Simultaneous measurement of film surface topography and thickness variation using white-light interferometry

2006 ◽  
Author(s):  
Katsuichi Kitagawa
Keyword(s):  
Surface Topography ◽  
White Light ◽  
Simultaneous Measurement ◽  
Film Surface ◽  
Thickness Variation ◽  
White Light Interferometry

High-Resolution Surface Topography Measurement Based on Frequency-Domain Analysis in White Light Interferometry

2018 ◽  
Vol 45 (6) ◽  
pp. 0604001
Author(s):  
邓钦元 Deng Qinyuan ◽  
唐燕 Tang Yan ◽  
周毅 Zhou Yi ◽  
杨勇 Yang Yong ◽  
胡松 Hu Song
Keyword(s):  
High Resolution ◽  
Frequency Domain ◽  
Surface Topography ◽  
White Light ◽  
Domain Analysis ◽  
Frequency Domain Analysis ◽  
White Light Interferometry

Microstructure Surface Topography Measurement Based on Color Images of White Light Interferometry

2014 ◽  
Vol 34 (2) ◽  
pp. 0212003
Author(s):  
郭彤 Guo Tong ◽  
李峰 Li Feng ◽  
倪连峰 Ni Lianfeng ◽  
陈津平 Chen Jinping ◽  
傅星 Fu Xing ◽  
...  
Keyword(s):  
Surface Topography ◽  
White Light ◽  
Color Images ◽  
White Light Interferometry

Measurement of microscopic surface topography of alloy dimple fracture by scanning white-light interferometry

2011 ◽  
Vol 19 (7) ◽  
pp. 1612-1619
Author(s):  
邹文栋 ZOU Wen-dong ◽  
黄长辉 HUANG Chang-hui ◽  
郑玱 ZHENG Qiang ◽  
徐周珏 XU Zhou-jue ◽  
董娜 DONG Na
Keyword(s):  
Surface Topography ◽  
White Light ◽  
White Light Interferometry ◽  
Dimple Fracture ◽  
Scanning White Light Interferometry ◽  
Microscopic Surface

Fringe order identification in optical fibre white-light interferometry using centroid algorithm method

1992 ◽  
Vol 28 (6) ◽  
pp. 553 ◽  
Author(s):  
S. Chen ◽  
A.W. Palmer ◽  
K.T.V. Grattan ◽  
B.T. Meggitt
Keyword(s):  
Optical Fibre ◽  
White Light ◽  
White Light Interferometry ◽  
Fringe Order ◽  
Centroid Algorithm
Sign in / Sign up

Export Citation Format

Share Document