optic white-light interferometry: lead sensitivity considerations

1994 ◽  
Vol 19 (2) ◽  
pp. 138 ◽  
Author(s):  
R. R. Gauthier ◽  
N. Dahi ◽  
F. Farahi
Keyword(s):  
White Light ◽  
Fiber Optic ◽  
White Light Interferometry

A White-Light Interferometry for the Measurement of High-Finesse Fiber Optic EFPI Sensors

2014 ◽  
Vol 26 (21) ◽  
pp. 2138-2141 ◽  
Author(s):  
Zhen Wang ◽  
Yi Jiang ◽  
Wenhui Ding ◽  
Ran Gao
Keyword(s):  
White Light ◽  
Fiber Optic ◽  
White Light Interferometry ◽  
High Finesse

Color tuning of white light emission from thin films of ZnSe

2007 ◽  
Vol 125 (1-2) ◽  
pp. 85-91 ◽  
Author(s):  
M. Godlewski ◽  
M. Skrobot ◽  
E. Guziewicz ◽  
M.R. Phillips
Keyword(s):  
Thin Films ◽  
White Light ◽  
Light Emission ◽  
White Light Emission ◽  
Color Tuning

Improved synthesised source for white light interferometry

1994 ◽  
Vol 30 (17) ◽  
pp. 1440-1441 ◽  
Author(s):  
Y.J. Rao ◽  
D.A. Jackson
Keyword(s):  
White Light ◽  
White Light Interferometry

Fiber optic white-light interferometry for self-calibrated absolute-strain measurements

1996 ◽  
Author(s):  
Vikram Bhatia ◽  
Kent A. Murphy ◽  
Richard O. Claus ◽  
Tuan A. Tran ◽  
Jonathan A. Greene
Keyword(s):  
White Light ◽  
Fiber Optic ◽  
White Light Interferometry ◽  
Strain Measurements
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